Microstructural Observation of Dairy Products Using High-pressure Freezing in Combination with Cryo-scanning Electron Microscopy

2020 ◽  
Vol 26 (6) ◽  
pp. 743-747
Author(s):  
Takamichi Kamigaki
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Pressure ◽  
Dairy Products ◽  
High Pressure Freezing ◽  
Microstructural Observation ◽  
Cryo Scanning Electron Microscopy ◽  
Scanning Electron

Morphology of the lateral fields of the infective juvenile of the entomopathogenic family Steinernematidae (Nematoda) using high pressure freezing (HPF)

Nematology ◽  
2019 ◽  
Vol 22 (1) ◽  
pp. 69-74
Author(s):  
Zdeněk Mráček ◽  
Jiří Nermut’ ◽  
Martina Tesařová ◽  
Vladimír Půža
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Pressure ◽  
Infective Juvenile ◽  
Field Pattern ◽  
Taxonomic Character ◽  
High Pressure Freezing ◽  
Lateral Field ◽  
Transmission Electron ◽  
Scanning Electron

Summary The lateral field pattern of infective juveniles of the nematode family Steinernematidae is an important taxonomic character. Scanning electron microscopy (SEM) shows the number of ridges and lines or incisures clearly, but does not provide other details. In the present study, ten species from six clades of Steinernematidae have been studied for their lateral field morphology using SEM and high pressure freezing (HPF) with transmission electron microscopy (TEM). Both methods indicated the same number of ridges and lines, although HPF/TEM resulted in a more detailed morphology with differences between the species. The tips of the ridges are either finely rounded or pointed and the lines are V-shaped or have a broadened bottom. These characters represent an additional pattern that may be characteristic for some species within the phylogenetic clades. Further studies of the lateral field morphology of other species is needed to ascertain whether each pattern is clade specific and phylogenetically valuable.

Scattering of Electrons at High - Pressure and Restoration of Image Contrast in High Pressure Scanning Electron Microscopy

1990 ◽  
Vol 48 (1) ◽  
pp. 384-385
Author(s):  
J. S. Shah ◽  
R. Durkin ◽  
A. N. Farley
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Pressure ◽  
Cross Sections ◽  
Single Scattering ◽  
Image Contrast ◽  
Experimental Scheme ◽  
Medium Resolution ◽  
Scattering Approximation ◽  
Scanning Electron

It is now possible to perform High Pressure Scanning Electron Microscopy (HPSEM) in the range 10 to 2000 Pa. Here the effect of scattering on resolution has been evaluated by calculating the profile of the beam in high pressure and assessing its effect on the image contrast . An experimental scheme is presented to show that the effect of the primary beam ionization is to reduce image contrast but this effect can be eliminated by a novel use of specimen current detection in the presence of an electric field. The mechanism of image enhancement is discussed in terms of collection of additional carriers generated by the emissive components.High Pressure SEM (HPSEM) instrumentation is establishing itself as commercially viable. There are now a number of manufacturers, such as JEOL, ABT, ESCAN, DEBEN RESEARCH, selling microscopes and accessories for HPSEM. This is because high pressure techniques have begun to yield high quality micrographs at medium resolution.To study the effect of scattering on the incident electron beam, its profile - in a high pressure environment - was evaluated by calculating the elastic and inelastic scattering cross sections for nitrogen in the energy range 5-25 keV. To assess the effect of the scattered beam on the image contrast, the modification of a sharp step contrast function due to scattering was calculated by single scattering approximation and experimentally confirmed for a 20kV accelerated beam.

Surfactant-Induced Phytotoxicity

1994 ◽  
Vol 8 (3) ◽  
pp. 519-525 ◽  
Author(s):  
Richard H. Falk ◽  
Richard Guggenheim ◽  
Gerhard Schulke
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Tissue Damage ◽  
Epicuticular Wax ◽  
Morphological Alteration ◽  
Epicuticular Waxes ◽  
Common Purslane ◽  
Morphology Changes ◽  
Cryo Scanning Electron Microscopy ◽  
Scanning Electron

The leaves of tall morningglory, giant duckweed, and common purslane were treated with nine surfactants at a concentration of 0.1% and examined after 24 hr using cryo-scanning electron microscopy for phytotoxicity as evidenced by tissue damage and epicuticular wax morphology changes. In some instances, tissue damage could be discerned; however, the effects of a particular surfactant were not uniform across the three species. Morphological alteration of epicuticular waxes was not observed. Gas chromatographic analyses of the epicuticular waxes of the species used in the study reveal component differences and may, in part, explain the lack of uniform response across species for a particular surfactant.

Cryo-Scanning Electron Microscopy: A New Tool for Interpretation of Fracture Studies in Bitumen/Polymer Blends

2002 ◽  
Vol 16 (1) ◽  
pp. 143-147 ◽  
Author(s):  
L. Champion-Lapalu ◽  
A. Wilson ◽  
G. Fuchs ◽  
D. Martin ◽  
J.-P. Planche
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Polymer Blends ◽  
Cryo Scanning Electron Microscopy ◽  
Scanning Electron

XRPD and Scanning Electron Microscopy of Alloys of the CuAlS2 – CuFeS2 System Prepared by Thermobaric Treatment

MRS Advances ◽  
2018 ◽  
Vol 3 (56) ◽  
pp. 3323-3328
Author(s):  
Barys Korzun ◽  
Anatoly Pushkarev
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Pressure ◽  
Unit Cell Volume ◽  
Unit Cell ◽  
Unit Cell Parameters ◽  
X Ray ◽  
Cell Parameters ◽  
Lattice Constants ◽  
Scanning Electron

ABSTRACTAlloys of the CuAlS2 – CuFeS2 system were prepared by thermobaric treatment at high pressure of 5.5 GPa and temperatures ranging from 573 to 1573 K and phase formation in the system was investigated using X-ray powder diffraction, optical microscopy and scanning electron microscopy equipped with energy dispersive spectroscopy. The unit-cell parameters (the lattice constants and the unit-cell volume) were computed as a function of the composition. Absence of complete solubility in the (CuAlS2)1-x-(CuFeS2)x system was established. Formation of solid solutions with the tetragonal structure of chalcopyrite was detected for compositions with the molar part of CuFeS2 x not exceeding 0.10.

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