scholarly journals Merging of analog and digital data in the Northern California Seismic Network, and characteristics of the principal seismic systems it employs

1995 ◽  
Author(s):  
Jerry P. Eaton
1992 ◽  
Author(s):  
D.H. Oppenheimer ◽  
Fred W. Klein ◽  
Jerry P. Eaton

1992 ◽  
Vol 82 (2) ◽  
pp. 533-579 ◽  
Author(s):  
Jerry P. Eaton

Abstract Equations for determining amplitude magnitude (MX) and duration magnitude (MF) that employ all calibrated instruments in the USGS short-period telemetered seismic network in northern California (NCSN) were developed and tested against a set of 1276 earthquakes from 1986 to 1990 that were analyzed on the Caltech-USGS processing system (CUSP). The expressions for decay of amplitude and record duration in these equations are functions of distance alone. Sensitivity corrections for both MX and MF are simply the logarithms of the ratios of the magnification of the reference instrument to that of the instrument actually used. Component corrections were chosen so as to minimize the dependence of instrument site residuals on instrument component. MF site residuals were found to be closely linked to MX site residuals in a manner that suggests both depend primarily on site amplification. Both MX and MF site residuals vary systematically with bedrock lithology: older well-consolidated rocks produce negative residuals (smaller amplitudes and shorter durations) and younger unconsolidated rocks produce positive residuals (larger amplitudes and longer durations). Average station magnitude residuals are virtually independent of distance from the epicenter to at least 800 km; and MX-MF, averaged over 0.5 unit magnitude intervals, is less than 0.05 from M0.5 to M5.5. Comparison of MX and MBK (ML, UC Berkeley) for 293 events in both the CUSP data set and the Berkeley catalog shows that calculated MX s are marginally larger than the corresponding MBK s. MX-MBK averages about + 0.04. The characteristics of the standard Wood-Anderson seismograph employed to calculate MX are: free period 0.8 sec, damping constant 0.8, and static magnification 2080.


1993 ◽  
Author(s):  
D.H. Oppenheimer ◽  
F.W. Klein ◽  
J.P. Eaton ◽  
F.W. Lester

Author(s):  
D. R. Denley

Scanning tunneling microscopy (STM) has recently been introduced as a promising tool for analyzing surface atomic structure. We have used STM for its extremely high resolution (especially the direction normal to surfaces) and its ability for imaging in ambient atmosphere. We have examined surfaces of metals, semiconductors, and molecules deposited on these materials to achieve atomic resolution in favorable cases.When the high resolution capability is coupled with digital data acquisition, it is simple to get quantitative information on surface texture. This is illustrated for the measurement of surface roughness of evaporated gold films as a function of deposition temperature and annealing time in Figure 1. These results show a clear trend for which the roughness, as well as the experimental deviance of the roughness is found to be minimal for evaporation at 300°C. It is also possible to contrast different measures of roughness.


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