scholarly journals The Dependence on Substrate Temperature related to Metal Composition of Deposited YBCO Thin Films by Oxygen Ion Irradiation.

Shinku ◽  
1993 ◽  
Vol 36 (3) ◽  
pp. 285-288
Author(s):  
Masami NAKASONE ◽  
Masao NOMA ◽  
Soucihi OGAWA ◽  
Tsutom Yotsuya ◽  
Yoshihiko SUZUKI
Shinku ◽  
1992 ◽  
Vol 35 (3) ◽  
pp. 207-210 ◽  
Author(s):  
Masao NOMA ◽  
Masami NAKASONE ◽  
Souichi OGAWA ◽  
Tsutomu YOTSUYA ◽  
Yoshihiko SUZUKI

2002 ◽  
Vol 372-376 ◽  
pp. 55-58
Author(s):  
Nianhua Peng ◽  
Chris Jeynes ◽  
Roger Webb ◽  
Ivan Chakarov ◽  
Mark Blamire

Shinku ◽  
1993 ◽  
Vol 36 (3) ◽  
pp. 226-229
Author(s):  
Masao NOMA ◽  
Masami NAKASONE ◽  
Souichi OGAWA ◽  
Tsutom Yotsuya ◽  
Yoshihiko SUZUKI

1992 ◽  
Vol 275 ◽  
Author(s):  
J. G. Hu ◽  
D. J. Miller ◽  
D. B. Buchholz ◽  
S. J. Duray ◽  
D. Schulz ◽  
...  

ABSTRACTThe microstructure of Y1Ba2Cu3Oy films and Y1Ba2Cu3Oy / Pr1Ba2Cu3Oy multilayers prepared by a pulsed organometallic beam epitaxy (POMBE) technique have been characterized by transmission electron microscopy (TEM). The microstructure of the films is observed to vary as a function of substrate temperature. At low temperatures, films are polycrystalline and exhibit some impurity phases. At higher substrate temperatures, films grow epitaxially with smooth surfaces and few impurities. Controlled growth at sufficiently high substrate temperatures allows uniform growth of alternating Y1Ba2Cu3Oy and Pr1Ba2Cu3Oy layers.


1997 ◽  
Vol 7 (2) ◽  
pp. 3674-3677 ◽  
Author(s):  
J. Hollkott ◽  
S. Hu ◽  
C. Becker ◽  
J. Auge ◽  
B. Spangenberg ◽  
...  

2013 ◽  
Vol 28 (5) ◽  
pp. 491-496
Author(s):  
Ya-Xin XU ◽  
Jie XIONG ◽  
Yu-Dong XIA ◽  
Fei ZHANG ◽  
Yan XUE ◽  
...  

2014 ◽  
Vol 27 (11) ◽  
pp. 2639-2643 ◽  
Author(s):  
J. Janaki ◽  
T. Geetha Kumary ◽  
Awadhesh Mani ◽  
E. P. Amaladass ◽  
N. Radhikesh Raveendran ◽  
...  

2020 ◽  
Vol 27 (12) ◽  
pp. 2050019 ◽  
Author(s):  
A. ABDEL-GALIL ◽  
A. ATTA ◽  
M. R. BALBOUL

In this paper, we report the influence of low-energy oxygen ion irradiation with fluence ranging from [Formula: see text][Formula: see text][Formula: see text] to [Formula: see text][Formula: see text][Formula: see text] on the structural, optical, and electrical properties of fresh and annealed (400∘C, 3[Formula: see text]h) zinc oxide (ZnO) thin films. These films were grown on soda-lime glass (SLG) substrates using the spin-coating method as a low-cost depositing technique. X-ray diffraction (XRD) study showed the formation of the hexagonal phase of ZnO thin films with preferred orientation along the (002) plane. The crystallite size for fresh and annealed ZnO thin films was in nanoscale and it increased with the annealing temperature. Also, the crystallite size increased with the ion beam irradiation fluence in the case of annealed ZnO films, while it slightly decreased for the fresh ZnO films. The transmittance and absorbance spectra for the ZnO films were investigated in a wide wavelength range. The optical bandgap was specified by using Tauc’s relation. The electrical properties of the ZnO films (fresh and annealed at 400∘C for 3[Formula: see text]h) were studied before and after the oxygen ion beam irradiation. Also, the dielectric properties were investigated with respect to frequency at different ion beam irradiation fluences. The comprehensive results showed the dielectric and optical properties are improved due to the induced conductive networks by oxygen ion irradiation.


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