Josephson junctions fabricated by oxygen ion irradiation of YBa/sub 2/Cu/sub 3/O/sub 7-x/ thin films

1997 ◽  
Vol 7 (2) ◽  
pp. 3674-3677 ◽  
Author(s):  
J. Hollkott ◽  
S. Hu ◽  
C. Becker ◽  
J. Auge ◽  
B. Spangenberg ◽  
...  
Shinku ◽  
1993 ◽  
Vol 36 (3) ◽  
pp. 285-288
Author(s):  
Masami NAKASONE ◽  
Masao NOMA ◽  
Soucihi OGAWA ◽  
Tsutom Yotsuya ◽  
Yoshihiko SUZUKI

Shinku ◽  
1992 ◽  
Vol 35 (3) ◽  
pp. 207-210 ◽  
Author(s):  
Masao NOMA ◽  
Masami NAKASONE ◽  
Souichi OGAWA ◽  
Tsutomu YOTSUYA ◽  
Yoshihiko SUZUKI

2014 ◽  
Vol 27 (11) ◽  
pp. 2639-2643 ◽  
Author(s):  
J. Janaki ◽  
T. Geetha Kumary ◽  
Awadhesh Mani ◽  
E. P. Amaladass ◽  
N. Radhikesh Raveendran ◽  
...  

2020 ◽  
Vol 27 (12) ◽  
pp. 2050019 ◽  
Author(s):  
A. ABDEL-GALIL ◽  
A. ATTA ◽  
M. R. BALBOUL

In this paper, we report the influence of low-energy oxygen ion irradiation with fluence ranging from [Formula: see text][Formula: see text][Formula: see text] to [Formula: see text][Formula: see text][Formula: see text] on the structural, optical, and electrical properties of fresh and annealed (400∘C, 3[Formula: see text]h) zinc oxide (ZnO) thin films. These films were grown on soda-lime glass (SLG) substrates using the spin-coating method as a low-cost depositing technique. X-ray diffraction (XRD) study showed the formation of the hexagonal phase of ZnO thin films with preferred orientation along the (002) plane. The crystallite size for fresh and annealed ZnO thin films was in nanoscale and it increased with the annealing temperature. Also, the crystallite size increased with the ion beam irradiation fluence in the case of annealed ZnO films, while it slightly decreased for the fresh ZnO films. The transmittance and absorbance spectra for the ZnO films were investigated in a wide wavelength range. The optical bandgap was specified by using Tauc’s relation. The electrical properties of the ZnO films (fresh and annealed at 400∘C for 3[Formula: see text]h) were studied before and after the oxygen ion beam irradiation. Also, the dielectric properties were investigated with respect to frequency at different ion beam irradiation fluences. The comprehensive results showed the dielectric and optical properties are improved due to the induced conductive networks by oxygen ion irradiation.


2016 ◽  
Vol 23 (01) ◽  
pp. 1550085
Author(s):  
SHEHLA HONEY ◽  
F. T. THEMA ◽  
M. T. BHATTI ◽  
A. ISHAQ ◽  
SHAHZAD NASEEM ◽  
...  

In this paper, effect of oxygen (O[Formula: see text]) ion irradiation on the properties of polycrystalline cubic structure CdTe thin films has been investigated. CdTe thin films were irradiated with O[Formula: see text] ions of energy 80[Formula: see text]keV at different fluence ranging from [Formula: see text] to [Formula: see text] [Formula: see text]ion/cm2 at room temperature. At [Formula: see text] [Formula: see text]ion/cm2 O[Formula: see text] ions fluence, the CdTe structure was maintained while XRD peaks of cubic phase were shifted toward lower angles. At [Formula: see text] [Formula: see text]ion/cm2 O[Formula: see text] ions fluence, cubic structure of CdTe thin films was transformed into hexagonal structure. In addition, electrical resistivity and optical bandgap were decreased with increasing O[Formula: see text] ion beam irradiation.


RSC Advances ◽  
2021 ◽  
Vol 11 (42) ◽  
pp. 26218-26227
Author(s):  
R. Panda ◽  
S. A. Khan ◽  
U. P. Singh ◽  
R. Naik ◽  
N. C. Mishra

Swift heavy ion (SHI) irradiation in thin films significantly modifies the structure and related properties in a controlled manner.


2017 ◽  
Vol 1 (6) ◽  
Author(s):  
S. Cervera ◽  
M. Trassinelli ◽  
M. Marangolo ◽  
C. Carrétéro ◽  
V. Garcia ◽  
...  

2021 ◽  
Vol 129 (3) ◽  
pp. 035108
Author(s):  
Harsh Gupta ◽  
Ravi K. Bommali ◽  
Santanu Ghosh ◽  
Himanshu Srivastava ◽  
Arvind Srivastava ◽  
...  

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