scholarly journals Erratum to : Electron Beam Effect in High Efficiency Sheet Plasma Type-Volume Produced H-, D- Ion Source

Shinku ◽  
1970 ◽  
Vol 13 (2) ◽  
pp. 78-78
Keyword(s):  
Electron Beam ◽  
High Efficiency ◽  
Ion Source ◽  
Sheet Plasma

Characteristics of co-extracted electron beam current in sheet plasma-type cesium-free negative-ion source

2021 ◽  
Vol 168 ◽  
pp. 112676
Author(s):  
Hiroki Kaminaga ◽  
Toshikio Takimoto ◽  
Akira Tonegawa ◽  
Kohnosuke Sato
Keyword(s):  
Electron Beam ◽  
Beam Current ◽  
Ion Source ◽  
Negative Ion ◽  
Electron Beam Current ◽  
Sheet Plasma

Nucleation and Early Growth of Sputtered thin Films

1970 ◽  
Vol 28 ◽  
pp. 516-517
Author(s):  
Dudley M. Sherman ◽  
Thos. E. Hutchinson
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Ion Beam ◽  
Ion Source ◽  
Water Cooling ◽  
Stages Of Growth ◽  
Lens Assembly ◽  
Microscope Technique ◽  
Ion Beam Sputter Deposition

The in situ electron microscope technique has been shown to be a powerful method for investigating the nucleation and growth of thin films formed by vacuum vapor deposition. The nucleation and early stages of growth of metal deposits formed by ion beam sputter-deposition are now being studied by the in situ technique.A duoplasmatron ion source and lens assembly has been attached to one side of the universal chamber of an RCA EMU-4 microscope and a sputtering target inserted into the chamber from the opposite side. The material to be deposited, in disc form, is bonded to the end of an electrically isolated copper rod that has provisions for target water cooling. The ion beam is normal to the microscope electron beam and the target is placed adjacent to the electron beam above the specimen hot stage, as shown in Figure 1.

Characteristics of extracted ion beam from a cesium-free negative ion source using sheet plasma

2020 ◽  
Vol 91 (11) ◽  
pp. 113302
Author(s):  
H. Kaminaga ◽  
T. Takimoto ◽  
A. Tonegawa ◽  
K. N. Sato
Keyword(s):  
Ion Beam ◽  
Ion Source ◽  
Negative Ion ◽  
Sheet Plasma

A high efficiency cavity ion source using TIMS for nuclear forensic analysis

2007 ◽  
Vol 444-445 ◽  
pp. 660-662 ◽  
Author(s):  
S. Bürger ◽  
L.R. Riciputi ◽  
S. Turgeon ◽  
D. Bostick ◽  
E. McBay ◽  
...  
Keyword(s):  
High Efficiency ◽  
Forensic Analysis ◽  
Ion Source ◽  
Nuclear Forensic

Mass analyzer using electron‐beam‐guiding type ion source

1979 ◽  
Vol 50 (12) ◽  
pp. 1517-1520 ◽  
Author(s):  
Tohru Kishi ◽  
Isao Yamada ◽  
Toshinori Takagi
Keyword(s):  
Electron Beam ◽  
Ion Source ◽  
Mass Analyzer

Simulations of a Johann/Johansson diffraction spectrometer for x-ray experiments at an electron beam ion source

2013 ◽  
Vol T156 ◽  
pp. 014101 ◽  
Author(s):  
Ł Jabłoński ◽  
P Jagodziński ◽  
D Banaś ◽  
M Pajek
Keyword(s):  
Electron Beam ◽  
Ion Source ◽  
X Ray
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