scholarly journals Common failures of ship propulsion shafts

Pomorstvo ◽  
2017 ◽  
Vol 31 (2) ◽  
pp. 85-90 ◽  
Author(s):  
Goran Vizentin ◽  
Goran Vukelić ◽  
Mateo Srok
Keyword(s):  
Failure Analysis ◽  
Fatigue Failure ◽  
General Description ◽  
Stress Concentrations ◽  
Propulsion Systems ◽  
Ship Propulsion ◽  
System A ◽  
Analysis Methodology ◽  
Fatigue Development ◽  
Marine Propulsion

This article aims to provide a critical review of the most common failures of ship propulsion systems as a crucial ship system, with emphasis on fatigue failure. The accent is given on the shaft of marine propulsion systems as a most common point of failures in the entire propulsion system. A general description of failure causes and failure analysis methodology is presented. Several representative case studies summaries for fatigue failure on critical points of the propulsion shaft are described. Torsional vibrations and geometric stress concentrations of the shaft are identified as the most common cause of fatigue failure. The importance of constant monitoring, measurement and data collection of fatigue indicators and indicative events that have influence on fatigue development is emphasized. Methods used in failure analysis are discussed and propositions for improvement are given, especially in terms of using numerical routines in failure prediction.

scholarly journals Marine Propulsion System Failures—A Review

2020 ◽  
Vol 8 (9) ◽  
pp. 662
Author(s):  
Goran Vizentin ◽  
Goran Vukelic ◽  
Lech Murawski ◽  
Naman Recho ◽  
Josip Orovic
Keyword(s):  
Failure Analysis ◽  
Propulsion Systems ◽  
Worst Case ◽  
System Failures ◽  
Operational Conditions ◽  
Design Procedures ◽  
Ship Propulsion ◽  
The People ◽  
Marine Propulsion ◽  
Analytical Tools

Failures of marine propulsion components or systems can lead to serious consequences for a vessel, cargo and the people onboard a ship. These consequences can be financial losses, delay in delivery time or a threat to safety of the people onboard. This is why it is necessary to learn about marine propulsion failures in order to prevent worst-case scenarios. This paper aims to provide a review of experimental, analytical and numerical methods used in the failure analysis of ship propulsion systems. In order to achieve that, the main causes and failure mechanisms are described and summarized. Commonly used experimental, numerical and analytical tools for failure analysis are given. Most indicative case studies of ship failures describe where the origin of failure lies in the ship propulsion failures (i.e., shaft lines, crankshaft, bearings, foundations). In order to learn from such failures, a holistic engineering approach is inevitable. This paper tries to give suggestions to improve existing design procedures with a goal of producing more reliable propulsion systems and taking care of operational conditions.

Lithium-ion Battery Degradation Mechanisms and Failure Analysis Methodology

2012 ◽  
Author(s):  
Bhanu Sood ◽  
Lucas Severn ◽  
Michael Osterman ◽  
Michael Pecht ◽  
Anton Bougaev ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Lithium Ion Batteries ◽  
Elevated Temperatures ◽  
Failure Process ◽  
Lithium Ion ◽  
Degradation Mechanisms ◽  
Analysis Methodology ◽  
Depth Of Discharge ◽  
Battery Degradation ◽  
Non Destructive

Abstract A review of the prevalent degradation mechanisms in Lithium ion batteries is presented. Degradation and eventual failure in lithium-ion batteries can occur for a variety of dfferent reasons. Degradation in storage occurs primarily due to the self-discharge mechanisms, and is accelerated during storage at elevated temperatures. The degradation and failure during use conditions is generally accelerated due to the transient power requirements, the high frequency of charge/discharge cycles and differences between the state-of-charge and the depth of discharge influence the degradation and failure process. A step-by-step methodology for conducting a failure analysis of Lithion batteries is presented. The failure analysis methodology is illustrated using a decision-tree approach, which enables the user to evaluate and select the most appropriate techniques based on the observed battery characteristics. The techniques start with non-destructive and non-intrusive steps and shift to those that are more destructive and analytical in nature as information about the battery state is gained through a set of measurements and experimental techniques.

Application of Conductive-AFM in Soft Failure Analysis

2017 ◽  
Author(s):  
Chuan Zhang ◽  
Yinzhe Ma ◽  
Gregory Dabney ◽  
Oh Chong Khiam ◽  
Esther P.Y. Chen
Keyword(s):  
Failure Analysis ◽  
Conductive Atomic Force Microscopy ◽  
Test Parameter ◽  
Conductive Afm ◽  
Force Microscopy ◽  
Analysis Methodology ◽  
Soft Failure ◽  
Atomic Force ◽  
Test Conditions ◽  
Sensitive Characteristics

Abstract Soft failures are among the most challenging yield detractors. They typically show test parameter sensitive characteristics, which would pass under certain test conditions but fail under other conditions. Conductive-atomic force microscopy (CAFM) emerged as an ideal solution for soft failure analysis that can balance the time and thoroughness. By inserting CAFM into the soft failure analysis flow, success rate of such type of analysis can be significantly enhanced. In this paper, a logic chain soft failure and a SRAM local bitline soft failure are used as examples to illustrate how this failure analysis methodology provides a powerful and efficient solution for soft failure analysis.

Failure Analysis Enhancement by Incorporating a Compact Scan Diagnosis System

2014 ◽  
Author(s):  
Rommel Estores ◽  
Pascal Vercruysse ◽  
Karl Villareal ◽  
Eric Barbian ◽  
Ralph Sanchez ◽  
...  
Keyword(s):  
Data Analysis ◽  
Failure Analysis ◽  
Real Analysis ◽  
Failure Data ◽  
Analysis Methodology ◽  
Efficiency And Effectiveness ◽  
Scan Chain ◽  
On Chip ◽  
Analysis Environment ◽  
Selection Of

Abstract The failure analysis community working on highly integrated mixed signal circuitry is entering an era where simultaneously System-On-Chip technologies, denser metallization schemes, on-chip dissipation techniques and intelligent packages are being introduced. These innovations bring a great deal of defect accessibility challenges to the failure analyst. To contend in this era while aiming for higher efficiency and effectiveness, the failure analysis environment must undergo a disruptive evolution. The success or failure of an analysis will be determined by the careful selection of tools, data and techniques in the applied analysis flow. A comprehensive approach is required where hardware, software, data analysis, traditional FA techniques and expertise are complementary combined [1]. This document demonstrates this through the incorporation of advanced scan diagnosis methods in the overall analysis flow for digital functionality failures and supporting the enhanced failure analysis methodology. For the testing and diagnosis of the presented cases, compact but powerful scan test FA Lab hardware with its diagnosis software was used [2]. It can therefore easily be combined with the traditional FA techniques to provide stimulus for dynamic fault localizations [3]. The system combines scan chain information, failure data and layout information into one viewing environment which provides real analysis power for the failure analyst. Comprehensive data analysis is performed to identify failing cells/nets, provide a better overview of the failure and the interactions to isolate the fault further to a smaller area, or to analyze subtle behavior patterns to find and rationalize possible faults that are otherwise not detected. Three sample cases will be discussed in this document to demonstrate specific strengths and advantages of this enhanced FA methodology.

Device Selection for Failure Analysis of Chain Fails Using Diagnosis Driven Yield Analysis

2011 ◽  
Author(s):  
Chris Schuermyer ◽  
Brady Benware ◽  
Graham Rhodes ◽  
Davide Appello ◽  
Vincenzo Tancorre ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Case Studies ◽  
Yield Analysis ◽  
Analysis Methodology ◽  
Device Selection ◽  
Selection For ◽  
Random Defects

Abstract This work presents the first application of a diagnosis driven approach for identifying systematic chain fail defects in order to reduce the time spent in failure analysis. The zonal analysis methodology that is applied separates devices into systematic and random populations of chain fails in order to prevent submitting random defects for failure analysis. Two silicon case studies are presented to validate the production worthiness of diagnosis driven yield analysis for chain fails. The defects uncovered in these case studies are very subtle and would be difficult to identify with any other methodology.

Failure Analysis of Functional Failures in a Designed for FA SRAM

2004 ◽  
Author(s):  
Gil Garteiz
Keyword(s):  
Failure Analysis ◽  
Success Rate ◽  
Physical Analysis ◽  
Analysis Methodology

Abstract Designing devices for failure analisys (FA) is becoming increasingly critical as structure geometries and killer defects rapidly decrease in size. Naturally, devices that are designed for FA are much easier to analyze and have a higher FA success rate than those that are not. Several analyses of functional failures in a 0.18um CMOS SRAM are presented in this paper to demonstrate “Design For FA” usefulness and application. Physical analysis methodology is also discussed.

scholarly journals Fatigue failure analysis of drilling tools for ultra-deep wells in shunbei Block

2018 ◽  
Vol 423 ◽  
pp. 012190
Author(s):  
Biao Liu ◽  
Zhongxi Zhu ◽  
Jun Zhang ◽  
Wanneng Lei ◽  
Baichuan Wu
Keyword(s):  
Failure Analysis ◽  
Fatigue Failure ◽  
Deep Wells ◽  
Drilling Tools
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