DIN EN ISO 25178-700:2020-11, Geometrische Produktspezifikation_(GPS)_- Oberflächenbeschaffenheit_- Teil_700: Kalibrierung, Justierung und Verifizierung von flächenhaften Topographiemessgeräten (ISO/DIS_25178-700:2020); Deutsche und Englische Fassung prEN_ISO_25178-700:2020

2020 ◽  
Keyword(s):  
Iso 25178

scholarly journals Effect of a Misidentified Centre of a Type ASG Material Measure on the Determined Topographic Spatial Resolution of an Optical Point Sensor

Metrology ◽  
2022 ◽  
Vol 2 (1) ◽  
pp. 19-32
Author(s):  
Janik Schaude ◽  
Andreas Christian Gröschl ◽  
Tino Hausotte
Keyword(s):  
Spatial Resolution ◽  
Good Practice ◽  
Practice Guide ◽  
Measurement And Evaluation ◽  
Period Limit ◽  
Material Measure ◽  
Iso 25178

The article presents the determination of the topographic spatial resolution of an optical point sensor. It is quantified by the lateral period limit DLIM measured on a type ASG material measure, also called (topographic) Siemens star, with a confocal sensor following both a radial measurement and evaluation, as proposed by ISO 25178-70, and the measurement and subsequent evaluation of two line scans, proposed by the NPL Good Practice Guide. As will be shown, for the latter, an only slightly misidentified target centre of the Siemens star leads to quite significant errors of the determined DLIM. Remarkably, a misidentified target centre does not necessarily result in an overestimation of DLIM, but lower values might also be obtained. Therefore, a modified Good Practice Guide is proposed to determine DLIM more accurately, as it includes a thorough determination of the centre of the Siemens star as well. While the measurement and evaluation effort is increased slightly compared to the NPL Good Practice Guide, it is still much faster than a complete radial measurement and evaluation.

Modeling the systematic behavior at the micro and nano length scales

2022 ◽  
Author(s):  
Danilo Quagliotti
Keyword(s):  
Case Studies ◽  
Influence Factors ◽  
Repeated Measurements ◽  
Length Scales ◽  
Frequentist Statistics ◽  
Systematic Behavior ◽  
Contact Instrument ◽  
Model Equations ◽  
Definition Of ◽  
Iso 25178

Abstract The assessment of the systematic behavior based on frequentist statistics was analyzed in the context of micro/nano metrology. The proposed method is in agreement with the well-known GUM recommendations. The investigation assessed three different case studies with definition of model equations and establishment of the traceability. The systematic behavior was modeled in Sq roughness parameters and step height measurements obtained from different types of optical microscopes, and in comparison with a calibrated contact instrument. The sequence of case studies demonstrated the applicability of the method to micrographs when their elements are averaged. Moreover, a number of influence factors, which are typical causes of inaccuracy at the micro and nano length scales, were analyzed in relation to the correction of the systematic behavior, viz. the amount of repeated measurements, the time sequence of the acquired micrographs and the instrument-operator chain. The possibility of applying the method individually to the elements of the micrographs was instead proven not convenient and too onerous for the industry. Eventually, the method was also examined against the framework of the metrological characteristics defined in ISO 25178-600 with hints on possible future developments.

scholarly journals Description of the Pumping Rate of Shaft Counterfaces in the Sealing System Radial Lip Seal Using the 3D Parameters of ISO 25178

2016 ◽  
Vol 11 (2) ◽  
pp. 69-74
Author(s):  
Cornelius Fehrenbacher ◽  
Lothar Hoerl ◽  
Frank Bauer ◽  
Werner Haas
Keyword(s):  
Pumping Rate ◽  
Lip Seal ◽  
Iso 25178

scholarly journals Theoretical Analysis of Spacing Parameters of Anisotropic 3D Surface Roughness

2017 ◽  
Vol 54 (2) ◽  
pp. 55-63 ◽  
Author(s):  
J. Rudzitis ◽  
N. Bulaha ◽  
J. Lungevics ◽  
O. Linins ◽  
K. Berzins
Keyword(s):  
Surface Roughness ◽  
Aspect Ratio ◽  
Longitudinal Direction ◽  
Anisotropy Coefficient ◽  
Anisotropic Surface ◽  
Measuring Devices ◽  
3D Surface ◽  
3D Surface Roughness ◽  
The Mean ◽  
Iso 25178

Abstract The authors of the research have analysed spacing parameters of anisotropic 3D surface roughness crosswise to machining (friction) traces RSm1 and lengthwise to machining (friction) traces RSm2. The main issue arises from the RSm2 values being limited by values of sampling length l in the measuring devices; however, on many occasions RSm2 values can exceed l values. Therefore, the mean spacing values of profile irregularities in the longitudinal direction in many cases are not reliable and they should be determined by another method. Theoretically, it is proved that anisotropic surface roughness anisotropy coefficient c=RSm1/RSm2 equals texture aspect ratio Str, which is determined by surface texture standard EN ISO 25178-2. This allows using parameter Str to determine mean spacing of profile irregularities and estimate roughness anisotropy.

Algorithmization for Calculating Fractal Parameters of the Relief of a Rough Surface According to GOST R ISO 25178-2-2014

2020 ◽  
Vol 63 (8) ◽  
pp. 610-618
Author(s):  
B. N. Markov ◽  
D. A. Masterenko ◽  
P. N. Emelyanov ◽  
V. I. Teleshevskiy
Keyword(s):  
Rough Surface ◽  
Fractal Parameters ◽  
Iso 25178

ANALYSIS OF SURFACE ROUGHNESS AT OVERLAPPING LASER SHOCK PEENING

2016 ◽  
Vol 23 (03) ◽  
pp. 1650012 ◽  
Author(s):  
F. Z. DAI ◽  
Z. D. ZHANG ◽  
J. Z. ZHOU ◽  
J. Z. LU ◽  
Y. K. ZHANG
Keyword(s):  
Surface Roughness ◽  
Theoretical Analysis ◽  
Equilateral Triangle ◽  
Experimental Results ◽  
Laser Shock Peening ◽  
Laser Shock ◽  
Minimum Value ◽  
Maximum Value ◽  
Shock Peening ◽  
Iso 25178

The overlapping effects on surface roughness are studied when samples are treated by laser shock peening (LSP). Surface roughness of overlapped circular laser spot is calculated by ISO 25178 height parameters. The usually used overlapping styles namely isosceles-right-triangle-style (AAP) and equilateral-triangle-style (AAA) are carefully investigated when the overlapping degree in x-axis ([Formula: see text]) is below 50%. Surface roughness of isosceles-right-triangle-style attains its minimum value at [Formula: see text] of 29.3%, and attains its maximum value at [Formula: see text] of 43.6%. Surface roughness of equilateral-triangle-style attains its minimum value at [Formula: see text] of 42.3%, and attains its maximum value at [Formula: see text] of 32%. Experimental results are well consistent with theoretical analysis.

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