scholarly journals Defect formation during synthesis and welding of silver nanowires for solar cell applications

10.30544/452 ◽  
2020 ◽  
Vol 25 (04) ◽  
pp. 287-299
Author(s):  
Vuk Radmilovic ◽  
Velimir R. Radmilović

Structural defects such as stacking faults and twins, observed in many face-centered cubic (FCC) structured metals and alloys with low stacking fault energies, in general, play an important role in microstructure evolution, and in particular, in nucleation and crystal growth, morphology development, and phase transformations during synthesis as well as post-synthesis processes.

2022 ◽  
Vol 210 ◽  
pp. 114461
Author(s):  
Fuzhou Han ◽  
Geping Li ◽  
Fusen Yuan ◽  
Yingdong Zhang ◽  
Wenbin Guo ◽  
...  

2015 ◽  
Vol 48 (1) ◽  
pp. 238-243 ◽  
Author(s):  
Antara Pal ◽  
Janne-Mieke Meijer ◽  
Joost R. Wolters ◽  
Willem K. Kegel ◽  
Andrei V. Petukhov

The crystalline structure assembled out of charge-stabilized asymmetric dumbbell-like colloidal particles in ethyl alcohol by sedimentation has been probed using small-angle X-ray scattering with microradian resolution. The existence of plastic face-centered cubic crystals was inferred from the observed Bragg peaks. The presence of stacking faults and the mosaic structure of the sample lead to the appearance of diffuse scattering, forming Bragg scattering cylinders in the three-dimensional reciprocal space. The quality of the crystalline structure, as ascertained from a detailed analysis of the diffuse scattering intensity distribution, indicates the presence of only 1.5% of stacking faults between the hexagonal close-packed layers.


Author(s):  
P. C. J. Gallagher

Stacking faults are an important substructural feature of many materials, and have been widely studied in layer structures (e.g. talc) and in crystals with hexagonal and face centered cubic structure. Particular emphasis has been placed on the study of faulted defects in f.c.c. alloys, since the width of the band of fault between dissociated partial dislocations has a major influence on mechanical properties.Under conditions of elastic equilibrium the degree of dissociation reflects the balance of the repulsive force between the partials bounding the fault, and the attractive force associated with the need to minimize the energy arising from the misfits in stacking sequence. Examples of two of the faulted defects which can be used to determine this stacking fault energy, Υ, are shown in Fig. 1. Intrinsically faulted extended nodes (as at A) have been widely used to determine Υ, and examples will be shown in several Cu and Ag base alloys of differing stacking fault energy. The defect at B contains both extrinsic and intrinsic faulting, and readily enables determination of both extrinsic and intrinsic fault energies.


Nanoscale ◽  
2018 ◽  
Vol 10 (28) ◽  
pp. 13329-13334 ◽  
Author(s):  
Xiaobin Feng ◽  
Jinyu Zhang ◽  
Kai Wu ◽  
Xiaoqing Liang ◽  
Gang Liu ◽  
...  

The present stacking faulted and nanotwinned Al0.1CoCrFeNi high-entropy alloy pillars achieved the maximum strength among face-centered cubic structured metals.


1998 ◽  
Vol 510 ◽  
Author(s):  
Noboru Ohtani ◽  
Jun Takahashi ◽  
Masakazu Katsuno ◽  
Hirokatsu Yashiro ◽  
Masatoshi Kanaya

AbstractThe defect formation during sublimation bulk crystal growth of silicon carbide (SiC) is discussed. SiC bulk crystals are produced by seeded sublimation growth (modified-Lely method), where SiC source powder sublimes and is recrystallized on a slightly cooled seed crystal at uncommonly high temperatures (≥2000°C). The crystals contain structural defects such as micropipes (hollow core dislocations), subgrain boundaries, stacking faults and glide dislocations in the basal plane. The type and density of the defects largely depend on the crystal growth direction, and many aspects are different between the growth parallel and perpendicular to the <0001> c-axis. Micropipes are characteristic defects to the c-axis growth, while a large number of stacking faults are introduced during growth perpendicular to the c-axis. We discuss the cause and mechanism of the defect formation


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