scholarly journals Numerical Analysis on Thermal Conductivity of Vapor Chamber Using an Iterative Approach

10.29007/wt1h ◽  
2018 ◽  
Author(s):  
Deepak Jani ◽  
Mukesh Keshwani ◽  
Amarish Badgujar ◽  
Ajit Chaudhari

Technological developments have resulted in a growing demand for high power electronic devices. Although these high power devices meet the high performance requirements, they also generate a very large amount of heat which adversely affects their operating efficiency. Most part of the heat within a package is generated at the chip and hence it is important to keep junction temperature as low as possible. This is commonly achieved by using heat sinks mounted directly on top of the package. Using a vapor chamber can reduce thermal resistance by better spreading heat across the heat sink base. This work presents a parametric study of vapor chambers as heat spreaders and discusses the merits of using this technology especially in high power devices through CFD modeling. Iterative method is used to finalize the value of Ks and Kl by considering the orthotropic approach.

2012 ◽  
Vol 463-464 ◽  
pp. 1332-1340 ◽  
Author(s):  
Lei Wu ◽  
Xiao Yun Xiong ◽  
De Xing Wang

In this study, the junction temperature (Tj) and thermal resistance (Rth) of five high-power multi-chip COB (chip-on-board) LED packages with different chip spacings were compared. The actual Tjwas measured by an IR camera and compared with the simulation results from a computational fluid dynamics (CFD) software. In addition, the effects of heat slugs with different thermal conductivity, heat sinks of various thicknesses, chip size, and forced convection cooling on the Tjand Rthof high-powered LED components were investigated. The experimental results show that smaller chip spacing resulted in higher Tjand Rth. The heat dissipation performance can be improved by using a heat slug with a high thermal conductivity; and increasing the thickness of the heat sink, or employing forced convection cooling.


2014 ◽  
Vol 487 ◽  
pp. 149-152 ◽  
Author(s):  
Zaliman Sauli ◽  
Rajendaran Vairavan ◽  
Vithyacharan Retnasamy

Thermal management of high power LED is crucial the reliability and performance of the LED affected by the heat produced during photon emission. Heat sinks are utilized to dissipate the heat and to lower the operating junction temperature of LED. This paper demonstrates a simulation work done to evaluate the influence heat sink fin number on the junction temperature and stress of single chip LED package using Ansys version 11. The heat sink with fin number of 4 fins, 6 fins and 8 fins were used and compared. Results showed that increase in heat sink fin number significantly reduces the junction temperature of the LED package.


1995 ◽  
Vol 05 (03) ◽  
pp. 503-521 ◽  
Author(s):  
LOURENCO MATAKAS ◽  
CATALIN BURLACU ◽  
EISUKE MASADA

Recently, there is an increased demand for high power, high performance converters for power system applications, motor drives, etc. The low switching frequency of the existing semiconductor power devices poses a severe limitation that can be overcome by the use of interconnected smaller power converters (multiconverter) with appropriate control. This paper gives an overview of the state of the art of multiconverters, followed by a comparison based on analytically calculated values of the spectra, RMS and peak values of their ripple currents, and the peak values of the transformer's flux. Special attention has been given to show that the transformerless parallel connection of converters is feasible and offers features such as simplicity, gracefully degrading operating, high reliability, easy expandability and easy maintenance.


RSC Advances ◽  
2018 ◽  
Vol 8 (12) ◽  
pp. 6544-6550 ◽  
Author(s):  
Chuanjin Huang ◽  
Wenxiang Mu ◽  
Hai Zhou ◽  
Yongwei Zhu ◽  
Xiaoming Xu ◽  
...  

β-Ga2O3, a semiconductor material, has attracted considerable attention given its potential applications in high-power devices, such as high-performance field-effect transistors.


2018 ◽  
Vol 12 (2) ◽  
pp. 143-144
Author(s):  
Toshiro Doi

Since the transistor was invented at Bell Laboratories in 1947 and the concept of the integrated circuit was presented by Jack Kilby of TI in 1958, devices using silicon semiconductors have been developed with tremendous drive. Today, ultrastructural, highly dense, and high-functional ULSI devices have become a reality. Accordingly, novel, three-dimensional devices that aim at multiple functions and high performance have been proposed, and novel materials have come into existence. As Artificial Intelligence (AI) has drawn increasing attention, the concept of “Singularity,” or singular technical point, has become a focus of great attention. Singularity is a prediction put forth by American futurist Ray Kurzweil, who said, “Singularity will come in 2045, when the speed of the evolution of technology will become infinite and Artificial Intelligence will exceed human intelligence.” This prediction is said to have its roots in “Moore’s law,” formulated by Intel founder Gordon Moore, which states that “the degree of integration of transistors doubles every year and a half.” The deep learning and self-learning functions of computers can be mentioned as significant driving factors behind the dramatic development of AI studies. The processing capacity of AI has increased exponentially owing to the evolution and combination of various technologies, and the speed of development of technology now far exceeds the biological limits of humankind. As a result, it is inevitable that “Singularity” will come to pass, and the technologies behind semiconductor devices contributing to the arrival of Singularity are expected to develop much further. In the process of such semiconductor development, silicon carbide (SiC), among other materials, came to be expected as the next-generation semiconductor in the 1950s, but it could not succeed significantly as a practical device. SiC also attracted attention as the material used in green and red light-emitting elements. In the 1990s, SiC came into the spotlight, along with gallium nitride (GaN) crystal and other materials, by being put into practical use as the material used in blue light-emitting diodes. Today, as the silicon (Si) as power devices have already approached the physical limits of the material, next-generation devices focus on semiconductor substrates such as SiC and GaN, which have performance indexes tens to thousands of times higher than the Si semiconductor. Especially, high-power devices and high-frequency devices have attracted special attention, because the use of semiconductor devices in the automotive and other fields has increased dramatically. Furthermore, the single-crystal substrate of semiconducting diamond is considered to be the ultimate semiconductor device, so this topic has been vigorously researched. The above-mentioned next-generation devices are called green devices because they could reduce power consumption and carbon dioxide emissions tremendously, leading to the realization of a low-carbon and energy-saving society. Such devices are utilized not only as high-power semiconductors and light-emitting semiconductors but also as various sensors, including gas sensors and UV sensors, as well as MEMS devices. Further application of such devices is expected in the future. To actually produce the high-performance and multifunctional green devices, it will be necessary to establish the technologies for device integration and the manufacturing process. An example would be the process of growing crystals that are larger in diameter and higher in quality. The substrate materials applied in such technologies, including SiC, GaN, and diamond, are known as ultra-hard-to-process materials: their extreme mechanical and chemical stability makes the general manufacturing process much more difficult. A breakthrough is needed to solve this problem. Many challenges must be overcome systematically to produce a high-performance green device, as the device to which such crystalline materials are applied will reduce power consumption and carbon dioxide emissions extremely effectively. This special issue focuses on manufacturing processes, including the planarization processing of every kind of hard-to-process crystal substrate, involved in producing green devices, sensors, etc. And the paper on the various applications of the device are published in this issue. This issue is expected to contribute to the establishment of a process for manufacturing green devices, which is an essential industrial strategy, as well as to future intensive studies in this field.


Author(s):  
Y. P. Zhang ◽  
X. L. Yu ◽  
Q. K. Feng ◽  
L. H. Zhang

This paper presents an integrated power electronics module with a vapor chamber (VC) acting as a heat spreader to transfer the heat from the insulated gate bipolar transistor (IGBT) module to the base of the heat-sink. The novel VC integrated in a power module instead of a metal substrate is proposed. Compared with a conventional metal heat spreader, the VC significantly diffuses the concentrated heat source to a larger condensing area. The experimental results indicate that the VC based heat-sink will maintain the IGBT junction temperature 20°C cooler than a non-VC based heat-sink with high power density. The junction-to-case thermal resistance of the power module based on the VC is about 50% less than that of the power module based on a copper substrate with the same weight. The chip overshooting temperature of the copper substrate module with the same weight goes beyond 10°C against the junction temperature of the VC module at a given impulse power of 225 W. Consequently, thanks to a longer time duration to reach the same temperature, a power surge for the chip can be avoided and the ability to resist thermal impact during the VC module startup can be improved as well. The investigation shows that the VC power module is an excellent candidate for the original metal substrate, especially for an integrated power module with high power density.


Micromachines ◽  
2021 ◽  
Vol 12 (2) ◽  
pp. 169
Author(s):  
Mengcheng Wang ◽  
Shenglin Ma ◽  
Yufeng Jin ◽  
Wei Wang ◽  
Jing Chen ◽  
...  

Through Silicon Via (TSV) technology is capable meeting effective, compact, high density, high integration, and high-performance requirements. In high-frequency applications, with the rapid development of 5G and millimeter-wave radar, the TSV interposer will become a competitive choice for radio frequency system-in-package (RF SIP) substrates. This paper presents a redundant TSV interconnect design for high resistivity Si interposers for millimeter-wave applications. To verify its feasibility, a set of test structures capable of working at millimeter waves are designed, which are composed of three pieces of CPW (coplanar waveguide) lines connected by single TSV, dual redundant TSV, and quad redundant TSV interconnects. First, HFSS software is used for modeling and simulation, then, a modified equivalent circuit model is established to analysis the effect of the redundant TSVs on the high-frequency transmission performance to solidify the HFSS based simulation. At the same time, a failure simulation was carried out and results prove that redundant TSV can still work normally at 44 GHz frequency when failure occurs. Using the developed TSV process, the sample is then fabricated and tested. Using L-2L de-embedding method to extract S-parameters of the TSV interconnection. The insertion loss of dual and quad redundant TSVs are 0.19 dB and 0.46 dB at 40 GHz, respectively.


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