Ion energy measurements in a Direct Wave-Drive Thruster

Author(s):  
Matthew S. Feldman ◽  
Edgar Choueiri ◽  
Benjamin Jorns
Keyword(s):  
2018 ◽  
Vol 34 (5) ◽  
pp. 1124-1130
Author(s):  
Matthew S. Feldman ◽  
Edgar Y. Choueiri
Keyword(s):  

1991 ◽  
Vol 223 ◽  
Author(s):  
Qin Fuguang ◽  
Yao Zhenyu ◽  
Ren Zhizhang ◽  
S.-T. Lee ◽  
I. Bello ◽  
...  

ABSTRACTDirect ion beam deposition of carbon films on silicon in the ion energy range of 15–500eV and temperature range of 25–800°C has been studied using mass selected C+ ions under ultrahigh vacuum. The films were characterized with X-ray photoelectron spectroscopy, Raman spectroscopy, and transmission electron microscopy and diffraction analysis. Films deposited at room temperature consist mainly of amorphous carbon. Deposition at a higher temperature, or post-implantation annealing leads to formation of microcrystalline graphite. A deposition temperature above 800°C favors the formation of microcrystalline graphite with a preferred orientation in the (0001) direction. No evidence of diamond formation was observed in these films.


Author(s):  
Enyu Ma ◽  
Hui Zhao ◽  
Shuo Chen ◽  
Shuai Wang ◽  
Xin Huo ◽  
...  
Keyword(s):  

2021 ◽  
pp. 2101698
Author(s):  
Chun‐Chao Hou ◽  
Yu Wang ◽  
Lianli Zou ◽  
Miao Wang ◽  
Hongwen Liu ◽  
...  
Keyword(s):  

Author(s):  
Martin H. Weik
Keyword(s):  

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