Side force computations for slender bodies by a far-field approach

1988 ◽  
Vol 25 (1) ◽  
pp. 9-18
Author(s):  
Y. Y. Chan
Keyword(s):  
Far Field ◽  
Side Force ◽  
Field Approach ◽  
Slender Bodies

Internal Drag Evaluation for a Through-Flow Nacelle Using a Far-Field Approach

2015 ◽  
Vol 52 (6) ◽  
pp. 1847-1857 ◽  
Author(s):  
Benoit Malouin ◽  
Martin Gariépy ◽  
Jean-Yves Trépanier ◽  
Éric Laurendeau
Keyword(s):  
Far Field ◽  
Field Approach ◽  
Through Flow

scholarly journals Computational Drag Prediction of the DPW4 Configuration Using the Far-Field Approach

2011 ◽  
Vol 48 (5) ◽  
pp. 1658-1670 ◽  
Author(s):  
David Hue ◽  
Sebastien Esquieu
Keyword(s):  
Far Field ◽  
Field Approach ◽  
Drag Prediction

scholarly journals Plasmonics of Opal Surface: A Combined Near- and Far-Field Approach

2016 ◽  
Vol 120 (34) ◽  
pp. 19308-19315 ◽  
Author(s):  
Clotilde Lethiec ◽  
Guillaume Binard ◽  
Trajan Popescu ◽  
Hugo Frederich ◽  
Hong Phan Ngoc ◽  
...  
Keyword(s):  
Far Field ◽  
Field Approach

A traditional Near Field-Far Field approach-based model and a spreadsheet workbook to manage Oxygen Deficiency Hazard

2021 ◽  
Vol 149 ◽  
pp. 537-556
Author(s):  
Elena Stefana ◽  
Filippo Marciano ◽  
Daniel Drolet ◽  
Thomas W. Armstrong
Keyword(s):  
Oxygen Deficiency ◽  
Near Field ◽  
Far Field ◽  
Field Approach

Possible applications of fraunhofer holography in high resolution electron microscopy

1978 ◽  
Vol 36 (1) ◽  
pp. 222-223 ◽  
Author(s):  
N. Bonnet ◽  
M. Troyon ◽  
P. Gallion
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Transfer Function ◽  
Radiation Damage ◽  
High Resolution Electron Microscopy ◽  
Far Field ◽  
Field Region ◽  
Crystalline Materials ◽  
Resolution Electron ◽  
The Ideal

Two main problems in high resolution electron microscopy are first, the existence of gaps in the transfer function, and then the difficulty to find complex amplitude of the diffracted wawe from registered intensity. The solution of this second problem is in most cases only intended by the realization of several micrographs in different conditions (defocusing distance, illuminating angle, complementary objective apertures…) which can lead to severe problems of contamination or radiation damage for certain specimens.Fraunhofer holography can in principle solve both problems stated above (1,2). The microscope objective is strongly defocused (far-field region) so that the two diffracted beams do not interfere. The ideal transfer function after reconstruction is then unity and the twin image do not overlap on the reconstructed one.We show some applications of the method and results of preliminary tests.Possible application to the study of cavitiesSmall voids (or gas-filled bubbles) created by irradiation in crystalline materials can be observed near the Scherzer focus, but it is then difficult to extract other informations than the approximated size.

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