scholarly journals Critical Embedded Systems Development Using Formal Methods and Statistical Reliability Metrics

2019 ◽  
Vol 4 (1) ◽  
pp. 231-247
Author(s):  
Jonathan Lockhart ◽  
Carla Purdy ◽  
Philip Wilsey
Keyword(s):  
Embedded Systems ◽  
Formal Methods ◽  
Systems Development ◽  
Statistical Reliability

Formal Methods

2019 ◽  
pp. 7-30
Author(s):  
Pierre-Loïc Garoche
Keyword(s):  
Embedded Systems ◽  
Formal Methods ◽  
Systems Development ◽  
Basic Properties

This chapter gives a brief overview of some formal methods and their use in the context of critical embedded systems development. While testing is a common practice for a lot of engineers as a way to evaluate whether the program they developed fulfills its needs, formal methods are less known and may require a little introduction to the non-expert. This chapter thus serves as a reasonable introduction to the control expert engineer. It first defines the semantics of programs: their basic properties and their meaning. Then, the chapter outlines different formal verifications and explains how they reason on the program artifact. A last part addresses the soundness of the analyses with respect to the actual semantics.

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