scholarly journals Fast online diagnosis of open-circuit switching faults in flying capacitor multilevel inverters

2020 ◽  
Vol 6 (4) ◽  
pp. 53-62
Author(s):  
Majid T. Fard ◽  
Waqar A. Khan ◽  
Jiangbiao He ◽  
Nathan Weise ◽  
Mostafa Abarzadeh
Keyword(s):  
Open Circuit ◽  
Circuit Switching ◽  
Multilevel Inverters

Open-circuit fault-tolerance in multilevel inverters with reduced component count

2019 ◽  
Vol 102 (1) ◽  
pp. 409-419
Author(s):  
Niraj Kumar Dewangan ◽  
Tapan Prakash ◽  
Jitendra Kumar Tandekar ◽  
Krishna Kumar Gupta
Keyword(s):  
Fault Tolerance ◽  
Open Circuit ◽  
Multilevel Inverters

scholarly journals A Fast On-Line Diagnostic Method for Open-Circuit Switch Faults in SiC-MOSFET-Based T-Type Multilevel Inverters

2017 ◽  
Vol 53 (3) ◽  
pp. 2948-2958 ◽  
Author(s):  
Jiangbiao He ◽  
Nabeel A. O. Demerdash ◽  
Nathan Weise ◽  
Ramin Katebi
Keyword(s):  
Diagnostic Method ◽  
Open Circuit ◽  
Multilevel Inverters ◽  
On Line

A new structure for multilevel inverters with fault-tolerant capability against open circuit faults

2019 ◽  
Vol 168 ◽  
pp. 105-116 ◽  
Author(s):  
Reza Choupan ◽  
Sajjad Golshannavaz ◽  
Daryoush Nazarpour ◽  
Masoud Barmala
Keyword(s):  
Fault Tolerant ◽  
Open Circuit ◽  
Multilevel Inverters

scholarly journals A Cost Effective Fault Diagnosis Technique for Cascaded H-Bridge Multilevel Inverter

2020 ◽  
Vol 9 (3) ◽  
pp. 196-199
Keyword(s):  
Cost Effective ◽  
Open Circuit ◽  
Multilevel Inverter ◽  
Power Semiconductor ◽  
Multilevel Inverters ◽  
Semiconductor Switches ◽  
Wide Range ◽  
Semiconductor Switch ◽  
Reliable Solution ◽  
Diagnosis Technique

Multilevel Inverters are universally accepted due to their wide range of applications and numerous advantages. In spite of this the reliability of the multilevel inverters are still questionable due to the repeatedly failures of power semiconductor switches. The industries need a cost effective and reliable solution of switch failures, which can be implemented without making major changes in the existing system. If the fault cannot be located within few seconds then fault may cause for multiple switch faults or malfunction of entire system. In this contrast, a cost effective solution to detect open circuit fault of a power semiconductor switch in five level cascaded H-Bridge multilevel inverter has been presented in this paper. The detection method is based on output pole voltage analysis of inverter. The principle of this technique can be implemented on existing system with little modifications. It requires only one voltage sensor per phase, which is already available with the main control system. The output of the multilevel inverter and fault detection results are validate through simulation results.

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