Nanostructure fabrication and characterization on crystal silicon substrates using a laser-assisted scanning tunneling microscope

2007 ◽  
Author(s):  
K. J. Yi ◽  
Z. Y. Yang ◽  
Y. F. Lu
Keyword(s):  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Nanostructure Fabrication ◽  
Crystal Silicon ◽  
Tunneling Microscope ◽  
Fabrication And Characterization

MEASUREMENT OF CRITICAL EXPONENTS OF PLATINUM THIN FILMS

2003 ◽  
Vol 10 (01) ◽  
pp. 1-5 ◽  
Author(s):  
M. C. SALVADORI ◽  
L. L. MELO ◽  
M. CATTANI ◽  
O. R. MONTEIRO ◽  
I. G. BROWN
Keyword(s):  
Thin Films ◽  
Critical Exponents ◽  
Scanning Tunneling Microscope ◽  
Growth Dynamics ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscope ◽  
Metal Plasma ◽  
Ion Deposition

We have fabricated platinum thin films by metal plasma ion deposition on silicon substrates. The roughness of these films has been measured by a scanning tunneling microscope (STM) and we have determined the growth dynamics critical exponents.

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