Nanostructure fabrication using laser field enhancement in the near field of a scanning tunneling microscope tip

1996 ◽  
Vol 68 (6) ◽  
pp. 868-870 ◽  
Author(s):  
J. Jersch ◽  
K. Dickmann
Keyword(s):  
Scanning Tunneling Microscope ◽  
Laser Field ◽  
Near Field ◽  
Field Enhancement ◽  
Scanning Tunneling ◽  
Nanostructure Fabrication ◽  
Tunneling Microscope

A Scanning Tunneling Microscope as a Tunable Nanoantenna for Atomic Scale Control of Optical-Field Enhancement

Nano Letters ◽  
2010 ◽  
Vol 10 (10) ◽  
pp. 3857-3862 ◽  
Author(s):  
Damien Riedel ◽  
Roger Delattre ◽  
Andrey G. Borisov ◽  
Tatiana V. Teperik
Keyword(s):  
Scanning Tunneling Microscope ◽  
Field Enhancement ◽  
Optical Field ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Scale Control

Near-Field Enhanced Photochemistry of Single Molecules in a Scanning Tunneling Microscope Junction

Nano Letters ◽  
2017 ◽  
Vol 18 (1) ◽  
pp. 152-157 ◽  
Author(s):  
Hannes Böckmann ◽  
Sylwester Gawinkowski ◽  
Jacek Waluk ◽  
Markus B. Raschke ◽  
Martin Wolf ◽  
...  
Keyword(s):  
Scanning Tunneling Microscope ◽  
Near Field ◽  
Single Molecules ◽  
Scanning Tunneling ◽  
Tunneling Microscope

scholarly journals Near-Field Manipulation in a Scanning Tunneling Microscope Junction with Plasmonic Fabry-Pérot Tips

Nano Letters ◽  
2019 ◽  
Vol 19 (6) ◽  
pp. 3597-3602 ◽  
Author(s):  
Hannes Böckmann ◽  
Shuyi Liu ◽  
Melanie Müller ◽  
Adnan Hammud ◽  
Martin Wolf ◽  
...  
Keyword(s):  
Scanning Tunneling Microscope ◽  
Near Field ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Fabry Perot ◽  
Field Manipulation

Scanning probe microscopy: A new technology takes off

1990 ◽  
Vol 48 (3) ◽  
pp. 959-959
Author(s):  
Virgil Elings
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Tunneling Microscope ◽  
New Technology ◽  
Near Field ◽  
Three Dimensional ◽  
Scanning Tunneling ◽  
Thin Sample ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Electron Microscopes

With the expanding use of the scanning tunneling microscope, the technology is developing into other scanning near field microscopes, microscopes whose resolution is determined by the size of the probe, not by some wavelength. The first available “son of STM” will be the atomic force microscope (AFM), a very low force profilometer which has atomic resolution and can profile non-conducting surfaces. The hope is that this microscope may find more applications in biology than the scanning tunneling microscope (STM), which requires a conducting or very thin sample.In the past five years, the STM has progressed from curiosity to everyday lab tool, imaging surfaces with scans from a few nanometers up to 100 microns. When compared to an SEM, the STM has the advantages of higher resolution, lower cost, operation in air or liquid, real three-dimensional output, and small size. The disadvantages are smaller scan size, slower scan speeds, fewer spectroscopic functions and, of course, not as many of the nice features of the more mature electron microscopes. The AFM has similar features to the STM except that the detector and profiling tips are more complicated and more difficult to operate—disadvantages that will decrease with time.

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