scholarly journals Scanning electron microscope comparative surface evaluation of glazed-lithium disilicate ceramics under different irradiation settings of Nd:YAG and Er:YAG lasers

2017 ◽  
Vol 88 (1) ◽  
pp. 75-81 ◽  
Author(s):  
Josko Viskic ◽  
Drazen Jokic ◽  
Suzana Jakovljevic ◽  
Lana Bergman ◽  
Sladana Milardovic Ortolan ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Laser Energy ◽  
Lithium Disilicate ◽  
Surface Roughening ◽  
Dental Ceramics ◽  
Treated Sample ◽  
Power Setting ◽  
Dental Lasers ◽  
Scanning Electron

ABSTRACT Objective: To evaluate the surface of glazed lithium disilicate dental ceramics after irradiation under different irradiation settings of Nd:YAG and Er:YAG lasers using a scanning electron microscope (SEM). Materials and Methods: Three glazed-press lithium disilicate ceramic discs were treated with HF, Er:YAG, and Nd:YAG, respectively. The laser-setting variables tested were laser mode, repetition rate (Hz), power (W), time of exposure (seconds), and laser energy (mJ). Sixteen different variable settings were tested for each laser type, and all the samples were analyzed by SEM at 500× and 1000× magnification. Results: Surface analysis of the HF-treated sample showed a typical surface texture with a homogenously rough pattern and exposed ceramic crystals. Er:YAG showed no effect on the surface under any irradiation setting. The surface of Nd:YAG-irradiated samples showed cracking, melting, and resolidifying of the ceramic glaze. These changes became more pronounced as the power increased. At the highest power setting (2.25 W), craters on the surface with large areas of melted or resolidified glaze surrounded by globules were visible. However, there was little to no exposure of ceramic crystals or visible regular surface roughening. Conclusions: Neither Er:YAG nor Nd:YAG dental lasers exhibited adequate surface modification for bonding of orthodontic brackets on glazed lithium disilicate ceramics compared with the control treated with 9.5% HF.

Submicron surface roughening of aliphatic polyamide 6,6 fabric through low temperature plasma and its effect on interfacial bonding in rubber composite

2017 ◽  
Vol 47 (8) ◽  
pp. 2029-2049 ◽  
Author(s):  
Siddhan Periyasamy ◽  
Krishna Prasad G ◽  
Raja ASM ◽  
Prashant G Patil
Keyword(s):  
Surface Roughness ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Plasma Treatment ◽  
Treatment Time ◽  
Surface Roughening ◽  
Temperature Plasma ◽  
Nylon 6,6 ◽  
Rubber Composite ◽  
Scanning Electron

The present study aims to produce submicron surface roughening of aliphatic polyamide 6,6 (nylon 6,6) fabric using dielectric barrier discharge-based atmospheric low temperature plasma for improving the adhesion bonding with rubber. The plasma treatment was done in the time ranging from 15 s to 300 s. Formation of surface roughness on the fabric due to plasma treatment and the associated chemical changes were studied through high-resolution scanning electron microscope, geometrical surface roughness by Kawabata evaluation system surface tester, contact angle measurements and Fourier transform infrared in Attenuated total reflectance mode. Scanning electron microscope micrographs revealed the presence of submicron roughness on the nylon 6,6 fibre surface with pores of around 100 nm (0.1 µm) for the optimum treatment time of 180 s above which the pore merging effect dominated resulting in the net low surface roughness. Geometrical roughness (SMD) results were also well in agreement with the scanning electron microscope results for the roughening and the optimum effect of the plasma treatment. The control and plasma treated nylon 6,6 samples were used as reinforcements for rubber composite. The peel strength of the rubber composite, which is a measure of interfacial bonding, increased to 150% as the maximum for the optimum plasma treatment time of 180 s. Intense rubber deposits over the 180 s plasma treated samples were observed while only a few deposits of rubber were observed on the control fabric when their interfaces were examined through scanning electron microscope after peeling test.

The Surface Deformation of Aluminum Compressed With Viscous Lubricants

1974 ◽  
Vol 96 (4) ◽  
pp. 591-594 ◽  
Author(s):  
D. D. Ratnagar ◽  
H. S. Cheng ◽  
J. A. Schey
Keyword(s):  
Aluminum Alloy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Surface Finish ◽  
Surface Deformation ◽  
Surface Roughening ◽  
6061 Aluminum Alloy ◽  
Clear Delineation ◽  
Lubricant Viscosity ◽  
Scanning Electron

The influences of lubricant viscosity and loading velocity on the surface finish of plastically compressed 6061 aluminum alloy cylinders were studied. Specimens with polished end faces were subjected to compression between two flat, chromium plated dies, with lubricants of a viscosity ranging from 42 cp to 1207 cp at 38 deg C. The deformed surfaces were studied under a scanning electron microscope and by stylus tracings and CLA readings. With the lighter lubricants surface roughening resulted from preferential yielding leading to a clear delineation of grain boundaries and slip lines. With the heavier lubricants, localized “hydrodynamic pockets” formed in addition to the above features. The depth of pockets increased with viscosity and/or velocity.

scholarly journals The effect of MgTiO3Adding on Inclusion Characteristics

2019 ◽  
Vol 38 (2019) ◽  
pp. 576-581
Author(s):  
Xu Chen ◽  
Zhang Mingya ◽  
Li Jianli ◽  
Ran Songlin ◽  
Shan Mengwei ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Molten Steel ◽  
Thermodynamic Calculation ◽  
Energy Dispersive Spectrometer ◽  
Energy Dispersive ◽  
Treated Sample ◽  
Scanning Electron

AbstractMgTiO3 powder was directly added into molten steel at 1873K, and its effect on inclusion characteristics was studied by a scanning electron microscope and an energy dispersive spectrometer. Thermodynamic calculation indicates that MgTiO3 is unstable in molten steel and may decompose into [Ti], [O] and MgO. However, only Ti-bearing inclusions were observed in the treated sample, and Mg-bearing inclusions were absent. This can be explained by the features of wettability and stability for MgO. Compared with a Non-treated sample, both oxide and coarse MnS in treated sample were refined. For the oxide, this originates from the formation of Ti-bearing inclusion. For coarse MnS, this may be due to the fact that Ti can aggravate S segregation. Besides, this aggravation makes coarse MnS less globular. After etching, it was found that in the treated sample, Ti-bearing inclusion can induce the nucleation of intragranular acicular ferrites. This appearance was totally different from that of Non-treated sample, and indicates the effectiveness of external adding method in oxide metallurgy.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

Sign in / Sign up

Export Citation Format

Share Document