High Precision Measurement of Obsidian Hydration Layers on Artifacts from the Hopewell Site Using Secondary Ion Mass Spectrometry

2004 ◽  
Vol 69 (3) ◽  
pp. 555-567 ◽  
Author(s):  
Christopher M. Stevenson ◽  
Ihab Abdelrehim ◽  
Steven W. Novak
Keyword(s):  
Mass Spectrometry ◽  
High Precision ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Layer Depth ◽  
High Precision Measurement ◽  
Long Distance ◽  
Ion Mass Spectrometry ◽  
Hydration Layers ◽  
Secondary Ion

Obsidian hydration dating has served as one of the chronological indicators for the Hopewell Culture earthworks (ca. 200 B.C.—A.D. 500) in central Ohio. This work presents new obsidian hydration dates developed from high precision hydration layer depth profiling using secondary ion mass spectrometry (SIMS). These data suggest that long-distance exchange in obsidian occurred throughout the Hopewell period.

Round-robin test for the measurement of layer thickness of multilayer films by secondary ion mass spectrometry depth profiling

2017 ◽  
Vol 49 (11) ◽  
pp. 1057-1063 ◽  
Author(s):  
Kyung Joong Kim ◽  
Jong Shik Jang ◽  
Joe Bennett ◽  
David Simons ◽  
Mario Barozzi ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Layer Thickness ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Multilayer Films ◽  
Round Robin ◽  
Round Robin Test ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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