Correlative Light- and Scanning Electron Microscope Studies on the Developmental Morphology of Hesperomyces virescens

Mycologia ◽  
1996 ◽  
Vol 88 (5) ◽  
pp. 677 ◽  
Author(s):  
Alex Weir ◽  
G. W. Beakes
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Developmental Morphology ◽  
Scanning Electron

Comparative morphology of Cladopus (including Torrenticola, Podostemaceae) from East Asia to north-eastern Australia

2002 ◽  
Vol 50 (6) ◽  
pp. 725 ◽  
Author(s):  
Rolf Rutishauser ◽  
Evelin Pfeifer
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
East Asia ◽  
Lateral Roots ◽  
Comparative Morphology ◽  
Developmental Morphology ◽  
Eastern Australia ◽  
North Eastern ◽  
Scanning Electron

Cladopus (with 12 or less species) is an Asian and Australian genus of Podostemaceae–Podostemoideae. They are haptophytes that grow in rivers. The developmental morphology and anatomy of Cladopus austro-osumiensis Y.Kadono & N.Usui, C. austrosatsumensis Koidzumi, C. chinensis Chao, C. japonicus Imamura and C. queenslandicus [Domin] C.D.K. Cook & Rutish. (syn. Torrenticola queenslandica [Domin] Domin ex Steenis) are studied by scanning electron microscope and microtome. The architecture of the examined species fits with the bauplan known from other Asian Podostemoideae. Rosulate shoots arise in zigzag patterns or as opposite pairs from narrow or broad green ribbons which may be interpreted as adhesive creeping roots. Cladopus is the only podostemaceous genus known with both endogenous and exogenous lateral roots along the mother root. Exogenous lobes (which may develop into daughter roots) are next to the sites of root-borne shoots which, finally, give rise to terminal flowers. Cladopus species have the following features (synapomorphies) in common: (1) leaves on older and reproductive shoots with one or two median, long filaments (caducous) and 1–4 lateral short lobes (persistent) on either side of the leaf, which are called stipules; (2) spathella (i.e. mantle-like flower cover) with an apical two-tipped papilla; (3) spathella splitting more or less circumscissilely; (4) capsules globose or nearly so, smooth or with three faint ribs per valve.

Morphology of the outer integument in three primitive angiosperm families

1995 ◽  
Vol 73 (8) ◽  
pp. 1242-1249 ◽  
Author(s):  
Ryoko Imaichi ◽  
Masahiro Kato ◽  
Hiroshi Okada
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Outer Integument ◽  
Developmental Morphology ◽  
Primitive Angiosperms ◽  
Primitive State ◽  
Scanning Electron ◽  
Cananga Odorata

Scanning electron microscope examinations were performed to characterize the developmental morphology of the outer integument in several species of the three families Annonaceae (Cananga odorata var. fruticosa, Goniothalamus macrophyllus, and Stelechocarpus burahol), Eupomatiaceae (Eupomatia laurina), and Winteraceae (four Tasmannia species). In all species examined, the inner integument arises as an annular ring, but the outer integument initiates as a semiannular outgrowth interrupted on the concave side of the funiculus; the outer integument then becomes hood-shaped. The inner integument overtops the outer one at maturity, and the micropyle consists only of an endostome. Data from the present and previous studies support the hypothesis that the outer integument is hood-shaped in magnolialean angiosperms and that the bilaterally symmetrical, bladelike outer integument is homologous with the ovuliferous sporophyll of the glossopterids. The micropyle consisting of an endostome might be in a primitive state, compared with a bistomic one. Key words: developmental morphology, integument, micropyle, phylogenesis, primitive angiosperms, scanning electron microscopy.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

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