scholarly journals Size Effect in Cleavage Cracking in Polycrystalline Thin Films

2007 ◽  
Author(s):  
Yu Qiao
Keyword(s):  
Thin Films ◽  
Size Effect ◽  
Polycrystalline Thin Films ◽  
Cleavage Cracking

Electron diffraction studies of amorphous and polycrystalline thin films

1990 ◽  
Vol 48 (4) ◽  
pp. 118-119
Author(s):  
D J H Cockayne ◽  
D R McKenzie
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Polycrystalline Materials ◽  
Good Resolution ◽  
Scattered Intensity ◽  
Radial Density ◽  
X Ray ◽  
Polycrystalline Thin Films ◽  
Nitrogen Ion ◽  
Diffraction Patterns

The study of amorphous and polycrystalline materials by obtaining radial density functions G(r) from X-ray or neutron diffraction patterns is a well-developed technique. We have developed a method for carrying out the same technique using electron diffraction in a standard TEM. It has the advantage that studies can be made of thin films, and on regions of specimen too small for X-ray and neutron studies. As well, it can be used to obtain nearest neighbour distances and coordination numbers from the same region of specimen from which HREM, EDS and EELS data is obtained.The reduction of the scattered intensity I(s) (s = 2sinθ/λ ) to the radial density function, G(r), assumes single and elastic scattering. For good resolution in r, data must be collected to high s. Previous work in this field includes pioneering experiments by Grigson and by Graczyk and Moss. In our work, the electron diffraction pattern from an amorphous or polycrystalline thin film is scanned across the entrance aperture to a PEELS fitted to a conventional TEM, using a ramp applied to the post specimen scan coils. The elastically scattered intensity I(s) is obtained by selecting the elastically scattered electrons with the PEELS, and collecting directly into the MCA. Figure 1 shows examples of I(s) collected from two thin ZrN films, one polycrystalline and one amorphous, prepared by evaporation while under nitrogen ion bombardment.

Electrical and photoelectrical characterization of GaAsxSy polycrystalline thin films

1997 ◽  
Vol 296 (1-2) ◽  
pp. 114-117 ◽  
Author(s):  
O. Pesty ◽  
P. Canet ◽  
F. Lalande ◽  
H. Carchano ◽  
D. Lollman
Keyword(s):  
Thin Films ◽  
Polycrystalline Thin Films

Transport mechanisms in Co-doped ZnO (ZCO) and H-irradiated ZCO polycrystalline thin films

2021 ◽  
Vol 23 (3) ◽  
pp. 2368-2376
Author(s):  
A. Di Trolio ◽  
A. Amore Bonapasta ◽  
C. Barone ◽  
A. Leo ◽  
G. Carapella ◽  
...  
Keyword(s):  
Thin Films ◽  
Opposite Effect ◽  
Transport Mechanisms ◽  
Co Doping ◽  
Polycrystalline Thin Films ◽  
Doped Zno ◽  
Co Doped

Co doping increases the ZnO resistivity (ρ) at high T (HT), whereas it has an opposite effect at low T (LT). H balances the Co effects by neutralizing the ρ increase at HT and strengthening its decrease at LT.

The electrical, optical properties of AlSb polycrystalline thin films deposited by magnetron co-sputtering without annealing

2010 ◽  
Vol 19 (12) ◽  
pp. 127204 ◽  
Author(s):  
Zheng Huang ◽  
Li-Li Wu ◽  
Bing Li ◽  
Xia Hao ◽  
Jian-Xiong He ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Polycrystalline Thin Films

Enhancement of Nonlinear Absorption in Defect Controlled ZnO Polycrystalline Thin Films by Means of Co‐Doping

2021 ◽  
pp. 2000539
Author(s):  
Bekir Asilcan Ünlü ◽  
Deniz Sener ◽  
Sezen Tekin ◽  
Elif Akhuseyin Yildiz ◽  
Ahmet Karatay ◽  
...  
Keyword(s):  
Thin Films ◽  
Nonlinear Absorption ◽  
Co Doping ◽  
Polycrystalline Thin Films

Reactively sputtered indium tin oxide polycrystalline thin films as NO and NO2 gas sensors

1990 ◽  
Vol 186 (2) ◽  
pp. 349-360 ◽  
Author(s):  
G. Sberveglieri ◽  
P. Benussi ◽  
G. Coccoli ◽  
S. Groppelli ◽  
P. Nelli
Keyword(s):  
Thin Films ◽  
Gas Sensors ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Polycrystalline Thin Films ◽  
No2 Gas Sensors
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