scholarly journals Progress in automatic image measurement. [For optical measurement of precision part dimensions]

1976 ◽  
Author(s):  
J. Lembke
Keyword(s):  
Optical Measurement ◽  
Image Measurement ◽  
Precision Part

A Three-dimensional Camera: Development and Applications of a Three-dimensional Image Measurement System

2011 ◽  
Vol 131 (2) ◽  
pp. 320-328 ◽  
Author(s):  
Cunwei Lu ◽  
Hiroya Kamitomo ◽  
Ke Sun ◽  
Kazuhiro Tsujino ◽  
Genki Cho
Keyword(s):  
Measurement System ◽  
Three Dimensional ◽  
Image Measurement ◽  
Dimensional Image

Optical Measurement of the Electric Field Strength in a Gel Insulator

2016 ◽  
Vol 136 (10) ◽  
pp. 1420-1421
Author(s):  
Yusuke Tanaka ◽  
Yuji Nagaoka ◽  
Hyeon-Gu Jeon ◽  
Masaharu Fujii ◽  
Haruo Ihori
Keyword(s):  
Field Strength ◽  
Electric Field ◽  
Electric Field Strength ◽  
Optical Measurement

Characterization of the Initial Stage of Discharges between Micro-gap in Liquid using Optical Measurement

2010 ◽  
Vol 130 (4) ◽  
pp. 313-318
Author(s):  
Makoto Kanemaru ◽  
Shohei Sorimachi ◽  
Shinji Ibuka ◽  
Shozo Ishii
Keyword(s):  
Optical Measurement ◽  
Initial Stage

CIE 235:2019 Optical Measurement of LED Modules and Light Engines

2019 ◽  
Author(s):  
R. Distl ◽  
J. Schütte ◽  
G. Sauter ◽  
T. Bergen ◽  
T. Goodman ◽  
...  
Keyword(s):  
Optical Measurement

Image Measurement of Electrolyte Volatilized Phenomenon in MCFC

2005 ◽  
Vol 25 (Supplement1) ◽  
pp. 35-38
Author(s):  
Tadakatsu YODO ◽  
Hideaki OKAWA ◽  
Makoto YAMAUCHI ◽  
Kimihiko SUGIURA ◽  
Kazumi TANIMOTO
Keyword(s):  
Image Measurement

scholarly journals Nano-imprinted subwavelength gratings as polarizing beamsplitters

2021 ◽  
Vol 17 (1) ◽  
Author(s):  
Julian Wüster ◽  
Yannick Bourgin ◽  
Patrick Feßer ◽  
Arne Behrens ◽  
Stefan Sinzinger
Keyword(s):  
Nanoimprint Lithography ◽  
Optical Measurement ◽  
Design Method ◽  
Optical Systems ◽  
Surface Metrology ◽  
Measurement Systems ◽  
Common Path ◽  
Dielectric Coatings ◽  
Subwavelength Gratings ◽  
Wide Range

AbstractPolarizing beamsplitters have numerous applications in optical systems, such as systems for freeform surface metrology. They are classically manufactured from birefringent materials or with stacks of dielectric coatings. We present a binary subwavelength-structured form-birefringent diffraction grating, which acts as a polarizing beamsplitter for a wide range of incidence angles −30∘…+30∘. We refine the general design method for such hybrid gratings. We furthermore demonstrate the manufacturing steps with Soft-UV-Nanoimprint-Lithography, as well as the experimental verification, that the structure reliably acts as a polarizing beamsplitter. The experimental results show a contrast in efficiency for TE- and TM-polarization of up to 1:18 in the first order, and 34:1 in the zeroth order. The grating potentially enables us to realize integrated compact optical measurement systems, such as common-path interferometers.

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