scholarly journals High-resolution bent-crystal spectrometer for the ultra-soft x-ray region

1988 ◽  
Author(s):  
P. Beiersdorfer ◽  
S. von Goeler ◽  
M. Bitter ◽  
K.W. Hill ◽  
R.A. Hulse ◽  
...  
2009 ◽  
Vol 16 (2) ◽  
pp. 283-292 ◽  
Author(s):  
Jean-Louis Hazemann ◽  
Olivier Proux ◽  
Vivian Nassif ◽  
Hervé Palancher ◽  
Eric Lahera ◽  
...  

A bent-crystal spectrometer based on the Rowland circle geometry has been installed and tested on the BM30b/FAME beamline at the European Synchrotron Radiation Facility to improve its performances. The energy resolution of the spectrometer allows different kinds of measurements to be performed, including X-ray absorption spectroscopy, resonant inelastic X-ray scattering and X-ray Raman scattering experiments. The simplicity of the experimental device makes it easily implemented on a classical X-ray absorption beamline. This improvement in the fluorescence detection is of particular importance when the probed element is embedded in a complex and/or heavy matrix, for example in environmental sciences.


1981 ◽  
Vol 244 ◽  
pp. L141 ◽  
Author(s):  
J. L. Culhane ◽  
C. G. Rapley ◽  
R. D. Bentley ◽  
A. H. Gabriel ◽  
K. J. Phillips ◽  
...  

1989 ◽  
Vol 60 (5) ◽  
pp. 895-906 ◽  
Author(s):  
P. Beiersdorfer ◽  
S. von Goeler ◽  
M. Bitter ◽  
K. W. Hill ◽  
R. A. Hulse ◽  
...  

2009 ◽  
Vol 36 (1) ◽  
pp. 115-118
Author(s):  
王洪建 Wang Hongjian ◽  
肖沙里 Xiao Shali ◽  
施军 Shi Jun ◽  
黄显宾 Huang Xianbin ◽  
杨礼兵 Yang Libing ◽  
...  

1992 ◽  
Vol 63 (10) ◽  
pp. 5022-5022
Author(s):  
R. Barnsley ◽  
A. Abbey ◽  
J. Dunn ◽  
S. Lea ◽  
N. J. Peacock

2014 ◽  
Vol 21 (4) ◽  
pp. 762-767 ◽  
Author(s):  
Ari-Pekka Honkanen ◽  
Roberto Verbeni ◽  
Laura Simonelli ◽  
Marco Moretti Sala ◽  
Ali Al-Zein ◽  
...  

Wavelength-dispersive high-resolution X-ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanenet al.(2014).J. Synchrotron Rad.21, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved analyser crystal was presented. Here the theory is applied to compensate for the corresponding decrease of the energy resolution. The technique is demonstrated with a Johann-type spectrometer using a spherically bent Si(660) analyser in near-backscattering geometry, where an improvement in the energy resolution from 1.0 eV down to 0.5 eV at 9.7 keV incident photon energy was observed.


2001 ◽  
Vol 72 (6) ◽  
pp. 2566-2574 ◽  
Author(s):  
J. Weinheimer ◽  
I. Ahmad ◽  
O. Herzog ◽  
H.-J. Kunze ◽  
G. Bertschinger ◽  
...  

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