scholarly journals High-resolution x-ray crystal spectrometer/polarimeter at torus experiment for technology oriented research-94

2001 ◽  
Vol 72 (6) ◽  
pp. 2566-2574 ◽  
Author(s):  
J. Weinheimer ◽  
I. Ahmad ◽  
O. Herzog ◽  
H.-J. Kunze ◽  
G. Bertschinger ◽  
...  
Keyword(s):  
High Resolution ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Oriented Research

General purpose high‐resolution x‐ray crystal spectrometer (abstract)

1992 ◽  
Vol 63 (10) ◽  
pp. 5022-5022
Author(s):  
R. Barnsley ◽  
A. Abbey ◽  
J. Dunn ◽  
S. Lea ◽  
N. J. Peacock
Keyword(s):  
High Resolution ◽  
General Purpose ◽  
Crystal Spectrometer ◽  
X Ray

HIGH RESOLUTION L X-RAY EMISSION SPECTRA OF Fe AND Cu INDUCED BY O.75 MeV/u ION IMPACT

1995 ◽  
Vol 05 (02n03) ◽  
pp. 203-209 ◽  
Author(s):  
H. KAGEYAMA ◽  
R. TAKAHASHI ◽  
D. HAMAGUCHI ◽  
T. AWATA ◽  
T. NAKAE ◽  
...  
Keyword(s):  
High Resolution ◽  
Lower Energy ◽  
Emission Spectra ◽  
Crystal Spectrometer ◽  
Transition Energies ◽  
X Ray ◽  
The Difference ◽  
Ion Impact ◽  
Electron Vacancy ◽  
Good Agreement

High resolution L x-ray emission spectra of Fe and Cu have been measured by 0.75 MeV/u H and He, and 0.73 MeV/u He, Si and Ar ion impacts with a crystal spectrometer. The x-ray transition energies in the Fe and Cu targets for Lι, Lη, Lα1,2, Lβ1 and Lβ3,4 diagram lines induced by light ion impacts are determined, which are in good agreement with those given in the reference. The difference in L x-ray emission spectra produced by H, He, Si and Ar ions is considered and the emission spectra for the Cu target are compared with the calculated ones based on the multiconfiguration Dirac-Fock method. The origin of the broadening of the Lα1,2 line to the lower energy for Si and Ar ion impacts is attributed to one 2p plus one 3d electron vacancy production.

Versatile high resolution crystal spectrometer with x-ray charge coupled device detector

2003 ◽  
Vol 74 (4) ◽  
pp. 2388-2408 ◽  
Author(s):  
R. Barnsley ◽  
N. J. Peacock ◽  
J. Dunn ◽  
I. M. Melnick ◽  
I. H. Coffey ◽  
...  
Keyword(s):  
High Resolution ◽  
Crystal Spectrometer ◽  
Charge Coupled Device ◽  
X Ray

HIGH RESOLUTION PIXE USING CRYSTAL SPECTROMETER COMBINED WITH POSITION SENSITIVE DETECTORS

1996 ◽  
Vol 06 (01n02) ◽  
pp. 97-116 ◽  
Author(s):  
KUNIKO MAEDA ◽  
HIROMI HAMANAKA ◽  
KEN-ICHI HASEGAWA
Keyword(s):  
High Resolution ◽  
Elemental Analysis ◽  
Chemical State ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
State Analysis

We describe characteristics of high-resolution, wavelength-dispersive crystal spectrometers equipped with a different type of position sensitive X-ray detectors: PSPC, CCD, IP and MCP. Utilities of these position sensitive spectrometers in PIXE experiments are demonstrated by referring several recent topics of elemental analysis, chemical state analysis and a study on sample charging.

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