scholarly journals Surface roughening, columnar growth and intrinsic stress formation in amorphous CuTi films

1997 ◽  
Author(s):  
U.V. Huelsen ◽  
U. Geyer ◽  
P. Thiyagarajan
1996 ◽  
Vol 441 ◽  
Author(s):  
U. v. Hulsen ◽  
P. Thiyagarajan ◽  
U. Geyer

AbstractThe growth of amorphous CuTi films, prepared by electron beam evaporation, is investigated by Scanning Tunneling Microscopy (STM), Small Angle Neutron Scattering (SANS) and in situ measurements of intrinsic mechanical stresses (ISM). In early growth stages the films develop compressive stresses and, with increasing film thickness, a crossover to tensile stresses. In the same thickness range the STM investigations show a change in the growth mode. Our experiments suggest a transition from planar growth with statistical surface roughening to columnar growth.


1997 ◽  
Vol 70 (13) ◽  
pp. 1691-1693 ◽  
Author(s):  
U. Geyer ◽  
U. von Hülsen ◽  
P. Thiyagarajan

Author(s):  
A.C. Leger ◽  
A. Grimaud ◽  
P. Fauchais ◽  
G. Delluc

Abstract A system, developed in the laboratory, allows to record in situ the deformation of a flat beam with a displacement sensor and so to analyse stress formation during spraying and upon cooling with fixed or rotating substrates. The beam is fixed onto a pair of knife edges by springs. The knife edges are disposed on a water-cooled rotating cylindrical substrate holder and the beam substrate (2 x 15 x 100 mm3) is parallel to the holder axis. The torch is moved back and forth parallel to the holder axis and the beam temperature is recorded by a thermocouple spot welded to it and also by an IR pyrometer. The influence of beam temperature for a given torch/substrate velocity on the residual stresses is studied for alumina and zirconia coatings. With fixed substrates a sharp increase of the residual stresses related to coating microstructure exists for a transition temperature around 600°C. It seems to correspond to a columnar growth throughout the layered splats. The effect of the torch to substrate velocity and so the pass thickness is studied too.


1995 ◽  
Vol 507 (7) ◽  
pp. 623-633 ◽  
Author(s):  
S. Dina ◽  
U. Geyer ◽  
G. v. Minnigerode

1987 ◽  
Vol 48 (6) ◽  
pp. 1017-1028 ◽  
Author(s):  
F. Fabre ◽  
D. Gorse ◽  
B. Salanon ◽  
J. Lapujoulade
Keyword(s):  

Author(s):  
T. Schaffus ◽  
H. Pfaff ◽  
P. Albert ◽  
M. Schaffus ◽  
F. Kroninger ◽  
...  

Abstract The given project is to benchmark typical preparation methods under the aspect of the influence of initial intrinsic stresses inside electric components. Raman spectroscopy has been applied as well as the piezo resistive readout on a specifically designed model stress monitoring chip.


2020 ◽  
Vol 63 (1) ◽  
pp. 70-76
Author(s):  
A. S. Zemisov ◽  
N. N. Saveleva ◽  
A. N. Yushkov ◽  
V. V. Chivilev ◽  
N. V. Borzykh

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