scholarly journals Safety Analysis and Review System for coal utilization technology development

1980 ◽  
Author(s):  
J. H. Capps ◽  
J. D. Pearson
Keyword(s):  
Technology Development ◽  
Safety Analysis ◽  
Review System

scholarly journals Developing an Open, Networked Peer Review System

2015 ◽  
Vol 6 (2) ◽  
Author(s):  
Nina Belojevic
Keyword(s):  
Best Practices ◽  
Peer Review ◽  
Digital Humanities ◽  
Technology Development ◽  
Agile Development ◽  
Peer Review System ◽  
Review System

Using the Personas for Open, Networked Peer Review project as a case study, this paper discusses how best practices from creative technology-development contexts, such as agile development, can be applied in digital humanities projects.

Some applications of electron beam microanalysis techniques in VLSI process evaluation

1983 ◽  
Vol 41 ◽  
pp. 160-161
Author(s):  
Simon Thomas
Keyword(s):  
Integrated Circuits ◽  
Process Evaluation ◽  
Large Scale ◽  
Technology Development ◽  
Analytical Techniques ◽  
Successful Implementation ◽  
Analysis Of Failures ◽  
Characterization Of Materials ◽  
Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

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