scholarly journals Superconducting Detector System for High-Resolution Energy-Dispersive Soft X-Ray Spectroscopy

2001 ◽  
Author(s):  
S Friedrich ◽  
T Niedermayr ◽  
O Drury ◽  
T Funk ◽  
M Frank ◽  
...  
Keyword(s):  
High Resolution ◽  
Detector System ◽  
Energy Dispersive ◽  
Superconducting Detector ◽  
X Ray

Influence of Interfacial Copper on the Ti-SiO2 Reaction During Nitridation of Cu-Ti Films

1995 ◽  
Vol 398 ◽  
Author(s):  
Daniel Adams ◽  
T.L. Alford ◽  
N.D. Theodore ◽  
T. Laursen ◽  
S.W. Russell ◽  
...  
Keyword(s):  
Free Surface ◽  
High Resolution ◽  
Consumption Rate ◽  
Catalytic Effect ◽  
Energy Dispersive ◽  
Ti Alloy ◽  
Alloy Films ◽  
X Ray ◽  
20 Nm ◽  
Ti Films

ABSTRACTCu(90 nm)/Ti(20 nm) bilayers and Cu(Ti 27 at.%) alloy films were deposited on SiO2 and annealed in an NH3 ambient at temperatures 400–700° C for 30 min. During annealing Ti segregated to both the free surface and the alloy/SiO2 interface. At the surface Ti reacted with NH3 to form TiN, whereas at the interface the Ti reacted with the SiO2 to form a TiO/Ti5Si3 structure. High resolution energy dispersive x-ray analysis revealed the presence of interfacial Cu between the Ti-silicide and Ti-oxide layers at temperatures greater than 450°C. Using Cu-Ti alloy films enhanced the Si02 consumption rate by a factor of 3-4 compared to that of pure Ti. It is suggested that the interfacial Cu is responsible for the increased rate. It is plausible that an interfacial Cu2O component has a catalytic effect on the Ti- SiO2 reaction.

WE-C-L100J-04: The Solid State X-Ray Image Intensifier (SSXII): A Next-Generation High-Resolution Fluoroscopic Detector System

2007 ◽  
Vol 34 (6Part20) ◽  
pp. 2585-2585
Author(s):  
S Rudin ◽  
A Kuhls ◽  
C Keleshis ◽  
D Kim ◽  
G Yadava ◽  
...  
Keyword(s):  
Solid State ◽  
High Resolution ◽  
Image Intensifier ◽  
Detector System ◽  
Next Generation ◽  
X Ray

Cryogenic microcalorimeters for high-resolution energy-dispersive x-ray spectrometry

1999 ◽  
Author(s):  
Godehard Angloher ◽  
Michael Altmann ◽  
Matthias Buehler ◽  
Franz von Feilitzsch ◽  
Theo Hertrich ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Dispersive ◽  
X Ray

Cryogenic microcalorimeters and tunnel junctions for high-resolution energy dispersive x-ray spectrometry

1999 ◽  
Author(s):  
Jens Hoehne ◽  
Michael Altmann ◽  
Godehard Angloher ◽  
Matthias Buehler ◽  
Franz v. Feilitzsch ◽  
...  
Keyword(s):  
High Resolution ◽  
Tunnel Junctions ◽  
Energy Dispersive ◽  
X Ray

Design of 2D-nanocrystals in water: preparation, structure and functionalization

2018 ◽  
Vol 90 (5) ◽  
pp. 833-844
Author(s):  
Leonid Aslanov ◽  
Valery Zakharov ◽  
Ksenia Paseshnichenko ◽  
Aleksandr Yatsenko ◽  
Andrey Orekhov ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Chemical Composition ◽  
High Resolution ◽  
Electron Diffraction ◽  
Single Crystal ◽  
Room Temperature ◽  
Energy Dispersive ◽  
X Ray ◽  
Transmission Electron

AbstractA new method for synthesis of 2D nanocrystals in water was proposed. The use of perfluorothiophenolate ions as surfactant allowed us to produce 2D single-crystal nanosheets of CaS at pH=9 and flat nanocrystals of PbS at pH=9 at room temperature. Mesocrystalline nanobelts of CdS and mesocrystals of PbS were obtained at pH=3–5 and pH=10–12, respectively. Morphology, structure and chemical composition of nanoparticles were characterized by high-resolution transmission electron microscopy, electron diffraction and energy dispersive X-ray spectroscopy. A mechanism of nanoparticles formation was discussed.

The On-Stream X-Ray Analysis of Slurries for Process Control

1991 ◽  
Vol 35 (A) ◽  
pp. 661-672
Author(s):  
Johann P. Engelbrecht ◽  
Johan P.R. de Villiers ◽  
Stefan W. de Bruyn
Keyword(s):  
Process Control ◽  
Base Metal ◽  
Pyrolytic Graphite ◽  
Xrd Analysis ◽  
Detector System ◽  
Energy Dispersive ◽  
Heavy Minerals ◽  
Handling System ◽  
X Ray

AbstractAn integrated XRD-XRF system for the on-stream analysis of slurries was configured to the requirements of industry for process control. The slurry-handling system includes a multiplexer, header tank, de-aerator and a windowless sample presenter. The XRD part of the system is composed of a molybdenum anode X-ray tube, a pyrolytic graphite primarybeam monochromator, a vertical fixed-geometry goniometer, and a simultaneous detector system. The X-ray beam is transmitted through the slurry curtain so that the diffracted intensities are measured in the forward diffracted mode. The energy-dispersive XRF spectrometer measures the reflected fluorescence intensities. Examples and data from the onstream XRD analysis of fluorspar and apatite are presented. Mention is made of the application of an integrated XRD-XRF system in the heavy-minerals and base-metal industries.

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