Influence of Interfacial Copper on the Ti-SiO2 Reaction During Nitridation of Cu-Ti Films

1995 ◽  
Vol 398 ◽  
Author(s):  
Daniel Adams ◽  
T.L. Alford ◽  
N.D. Theodore ◽  
T. Laursen ◽  
S.W. Russell ◽  
...  
Keyword(s):  
Free Surface ◽  
High Resolution ◽  
Consumption Rate ◽  
Catalytic Effect ◽  
Energy Dispersive ◽  
Ti Alloy ◽  
Alloy Films ◽  
X Ray ◽  
20 Nm ◽  
Ti Films

ABSTRACTCu(90 nm)/Ti(20 nm) bilayers and Cu(Ti 27 at.%) alloy films were deposited on SiO2 and annealed in an NH3 ambient at temperatures 400–700° C for 30 min. During annealing Ti segregated to both the free surface and the alloy/SiO2 interface. At the surface Ti reacted with NH3 to form TiN, whereas at the interface the Ti reacted with the SiO2 to form a TiO/Ti5Si3 structure. High resolution energy dispersive x-ray analysis revealed the presence of interfacial Cu between the Ti-silicide and Ti-oxide layers at temperatures greater than 450°C. Using Cu-Ti alloy films enhanced the Si02 consumption rate by a factor of 3-4 compared to that of pure Ti. It is suggested that the interfacial Cu is responsible for the increased rate. It is plausible that an interfacial Cu2O component has a catalytic effect on the Ti- SiO2 reaction.

Cryogenic microcalorimeters for high-resolution energy-dispersive x-ray spectrometry

1999 ◽  
Author(s):  
Godehard Angloher ◽  
Michael Altmann ◽  
Matthias Buehler ◽  
Franz von Feilitzsch ◽  
Theo Hertrich ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Dispersive ◽  
X Ray

Spectrophotometric Investigation on the Growth Mechanism of a Single Tapered CuO Nanowire

2009 ◽  
Vol 1206 ◽  
Author(s):  
Anindita Chatterjee ◽  
C-Y Huang ◽  
S-B Liu ◽  
S-Y Wu ◽  
Chia-Liang Cheng
Keyword(s):  
Surface Defects ◽  
Green Emission ◽  
Cost Effective ◽  
Blue Shift ◽  
Energy Dispersive ◽  
X Ray ◽  
Cuo Nanowires ◽  
Cuo Nanowire ◽  
Photoluminescence Studies ◽  
20 Nm

AbstractIn this study, well separated tapered CuO nanowires have been synthesized on copper grid using an easy and cost effective thermal oxidation method. A set of spectroscopic investigations have been performed on one single tapered CuO nanowire using Energy Dispersive X-ray, confocal Raman and confocal Photoluminescence spectroscopy to get insight into the mechanism of growth of the nanowires. Energy Dispersive X-ray studies reveal crystallization process of CuO nanowires occur from Cu/Cu2O mixed phase state to pure CuO structure. Raman measurements indicate a little sharpening of the Raman peaks with increasing growth temperature of the nanowires starting from 400°C to 600°C. Photoluminescence studies were carried out by mapping along the length of the nanowire to investigate the growth as well as optical properties of a single tapered CuO nanowire. As the diameter of the single tapered CuO nanowire decreases, the green emission of the nanowire gradually shifts towards the higher energy side. A steady blue shift of 20 nm of the photoluminescence peak has been attributed to the nanosize effect of the tapered nanowire along the length and enhanced surface defects.

Cryogenic microcalorimeters and tunnel junctions for high-resolution energy dispersive x-ray spectrometry

1999 ◽  
Author(s):  
Jens Hoehne ◽  
Michael Altmann ◽  
Godehard Angloher ◽  
Matthias Buehler ◽  
Franz v. Feilitzsch ◽  
...  
Keyword(s):  
High Resolution ◽  
Tunnel Junctions ◽  
Energy Dispersive ◽  
X Ray

Design of 2D-nanocrystals in water: preparation, structure and functionalization

2018 ◽  
Vol 90 (5) ◽  
pp. 833-844
Author(s):  
Leonid Aslanov ◽  
Valery Zakharov ◽  
Ksenia Paseshnichenko ◽  
Aleksandr Yatsenko ◽  
Andrey Orekhov ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Chemical Composition ◽  
High Resolution ◽  
Electron Diffraction ◽  
Single Crystal ◽  
Room Temperature ◽  
Energy Dispersive ◽  
X Ray ◽  
Transmission Electron

AbstractA new method for synthesis of 2D nanocrystals in water was proposed. The use of perfluorothiophenolate ions as surfactant allowed us to produce 2D single-crystal nanosheets of CaS at pH=9 and flat nanocrystals of PbS at pH=9 at room temperature. Mesocrystalline nanobelts of CdS and mesocrystals of PbS were obtained at pH=3–5 and pH=10–12, respectively. Morphology, structure and chemical composition of nanoparticles were characterized by high-resolution transmission electron microscopy, electron diffraction and energy dispersive X-ray spectroscopy. A mechanism of nanoparticles formation was discussed.

High-resolution biological microanalysis in the field-emission STEM

1990 ◽  
Vol 48 (2) ◽  
pp. 154-155
Author(s):  
R.D. Leapman ◽  
S.B. Andrews
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Low Dose ◽  
Dark Field ◽  
X Ray ◽  
Macromolecular Assemblies ◽  
Freeze Dried ◽  
Annular Dark Field ◽  
20 Nm ◽  
Electron Energy Loss

The recent availability of a cryotransfer stage, efficient electron energy loss spectrometers (EELS), and ultrathin window energy-dispersive x-ray spectrometers (EDXS) for the VG Microscopes HB501 field-emission STEM now provides this instrument with the potential for high resolution (<20 nm) biological microanalysis. In practice, limits are normally imposed by the sample itself, due to damage in the electron beam and to changes in structure and composition during freezing, sectioning, transfering and freeze-drying. We have therefore investigated what types of useful high-resolution analytical information can be obtained from rapidly frozen samples, including thin tissue cryosections and frozen isolated macromolecules and macromolecular assemblies.Frozen-hydrated samples were cryotransfered at ~-175C into the VG STEM after which a vacuum of ~3x10-9 mbar was maintained. Samples were freeze-dried by warming to ~-90C over 30 min and were then recooled to below ~-160C to minimize radiation damage and contamination during analysis. Digital annular dark-field images were obtained at low dose (~10 e/Å2) with single electron sensitivity, using a probe current of 2 to10 pA and a beam energy of 100 keV.

scholarly journals New capabilities for `colouring in' the chemistry of crystal defects atom-by-atom

2014 ◽  
Vol 70 (6) ◽  
pp. 521-523
Author(s):  
Sarah J. Haigh
Keyword(s):  
High Resolution ◽  
High Efficiency ◽  
Crystal Defects ◽  
Energy Dispersive ◽  
Acta Cryst ◽  
X Ray ◽  
Elemental Imaging ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Microscopes

The latest generation of scanning transmission electron microscopes equipped with high-efficiency energy-dispersive X-ray detectors are breaking new ground with respect to high-resolution elemental imaging of materials. In this issue, Paulauskaset al.[Acta Cryst.(2014), A70, 524–531] demonstrate impressive results when applying this technique to improve understanding of CdTe dislocation structures.

Performance of High-Resolution SEM/EDX Systems Equipped with Transmission Mode (TSEM) for Imaging and Measurement of Size and Size Distribution of Spherical Nanoparticles

2014 ◽  
Vol 20 (2) ◽  
pp. 602-612 ◽  
Author(s):  
Vasile-Dan Hodoroaba ◽  
Charles Motzkus ◽  
Tatiana Macé ◽  
Sophie Vaslin-Reimann
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Size Distribution ◽  
Colloidal Suspension ◽  
Accurate Determination ◽  
Energy Dispersive ◽  
Transmission Mode ◽  
Advanced Materials ◽  
Large Area ◽  
X Ray

AbstractThe analytical performance of high-resolution scanning electron microscopy/energy dispersive X-ray spectroscopy (SEM/EDX) for accurate determination of the size, size distribution, qualitative elemental analysis of nanoparticles (NPs) was systematically investigated. It is demonstrated how powerful high-resolution SEM is by using both mono- and bi-modal distributions of SiO2 airborne NPs collected on appropriate substrates after their generation from colloidal suspension. The transmission mode of the SEM (TSEM) is systematically employed for NPs prepared on thin film substrates such as transmission electron microscopy grids. Measurements in the transmission mode were performed by using a “single-unit” TSEM transmission setup as manufactured and patented by Zeiss. This alternative to the “conventional” STEM detector consists of a special sample holder that is used in conjunction with the in-place Everhart–Thornley detector. In addition, the EDX capabilities for imaging NPs, highlighting the promising potential with respect to exploitation of the sensitivity of the new large area silicon drift detector energy dispersive X-ray spectrometers were also investigated. The work was carried out in the frame of a large prenormative VAMAS (Versailles Project on Advanced Materials and Standards) project, dedicated to finding appropriate methods and procedures for traceable characterization of NP size and size distribution.

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