scholarly journals Ferrite Measurement in Austenitic and Duplex Stainless Steel Castings - Literature Review

10.2172/14580 ◽  
1999 ◽  
Author(s):  
C.D. Lundin ◽  
G. Zhou ◽  
W. Ruprecht
1985 ◽  
Vol 107 (2) ◽  
pp. 161-165 ◽  
Author(s):  
P. T. Purtscher ◽  
Y. W. Cheng ◽  
P. N. Li

Constant-load-amplitude stage II fatigue crack growth rates at 4 K were measured for duplex stainless steel castings. The results show that at a ΔK of 60 MPa•m1/2, da/dN = 7.6 × 10−4 mm/cycle for an alloy with 1 percent ferrite. For an alloy with 8 percent ferrite, da/dN is 35 percent, and for an alloy with 29 percent ferrite, da/dN is 260 percent greater than for the 1 percent ferrite alloy. However, the exponent in the Paris equation does not change appreciably (less than 18 percent) as the ferrite content changes from 1 to 29 percent.


2009 ◽  
Vol 15 (4) ◽  
pp. 293 ◽  
Author(s):  
J Tiusanen ◽  
K Rissa ◽  
T Ritvonen ◽  
J Lagerbom ◽  
K Keskiaho ◽  
...  

Author(s):  
A. Redjaïmia ◽  
J.P. Morniroli ◽  
G. Metauer ◽  
M. Gantois

2D and especially 3D symmetry information required to determine the crystal structure of four intermetallic phases present as small particles (average size in the range 100-500nm) in a Fe.22Cr.5Ni.3Mo.0.03C duplex stainless steel is not present in most Convergent Beam Electron Diffraction (CBED) patterns. Nevertheless it is possible to deduce many crystal features and to identify unambiguously these four phases by means of microdiffraction patterns obtained with a nearly parallel beam focused on a very small area (50-100nm).From examinations of the whole pattern reduced (RS) and full (FS) symmetries the 7 crystal systems and the 11 Laue classes are distinguished without ambiguity (1). By considering the shifts and the periodicity differences between the ZOLZ and FOLZ reflection nets on specific Zone Axis Patterns (ZAP) which depend on the crystal system, the centering type of the cell and the glide planes are simultaneously identified (2). This identification is easily done by comparisons with the corresponding simulated diffraction patterns.


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