scholarly journals Instrumentation of Wide-Range Scanning Probe Microscopy and the Applications to Cell Biology and Biomaterial Science

2005 ◽  
Vol 45 (2) ◽  
pp. 105-108
Author(s):  
Takeomi MIZUTANI ◽  
Hisashi HAGA ◽  
Kazushige KAWABATA
Keyword(s):  
Scanning Probe Microscopy ◽  
Cell Biology ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Wide Range ◽  
Biomaterial Science ◽  
Range Scanning

The Role of Actin-Binding Protein Filamin A in Cellular Stiffness and Morphology Studied by Wide-Range Scanning Probe Microscopy

2006 ◽  
Vol 45 (3B) ◽  
pp. 2328-2332 ◽  
Author(s):  
Kosaku Kato ◽  
Yukiko Ohmori ◽  
Takeomi Mizutani ◽  
Hisashi Haga ◽  
Kazuyo Ohashi ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Binding Protein ◽  
Scanning Probe ◽  
Actin Binding ◽  
Filamin A ◽  
Probe Microscopy ◽  
Actin Binding Protein ◽  
Wide Range ◽  
Range Scanning

Wide-Range Scanning Probe Microscopy for Visualizing Biomaterials in the Submillimeter Range

2004 ◽  
Vol 43 (7B) ◽  
pp. 4525-4528 ◽  
Author(s):  
Takeomi Mizutani ◽  
Hisashi Haga ◽  
Koji Nemoto ◽  
Kazushige Kawabata
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Submillimeter Range ◽  
Probe Microscopy ◽  
Wide Range ◽  
Range Scanning

scholarly journals Wide range scanning probe microscopy for probing mechanical effects on cellular function

2009 ◽  
Vol 72 (4/5) ◽  
pp. 235-243
Author(s):  
Takeomi Mizutani ◽  
Hisashi Haga ◽  
Kosaku Kato ◽  
Kazushige Kawabata
Keyword(s):  
Scanning Probe Microscopy ◽  
Cellular Function ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Mechanical Effects ◽  
Wide Range ◽  
Range Scanning

Observation of Stiff Domain Structure on Collagen Gels by Wide-Range Scanning Probe Microscopy

2006 ◽  
Vol 45 (3B) ◽  
pp. 2353-2356 ◽  
Author(s):  
Takeomi Mizutani ◽  
Hisashi Haga ◽  
Kosaku Kato ◽  
Kenta Matsuda ◽  
Kazushige Kawabata
Keyword(s):  
Domain Structure ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Collagen Gels ◽  
Probe Microscopy ◽  
Wide Range ◽  
Range Scanning

scholarly journals Mapping intrinsic electromechanical responses at the nanoscale via sequential excitation scanning probe microscopy empowered by deep data

2018 ◽  
Vol 6 (1) ◽  
pp. 55-63 ◽  
Author(s):  
Boyuan Huang ◽  
Ehsan Nasr Esfahani ◽  
Jiangyu Li
Keyword(s):  
Scanning Probe Microscopy ◽  
Data Analytics ◽  
Electromechanical Coupling ◽  
Principal Component ◽  
Scientific Data ◽  
Scanning Probe ◽  
Physical Analysis ◽  
Brute Force ◽  
Probe Microscopy ◽  
Wide Range

Abstract Ever-increasing hardware capabilities and computation powers have enabled acquisition and analysis of big scientific data at the nanoscale routine, though much of the data acquired often turn out to be redundant, noisy and/or irrelevant to the problems of interest, and it remains nontrivial to draw clear mechanistic insights from pure data analytics. In this work, we use scanning probe microscopy (SPM) as an example to demonstrate deep data methodology for nanosciences, transitioning from brute-force analytics such as data mining, correlation analysis and unsupervised classification to informed and/or targeted causative data analytics built on sound physical understanding. Three key ingredients of such deep data analytics are presented. A sequential excitation scanning probe microscopy (SE-SPM) technique is first developed to acquire high-quality, efficient and physically relevant data, which can be easily implemented on any standard atomic force microscope (AFM). Brute-force physical analysis is then carried out using a simple harmonic oscillator (SHO) model, enabling us to derive intrinsic electromechanical coupling of interest. Finally, principal component analysis (PCA) is carried out, which not only speeds up the analysis by four orders of magnitude, but also allows a clear physical interpretation of its modes in combination with SHO analysis. A rough piezoelectric material has been probed using such a strategy, enabling us to map its intrinsic electromechanical properties at the nanoscale with high fidelity, where conventional methods fail. The SE in combination with deep data methodology can be easily adapted for other SPM techniques to probe a wide range of functional phenomena at the nanoscale.

scholarly journals Correlative Confocal Raman and Scanning Probe Microscopy in the Ionically Active Particles of LiMn2O4 Cathodes

Materials ◽  
2019 ◽  
Vol 12 (9) ◽  
pp. 1416 ◽  
Author(s):  
Alikin ◽  
Slautin ◽  
Abramov ◽  
Rosato ◽  
Shur ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
High Frequency ◽  
Low Frequency ◽  
Raman Microscopy ◽  
Scanning Probe ◽  
Confocal Raman Microscopy ◽  
Limn2o4 Spinel ◽  
Probe Microscopy ◽  
Wide Range ◽  
Confocal Raman

In this contribution, a correlative confocal Raman and scanning probe microscopy approach was implemented to find a relation between the composition, lithiation state, and functional electrochemical response in individual micro-scale particles of a LiMn2O4 spinel in a commercial Li battery cathode. Electrochemical strain microscopy (ESM) was implemented both at a low-frequency (3.5 kHz) and in a high-frequency range of excitation (above 400 kHz). It was shown that the high-frequency ESM has a significant cross-talk with topography due to a tip-sample electrostatic interaction, while the low-frequency ESM yields a response correlated with distributions of Li ions and electrochemically inactive phases revealed by the confocal Raman microscopy. Parasitic contributions into the electromechanical response from the local Joule heating and flexoelectric effect were considered as well and found to be negligible. It was concluded that the low-frequency ESM response directly corresponds to the confocal Raman microscopy data. The analysis implemented in this work is an important step towards the quantitative measurement of diffusion coefficients and ion concentration via strain-based scanning probe microscopy methods in a wide range of ionically active materials.

New technologies in scanning probe microscopy for studying molecular interactions in cells

2000 ◽  
Vol 2 (2) ◽  
pp. 1-19 ◽  
Author(s):  
Mike A. Horton ◽  
Petri P. Lehenkari ◽  
Guillaume T. Charras ◽  
Stephen A. Nesbitt
Keyword(s):  
Scanning Probe Microscopy ◽  
Cell Biology ◽  
Laser Scanning ◽  
New Technologies ◽  
Laser Scanning Microscopy ◽  
Scanning Probe ◽  
Confocal Laser ◽  
Measurement Tool ◽  
Probe Microscopy ◽  
Vertical Range

Atomic force microscopy (AFM) is a specialised form of scanning probe microscopy, which was invented by Binnig and colleagues in 1986. Since then, AFM has been increasingly used to study biomedical problems. Because of its high resolution, AFM has been used to examine the topography or shape of surfaces, such as during the molecular imaging of proteins. This, combined with the ability to operate under known force regimes, makes AFM technology particularly useful for measuring intermolecular bond forces and assessing the mechanical properties of biological materials. Many of the constraints (e.g. complex instrumentation, slow acquisition speeds and poor vertical range) that previously limited the use of AFM in cell biology are now beginning to be resolved. Technological advances will enable AFM to challenge both confocal laser scanning microscopy and scanning electron microscopy as a method for carrying out three-dimensional imaging. Its use as both a precise micro-manipulator and a measurement tool will probably result in many novel and exciting applications in the future. In this article, we have reviewed some of the current biological applications of AFM, and illustrated these applications using studies of the cell biology of bone and integrin-mediated adhesion.

Wide range standard for scanning probe microscopy height calibration

1996 ◽  
Vol 67 (12) ◽  
pp. 4198-4200 ◽  
Author(s):  
Hanna M. Brodowsky ◽  
Undine‐C. Boehnke ◽  
Friedrich Kremer
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Wide Range

Electronic Transport and Doping Effects in Reduced Graphene Oxide Measured by Scanning Probe Microscopy

2013 ◽  
Vol 1505 ◽  
Author(s):  
Christopher E. Kehayias ◽  
Samuel MacNaughton ◽  
Sameer Sonkusale ◽  
Cristian Staii
Keyword(s):  
Graphene Oxide ◽  
Reduced Graphene Oxide ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Chemical Doping ◽  
Electrode Arrays ◽  
Probe Microscopy ◽  
Reduced Graphene ◽  
Wide Range ◽  
Organic Dopants

ABSTRACTWe present a Scanning Probe Microscopy study of doping and sensing properties of reduced graphene oxide (rGO)-based nanosensors. rGO devices are created by dielectrophoretic assembly of rGO platelets onto interdigitated electrode arrays, which are lithographically pre-patterned on top of SiO2/Si wafers. The availability of several types of oxygen functional groups allows rGO to interact with a wide range of organic dopants, including methanol, ethanol, acetone, and ammonia. We perform sensitive Scanning Kelvin Probe Microscopy (SKPM) measurements on patterned rGO electronic circuits and show that the local electrical potential and charge distribution are significantly changed when the device is exposed to organic dopants. We also demonstrate that SKPM experiments allow us to quantify the amount of charge transferred to the sensor during chemical doping, and to spatially resolve the active sites of the sensor where the doping process takes place.

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