scholarly journals Wide range scanning probe microscopy for probing mechanical effects on cellular function

2009 ◽  
Vol 72 (4/5) ◽  
pp. 235-243
Author(s):  
Takeomi Mizutani ◽  
Hisashi Haga ◽  
Kosaku Kato ◽  
Kazushige Kawabata
Keyword(s):  
Scanning Probe Microscopy ◽  
Cellular Function ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Mechanical Effects ◽  
Wide Range ◽  
Range Scanning

The Role of Actin-Binding Protein Filamin A in Cellular Stiffness and Morphology Studied by Wide-Range Scanning Probe Microscopy

2006 ◽  
Vol 45 (3B) ◽  
pp. 2328-2332 ◽  
Author(s):  
Kosaku Kato ◽  
Yukiko Ohmori ◽  
Takeomi Mizutani ◽  
Hisashi Haga ◽  
Kazuyo Ohashi ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Binding Protein ◽  
Scanning Probe ◽  
Actin Binding ◽  
Filamin A ◽  
Probe Microscopy ◽  
Actin Binding Protein ◽  
Wide Range ◽  
Range Scanning

Wide-Range Scanning Probe Microscopy for Visualizing Biomaterials in the Submillimeter Range

2004 ◽  
Vol 43 (7B) ◽  
pp. 4525-4528 ◽  
Author(s):  
Takeomi Mizutani ◽  
Hisashi Haga ◽  
Koji Nemoto ◽  
Kazushige Kawabata
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Submillimeter Range ◽  
Probe Microscopy ◽  
Wide Range ◽  
Range Scanning

Observation of Stiff Domain Structure on Collagen Gels by Wide-Range Scanning Probe Microscopy

2006 ◽  
Vol 45 (3B) ◽  
pp. 2353-2356 ◽  
Author(s):  
Takeomi Mizutani ◽  
Hisashi Haga ◽  
Kosaku Kato ◽  
Kenta Matsuda ◽  
Kazushige Kawabata
Keyword(s):  
Domain Structure ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Collagen Gels ◽  
Probe Microscopy ◽  
Wide Range ◽  
Range Scanning

scholarly journals Mapping intrinsic electromechanical responses at the nanoscale via sequential excitation scanning probe microscopy empowered by deep data

2018 ◽  
Vol 6 (1) ◽  
pp. 55-63 ◽  
Author(s):  
Boyuan Huang ◽  
Ehsan Nasr Esfahani ◽  
Jiangyu Li
Keyword(s):  
Scanning Probe Microscopy ◽  
Data Analytics ◽  
Electromechanical Coupling ◽  
Principal Component ◽  
Scientific Data ◽  
Scanning Probe ◽  
Physical Analysis ◽  
Brute Force ◽  
Probe Microscopy ◽  
Wide Range

Abstract Ever-increasing hardware capabilities and computation powers have enabled acquisition and analysis of big scientific data at the nanoscale routine, though much of the data acquired often turn out to be redundant, noisy and/or irrelevant to the problems of interest, and it remains nontrivial to draw clear mechanistic insights from pure data analytics. In this work, we use scanning probe microscopy (SPM) as an example to demonstrate deep data methodology for nanosciences, transitioning from brute-force analytics such as data mining, correlation analysis and unsupervised classification to informed and/or targeted causative data analytics built on sound physical understanding. Three key ingredients of such deep data analytics are presented. A sequential excitation scanning probe microscopy (SE-SPM) technique is first developed to acquire high-quality, efficient and physically relevant data, which can be easily implemented on any standard atomic force microscope (AFM). Brute-force physical analysis is then carried out using a simple harmonic oscillator (SHO) model, enabling us to derive intrinsic electromechanical coupling of interest. Finally, principal component analysis (PCA) is carried out, which not only speeds up the analysis by four orders of magnitude, but also allows a clear physical interpretation of its modes in combination with SHO analysis. A rough piezoelectric material has been probed using such a strategy, enabling us to map its intrinsic electromechanical properties at the nanoscale with high fidelity, where conventional methods fail. The SE in combination with deep data methodology can be easily adapted for other SPM techniques to probe a wide range of functional phenomena at the nanoscale.

scholarly journals Correlative Confocal Raman and Scanning Probe Microscopy in the Ionically Active Particles of LiMn2O4 Cathodes

Materials ◽  
2019 ◽  
Vol 12 (9) ◽  
pp. 1416 ◽  
Author(s):  
Alikin ◽  
Slautin ◽  
Abramov ◽  
Rosato ◽  
Shur ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
High Frequency ◽  
Low Frequency ◽  
Raman Microscopy ◽  
Scanning Probe ◽  
Confocal Raman Microscopy ◽  
Limn2o4 Spinel ◽  
Probe Microscopy ◽  
Wide Range ◽  
Confocal Raman

In this contribution, a correlative confocal Raman and scanning probe microscopy approach was implemented to find a relation between the composition, lithiation state, and functional electrochemical response in individual micro-scale particles of a LiMn2O4 spinel in a commercial Li battery cathode. Electrochemical strain microscopy (ESM) was implemented both at a low-frequency (3.5 kHz) and in a high-frequency range of excitation (above 400 kHz). It was shown that the high-frequency ESM has a significant cross-talk with topography due to a tip-sample electrostatic interaction, while the low-frequency ESM yields a response correlated with distributions of Li ions and electrochemically inactive phases revealed by the confocal Raman microscopy. Parasitic contributions into the electromechanical response from the local Joule heating and flexoelectric effect were considered as well and found to be negligible. It was concluded that the low-frequency ESM response directly corresponds to the confocal Raman microscopy data. The analysis implemented in this work is an important step towards the quantitative measurement of diffusion coefficients and ion concentration via strain-based scanning probe microscopy methods in a wide range of ionically active materials.

Wide range standard for scanning probe microscopy height calibration

1996 ◽  
Vol 67 (12) ◽  
pp. 4198-4200 ◽  
Author(s):  
Hanna M. Brodowsky ◽  
Undine‐C. Boehnke ◽  
Friedrich Kremer
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Wide Range

Electronic Transport and Doping Effects in Reduced Graphene Oxide Measured by Scanning Probe Microscopy

2013 ◽  
Vol 1505 ◽  
Author(s):  
Christopher E. Kehayias ◽  
Samuel MacNaughton ◽  
Sameer Sonkusale ◽  
Cristian Staii
Keyword(s):  
Graphene Oxide ◽  
Reduced Graphene Oxide ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Chemical Doping ◽  
Electrode Arrays ◽  
Probe Microscopy ◽  
Reduced Graphene ◽  
Wide Range ◽  
Organic Dopants

ABSTRACTWe present a Scanning Probe Microscopy study of doping and sensing properties of reduced graphene oxide (rGO)-based nanosensors. rGO devices are created by dielectrophoretic assembly of rGO platelets onto interdigitated electrode arrays, which are lithographically pre-patterned on top of SiO2/Si wafers. The availability of several types of oxygen functional groups allows rGO to interact with a wide range of organic dopants, including methanol, ethanol, acetone, and ammonia. We perform sensitive Scanning Kelvin Probe Microscopy (SKPM) measurements on patterned rGO electronic circuits and show that the local electrical potential and charge distribution are significantly changed when the device is exposed to organic dopants. We also demonstrate that SKPM experiments allow us to quantify the amount of charge transferred to the sensor during chemical doping, and to spatially resolve the active sites of the sensor where the doping process takes place.

The Role of Scanning Probe Microscopy in Drug Delivery Research

1996 ◽  
Vol 13 (3-4) ◽  
pp. 225-256 ◽  
Author(s):  
Kevin M. Shakesheff ◽  
Martyn C. Davies ◽  
Clive J. Roberts ◽  
Saul J. B. Tendler ◽  
Philip M. Williams
Keyword(s):  
Drug Delivery ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy
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