Analytical transmission electron microscopy study of a natural MORB sample assemblage transformed at high pressure and high temperature

A. Ricolleau; G. Fiquet; A. Addad; N. Menguy; C. Vanni; J.-P. Perrillat; I. Daniel; H. Cardon; N. Guignot

doi:10.2138/am.2008.2532

Analytical transmission electron microscopy study of a natural MORB sample assemblage transformed at high pressure and high temperature

American Mineralogist ◽

10.2138/am.2008.2532 ◽

2008 ◽

Vol 93 (1) ◽

pp. 144-153 ◽

Cited By ~ 28

Author(s):

A. Ricolleau ◽

G. Fiquet ◽

A. Addad ◽

N. Menguy ◽

C. Vanni ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Pressure ◽

High Temperature ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Analytical Transmission Electron Microscopy ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Analytical transmission electron microscopy study of grain boundary precipitates in an Fe–Ni–Mn maraging alloy

Materials Science and Engineering A ◽

10.1016/j.msea.2006.02.097 ◽

2006 ◽

Vol 438-440 ◽

pp. 288-291 ◽

Cited By ~ 16

Author(s):

S. Hossein Nedjad ◽

M. Nili Ahmadabadi ◽

R. Mahmudi ◽

T. Furuhara ◽

T. Maki

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Grain Boundary ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Analytical Transmission Electron Microscopy ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Interfacial Reactions Between Ni and BaTiO3: An Analytical Transmission Electron Microscopy Study

Microscopy and Microanalysis ◽

10.1017/s1431927605502307 ◽

2005 ◽

Vol 11 (S02) ◽

Author(s):

G Y Yang ◽

E C Dickey ◽

C A Randall

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Interfacial Reactions ◽

Analytical Transmission Electron Microscopy ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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High resolution and analytical transmission electron microscopy study of growth processes in a YBCO thin film

Journal of Materials Science Letters ◽

10.1007/bf00586174 ◽

1995 ◽

Vol 14 (9) ◽

pp. 670-673 ◽

Cited By ~ 6

Author(s):

Y. H. Li ◽

C. Leach ◽

P. Quincey

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Analytical Transmission Electron Microscopy ◽

Ybco Thin Film ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of the microstructural evolution during high-temperature and low-stress (011) [11] shear creep deformation of the superalloy single crystal LEK 94

Journal of Materials Research ◽

10.1557/jmr.2017.336 ◽

2017 ◽

Vol 32 (24) ◽

pp. 4491-4502 ◽

Cited By ~ 4

Author(s):

Leonardo Agudo Jácome ◽

Gülcan Göbenli ◽

Gunther Eggeler

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Shear Creep ◽

Transmission Electron ◽

Superalloy Single Crystal ◽

Image Position

Abstract

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Dislocations in CaTiO3 perovskite deformed at high-temperature: a transmission electron microscopy study

Physics and Chemistry of Minerals ◽

10.1007/bf00199499 ◽

1996 ◽

Vol 23 (6) ◽

Cited By ~ 21

Author(s):

P. Besson ◽

J.P. Poirier ◽

G.D. Price

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of blisters in high-temperature annealed He and H co-implanted single-crystal silicon

Applied Physics Letters ◽

10.1063/1.1790031 ◽

2004 ◽

Vol 85 (10) ◽

pp. 1683-1685 ◽

Cited By ~ 7

Author(s):

S. Frabboni ◽

G. C. Gazzadi ◽

L. Felisari ◽

R. Tonini ◽

F. Corni ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Single Crystal ◽

Single Crystal Silicon ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Crystal Silicon ◽

Transmission Electron

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Nanoparticle Metamorphosis: An in Situ High-Temperature Transmission Electron Microscopy Study of the Structural Evolution of Heterogeneous Au:Fe2O3 Nanoparticles

ACS Nano ◽

10.1021/nn501543d ◽

2014 ◽

Vol 8 (5) ◽

pp. 5315-5322 ◽

Cited By ~ 8

Author(s):

William J. Baumgardner ◽

Yingchao Yu ◽

Robert Hovden ◽

Shreyas Honrao ◽

Richard G. Hennig ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Structural Evolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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High pressure polymorphism of dicalcium silicate Ca2SiO4. A transmission electron microscopy study

Physics and Chemistry of Minerals ◽

10.1007/bf00200319 ◽

1995 ◽

Vol 22 (7) ◽

Cited By ~ 13

Author(s):

Corinne Remy ◽

Fran�ois Guyot ◽

Michel Madon

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Pressure ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Dicalcium Silicate ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Ellipsometry and transmission electron microscopy study of MoSi2 coatings after oxidation at high temperature in air

Thin Solid Films ◽

10.1016/j.tsf.2010.07.089 ◽

2010 ◽

Vol 519 (2) ◽

pp. 605-613 ◽

Cited By ~ 1

Author(s):

E. Bruneton ◽

S. Martoia ◽

S. Schelz

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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High‐resolution transmission electron microscopy study of the radiation damage defects in high temperature superconductors

Applied Physics Letters ◽

10.1063/1.108332 ◽

1992 ◽

Vol 61 (16) ◽

pp. 1968-1970 ◽

Cited By ~ 5

Author(s):

Y. J. Zhao ◽

W. K. Chu ◽

J. R. Liu ◽

J. Kulik ◽

H. Zandbergen ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

High Resolution ◽

Radiation Damage ◽

High Temperature Superconductors ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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