X-ray Microspectroscopy and Chemical Reactions in Soil Microsites

2011 ◽  
Vol 40 (3) ◽  
pp. 667-678 ◽  
Author(s):  
Dean Hesterberg ◽  
Martine C. Duff ◽  
Joe B. Dixon ◽  
Michael J. Vepraskas
Keyword(s):  
Chemical Reactions ◽  
X Ray

Chemical Reactions of Organic Compounds with X‐Ray Activated Water

1938 ◽  
Vol 6 (5) ◽  
pp. 229-240 ◽  
Author(s):  
Hugo Fricke ◽  
Edwin J. Hart ◽  
Homer P. Smith
Keyword(s):  
Organic Compounds ◽  
Chemical Reactions ◽  
X Ray

X-ray photoelectron spectroscopy study of the metal/polymer contacts involving aluminum and poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonic acid) derivatives

2003 ◽  
Vol 18 (5) ◽  
pp. 1219-1226 ◽  
Author(s):  
S. K. M. Jönsson ◽  
W. R. Salaneck ◽  
M. Fahlman
Keyword(s):  
Chemical Reactions ◽  
Photoelectron Spectroscopy ◽  
Interfacial Layer ◽  
Model Systems ◽  
Reaction Site ◽  
Benzenesulfonic Acid ◽  
Spectroscopy Study ◽  
X Ray ◽  
Thin Region ◽  
Metal Polymer

The contact formed between aluminum and poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonic acid) (PEDOT-PSS) derivatives was studied using x-ray photoelectron spectroscopy. The aluminum/PEDOT-PSS contact contains an interfacial layer formed by chemical reactions between aluminum and mainly poly(styrenesulfonic acid) (PSSH). These chemical interactions were studied with the help of model systems (PSSH, benzenesulfonic acid, and sodium benzenesulfonate). The preferred reaction site of aluminum is the SO3− and SO3−H+ groups of the PSS chains, giving rise to C-S-Al(-O) and C-O-Al species. The resulting contact formed consists of an insulating aluminum/PSS layer and a thin region of partially dedoped PEDOT-PSS. There is significant aluminum diffusion into films of the highly conducting form of PEDOT-PSS that have substantially less PSS at the surface. Hence, no (thick) aluminum/PSS layer is formed in this case, though the PEDOT chains close to the aluminum contact will still be partially dedoped as for the aluminum/PEDOT-PSS case.

Exploring coherent electron excitation and migration dynamics by electron diffraction with ultrashort X-ray pulses

2017 ◽  
Vol 19 (38) ◽  
pp. 25846-25852 ◽  
Author(s):  
Kai-Jun Yuan ◽  
André D. Bandrauk
Keyword(s):  
Electron Diffraction ◽  
Chemical Reactions ◽  
Electron Excitation ◽  
Charge Migration ◽  
X Ray ◽  
Migration Dynamics ◽  
And Migration

Exploring ultrafast charge migration is of great importance in biological and chemical reactions.

Chemical Reactions Induced By Soft X-Ray And E-Beam Exposure Of Novolac-Based Resists

1988 ◽  
Author(s):  
Derrick C. Mancini ◽  
James W. Taylor ◽  
T. V. Jayaraman ◽  
Richard J. West
Keyword(s):  
Chemical Reactions ◽  
X Ray
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