Acquisition of Surface/Thin Film Analysis System

Mapping Intimacies ◽

10.21236/ada402919 ◽

2002 ◽

Author(s):

James Stoffer ◽

George D. Weddill ◽

Thomas O'Keefe ◽

Richard Brow ◽

Matt O'Keefe

Keyword(s):

Thin Film ◽

Film Analysis ◽

Thin Film Analysis ◽

Analysis System

Download Full-text

Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis

10.3403/30206251 ◽

2013 ◽

Keyword(s):

Thin Film ◽

Chemical Analysis ◽

Photoelectron Spectroscopy ◽

Surface Chemical ◽

Film Analysis ◽

X Ray ◽

Thin Film Analysis ◽

Surface Chemical Analysis

Download Full-text

Depth microscopy for thin film analysis

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/0168-9002(93)90549-w ◽

1993 ◽

Vol 334 (1) ◽

pp. 187-190 ◽

Cited By ~ 9

Author(s):

G. Dollinger ◽

M. Boulouednine ◽

T. Faestermann ◽

P. Maier-Komor

Keyword(s):

Thin Film ◽

Film Analysis ◽

Thin Film Analysis

Download Full-text

Applications of microfocussed ion beams in surface and thin film analysis

Vacuum ◽

10.1016/0042-207x(87)90011-x ◽

1987 ◽

Vol 37 (3-4) ◽

pp. 289-291 ◽

Cited By ~ 4

Author(s):

RE Thurstans ◽

J Wolstenholme

Keyword(s):

Thin Film ◽

Ion Beams ◽

Film Analysis ◽

Thin Film Analysis

Download Full-text

Atomic force microscopy for thin film analysis

Surface and Coatings Technology ◽

10.1016/0257-8972(94)90251-8 ◽

1994 ◽

Vol 68-69 ◽

pp. 770-775 ◽

Cited By ~ 11

Author(s):

Roger W. Phillips

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Film Analysis ◽

Force Microscopy ◽

Thin Film Analysis ◽

Atomic Force

Download Full-text

MULTILAYER THIN‐FILM ANALYSIS BY ION BACKSCATTERING

Applied Physics Letters ◽

10.1063/1.1653620 ◽

1971 ◽

Vol 18 (5) ◽

pp. 191-194 ◽

Cited By ~ 28

Author(s):

S. T. Picraux ◽

F. L. Vook

Keyword(s):

Thin Film ◽

Multilayer Thin Film ◽

Film Analysis ◽

Thin Film Analysis ◽

Ion Backscattering

Download Full-text

Thin film analysis of gadolinium iron oxide and gadolinium iron by a combined ion exchange X-ray fluorescence method

Microchimica Acta ◽

10.1007/bf01216925 ◽

1968 ◽

Vol 56 (4) ◽

pp. 827-832 ◽

Cited By ~ 2

Author(s):

I. C. Barlow ◽

R. K. Van Valkenburg

Keyword(s):

Thin Film ◽

Iron Oxide ◽

Ion Exchange ◽

Fluorescence Method ◽

Film Analysis ◽

X Ray ◽

Thin Film Analysis

Download Full-text

Significance of the channeling surface peak in thin‐film analysis

Applied Physics Letters ◽

10.1063/1.89948 ◽

1978 ◽

Vol 32 (2) ◽

pp. 93-94 ◽

Cited By ~ 17

Author(s):

Robert L. Kauffman ◽

L. C. Feldman ◽

P. J. Silverman ◽

R. A. Zuhr

Keyword(s):

Thin Film ◽

Film Analysis ◽

Thin Film Analysis

Download Full-text

Surface and Thin Film Analysis of Metals and Semiconductors Using X-Ray Photoelectron Spectroscopy

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3460-0_24 ◽

1992 ◽

pp. 883-897 ◽

Cited By ~ 1

Author(s):

S. Hofmann

Keyword(s):

Thin Film ◽

Photoelectron Spectroscopy ◽

Film Analysis ◽

X Ray ◽

Thin Film Analysis

Download Full-text

Resolving Common Element Problem by Using Different Lines in Fundamental Parameters Method Multilayer Thin Film Analysis

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-2528-8_28 ◽

1994 ◽

pp. 213-218

Author(s):

Liangyuan Feng

Keyword(s):

Thin Film ◽

Common Element ◽

Multilayer Thin Film ◽

Film Analysis ◽

Fundamental Parameters ◽

Thin Film Analysis

Download Full-text

A Simple Approach to Multilayer Thin Film Analysis Based on Theoretical Calculations using Fundamental Parameters Method

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-2972-9_33 ◽

1993 ◽

pp. 279-286

Author(s):

Liangyuan Feng

Keyword(s):

Thin Film ◽

Theoretical Calculations ◽

Simple Approach ◽

Multilayer Thin Film ◽

Film Analysis ◽

Fundamental Parameters ◽

Thin Film Analysis

Download Full-text