Subsurface Damage Profiling System for Semiconductor Material

1989 ◽  
Author(s):  
Neil A. Ives ◽  
Martin S. Leung
Keyword(s):  
Subsurface Damage ◽  
Semiconductor Material

Spatiotemporal Control of Amide Radicals During Photocatalysis

2020 ◽  
Author(s):  
Shogo Mori ◽  
Takahiro Aoki ◽  
Kaliyamoorthy Selvam ◽  
Shunichi Fukuzumi ◽  
Jieun Jung ◽  
...  
Keyword(s):  
Organic Synthesis ◽  
Nickel Complex ◽  
Nickel Complexes ◽  
Semiconductor Material ◽  
Radical Reactions ◽  
Substitution Reactions ◽  
Carbon Neutrality ◽  
Spatiotemporal Control ◽  
Scalable Production ◽  
Salt Waste

Despite the continuing popularity of radical reactions in organic synthesis, much remains to be explored in this area. Herein, we describe how spatiotemporal control can be exerted over the formation and reactivity of divergent exchangeable formamide radicals using nickel complexes with a semiconductor material (TiO<sub>2</sub>) under irradiation from near-UV–Vis light. Depending on the bipyridine ligand used and the quantity of the nickel complex that is hybridized on or nonhydridized over the TiO<sub>2</sub> surface, these radicals selectively undergo substitution reactions at the carbon center of carbon–bromine bonds that proceed via three different pathways. As the scalable production of formamides from CO<sub>2</sub> does not produce salt waste, these methods could add a new dimension to the search for carbon neutrality through the indirect incorporation of CO<sub>2</sub> into organic frameworks.

scholarly journals Thiophene-Tetrathia-Annulene monolayer (TTA-2D): A new 2D semiconductor material with indirect bandgap

2021 ◽  
Vol 129 ◽  
pp. 114586
Author(s):  
Raphael M. Tromer ◽  
Leonardo D. Machado ◽  
Cristiano F. Woellner ◽  
Douglas S. Galvao
Keyword(s):  
Semiconductor Material

Microgrinding of Nanostructured Carbide Coatings: Ground Surface and Subsurface Damage Observations

2006 ◽  
Vol 304-305 ◽  
pp. 276-280 ◽  
Author(s):  
Y.H. Ren ◽  
Zhi Xiong Zhou ◽  
Zhao Hui Deng
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Material Removal ◽  
Ground Surface ◽  
Subsurface Damage ◽  
Removal Mechanism ◽  
Material Removal Mechanism ◽  
Carbide Coatings ◽  
Subsurface Layers ◽  
Scanning Electron

Surface microgrinding of the nanostructured WC/12Co coatings have been undertaken with diamond wheels under various conditions. Nondestructive and destructive approaches were utilized to assess damage in ground nanostructured coatings. Different surface and subsurface configurations were observed by scanning electron microscopy. This paper investigates the effects of microgrinding conditions on damage formation in the surface and subsurface layers of the ground nanostructured WC/12Co coatings. And the material-removal mechanism has been discussed.

scholarly journals Synthesis and characterization of LiZnP and LiZnAs semiconductor material

2015 ◽  
Vol 412 ◽  
pp. 103-108 ◽  
Author(s):  
Benjamin W. Montag ◽  
Michael A. Reichenberger ◽  
Kevin R. Arpin ◽  
Madhana Sunder ◽  
Kyle A. Nelson ◽  
...  
Keyword(s):  
Semiconductor Material ◽  
Synthesis And Characterization
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