Characterization of Micron-Scale Nanotublar Super Dielectric Materials

2015 ◽  
Author(s):  
Jonathan W. Gandy
Keyword(s):  
Dielectric Materials

scholarly journals Characterization of Dielectric Materials by Sparse Signal Processing With Iterative Dictionary Updates

2020 ◽  
Vol 4 (9) ◽  
pp. 1-4
Author(s):  
Udaya S. K. P. Miriya Thanthrige ◽  
Jan Barowski ◽  
Ilona Rolfes ◽  
Daniel Erni ◽  
Thomas Kaiser ◽  
...  
Keyword(s):  
Signal Processing ◽  
Dielectric Materials ◽  
Sparse Signal ◽  
Sparse Signal Processing

Dielectric Characterization of Polyceram Films

1990 ◽  
Vol 180 ◽  
Author(s):  
G. Teowee ◽  
J.M. Boulton ◽  
H.H. Fox ◽  
A. Koussa ◽  
T. Gudgel ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Polyethylene Oxide ◽  
Dielectric Materials ◽  
Inorganic Materials ◽  
Functionalized Polymers ◽  
Multifunctional Materials ◽  
Dielectric Characterization ◽  
Silicon Alkoxides ◽  
Tan Δ

ABSTRACTPolycerams are an emergent class of hybrid, multifunctional materials which combine the properties of organic and inorganic materials. Films have been prepared from silicon alkoxides and reactive, functionalized polymers such as triethoxysilyl modified polybutadiene (MPBD), (N-triethoxysilylpropyl)O polyethylene oxide urethane (MPEOU) and trimethoxysilylpropyl substituted polyethyleneimine (MPEI). Characterization of dielectric constant and tan δ of the films has been carried out over a range of frequency from 500 Hz to 100 kHz; and the results are used to consider the potential of Polycerams as dielectric materials.

Transmission microwave spectroscopy for local characterization of dielectric materials

2017 ◽  
Vol 35 (1) ◽  
pp. 01A113 ◽  
Author(s):  
Andrea Lucibello ◽  
Christopher Hardly Joseph ◽  
Emanuela Proietti ◽  
Giovanni Maria Sardi ◽  
Giovanni Capoccia ◽  
...  
Keyword(s):  
Dielectric Materials ◽  
Microwave Spectroscopy ◽  
Local Characterization

Characterization of Brightness of ZnS Electroluminescent Device with Dielectric Materials of SOG or TEOS

2008 ◽  
Vol 55 ◽  
pp. 160-163
Author(s):  
Sung Min Park ◽  
Mun Ja Kim ◽  
Sang Hyun Park ◽  
Jin Young Kim ◽  
Ji Beom Yoo
Keyword(s):  
Spin Coating ◽  
Dielectric Material ◽  
Dielectric Materials ◽  
Organic Binder ◽  
Layer Formation ◽  
Phosphor Layer ◽  
Electroluminescent Device ◽  
Coating Method ◽  
Powder Type

Spin on glass (SOG) and Tetraethylorthosilicate (TEOS) as a dielectric material were applied for inorganic powder type electroluminescent (EL) device. The spin coating method was used for the SOG layer or TEOS layer formation and phosphor layer formation. The phosphor layer was composed of ZnS:Cu,Cl powders and organic binder. The brightness of powder EL has been measured.

Thermal conductivity study of porous low K dielectric materials

1999 ◽  
Vol 565 ◽  
Author(s):  
Chuan Hu ◽  
Michael Morgen ◽  
Paul S. Ho ◽  
Anurag Jain ◽  
William. N. Gill ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Dielectric Materials ◽  
Porous Films ◽  
Low Dielectric ◽  
Omega Method ◽  
3 Omega ◽  
Low Dielectric Constant Materials ◽  
Low K ◽  
Method Analysis

AbstractA quantitative characterization of the thermal properties is required to assess the thermal performance of low dielectric constant materials. Recently we have developed a technique based on the 3-omega method for measuring the thermal conductivity of porous dielectric thin films. In this paper we present the results on the measurements of thermal conductivity of thin porous films using this method. A finite element method analysis is used to evaluate the approximations used in the measurement. Two porosity-weighted thermal resistor models are proposed to interpret the results. By studying the dependence of the thermal conductivity on porosity, we are able to discuss the scaling rule of thermal conductivity. Additionally, a steady state layered heater model is used for evaluating the significance of introducing porous ILDs into an interconnect structure.

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