P-7: Improving Electrical Performance of the Scaled Low-Temperature Poly-Si Thin Film Transistors Using Vacuum Encapsulation Technique
Keyword(s):
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2006 ◽
Vol 14
(4)
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pp. 403
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2003 ◽
Vol 42
(Part 1, No. 7A)
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pp. 4213-4217
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1991 ◽
Vol 34
(7)
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pp. 671-679
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Thermal Degradation Under Pulse Operation in Low-Temperature p-Channel Poly-Si Thin-Film Transistors
2007 ◽
Vol 54
(2)
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pp. 297-300
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2012 ◽
Vol 8
(1)
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pp. 12-17
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