Thermal Degradation Under Pulse Operation in Low-Temperature p-Channel Poly-Si Thin-Film Transistors

Shinichiro Hashimoto; Koji Kitajima; Yukiharu Uraoka; Takashi Fuyuki; Yukihiro Morita

doi:10.1109/ted.2006.888724

Thermal Degradation Under Pulse Operation in Low-Temperature p-Channel Poly-Si Thin-Film Transistors

IEEE Transactions on Electron Devices ◽

10.1109/ted.2006.888724 ◽

2007 ◽

Vol 54 (2) ◽

pp. 297-300 ◽

Cited By ~ 10

Author(s):

Shinichiro Hashimoto ◽

Koji Kitajima ◽

Yukiharu Uraoka ◽

Takashi Fuyuki ◽

Yukihiro Morita

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thermal Degradation ◽

Thin Film Transistors ◽

Pulse Operation ◽

Si Thin Film

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Analysis of reliability in low-temperature poly-Si thin film transistors using pico-second time-resolved emission microscope

Digest. International Electron Devices Meeting, ◽

10.1109/iedm.2002.1175907 ◽

2003 ◽

Cited By ~ 1

Author(s):

Y. Uraoka ◽

N. Hirai ◽

H. Yano ◽

T. Hatayama ◽

T. Fuyuki

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Time Resolved ◽

Si Thin Film

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Low temperature processed poly-Si thin-film transistors with thinner LPD-SiO/sub 2/ as gate insulator and its reliability

Proceedings of Second International Workshop on Active Matrix Liquid Crystal Displays ◽

10.1109/amlcd.1995.540966 ◽

2002 ◽

Author(s):

Ching-Lin Fan ◽

Ching-Fa Yeh ◽

Hsiung-Kuang Tsai ◽

Water Lur ◽

Po-Wen Yen

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Gate Insulator ◽

Si Thin Film

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Enhancing Repetitive Uniaxial Mechanical Bending Endurance at R=2mm Using an Organic Trench Structure in Foldable Low Temperature Poly-Si Thin-Film Transistors

IEEE Electron Device Letters ◽

10.1109/led.2019.2900075 ◽

2019 ◽

pp. 1-1

Author(s):

Shin-Ping Huang ◽

Yu-Zhe Zheng ◽

Ting-Chang Chang ◽

Bo-Wei Chen ◽

Po-Hsun Chen ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Trench Structure ◽

Mechanical Bending ◽

Si Thin Film

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Peripheral circuit designs using low-temperature p-type poly-Si thin-film transistors

Journal of the Society for Information Display ◽

10.1889/1.2196517 ◽

2006 ◽

Vol 14 (4) ◽

pp. 403 ◽

Cited By ~ 1

Author(s):

Woo-Jin Nam ◽

Jae-Hoon Lee ◽

Hye-Jin Lee ◽

Hee-Sun Shin ◽

Min-Koo Han

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

P Type ◽

Si Thin Film

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Study of Degradation Phenomenon Due to a Combination of Contamination and Self-Heating in Poly-Si Thin Film Transistors Fabricated by a Low-Temperature Process

Japanese Journal of Applied Physics ◽

10.1143/jjap.42.4213 ◽

2003 ◽

Vol 42 (Part 1, No. 7A) ◽

pp. 4213-4217 ◽

Cited By ~ 20

Author(s):

Satoshi Inoue ◽

Satoshi Takenaka ◽

Tatsuya Shimoda

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Self Heating ◽

Si Thin Film ◽

Low Temperature Process

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Characterisation of low temperature poly-Si thin film transistors

Solid-State Electronics ◽

10.1016/0038-1101(91)90002-g ◽

1991 ◽

Vol 34 (7) ◽

pp. 671-679 ◽

Cited By ~ 44

Author(s):

S.D. Brotherton ◽

J.R. Ayres ◽

N.D. Young

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Si Thin Film

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Reliability of Low-Temperature Poly-Si Thin-Film Transistors

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.93.43 ◽

2003 ◽

Vol 93 ◽

pp. 43-48

Author(s):

Y. Inoue ◽

H. Ogawa ◽

Takeshi Endo ◽

Hiroshi Yano ◽

Tomoaki Hatayama ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Si Thin Film

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Physical modeling of low temperature polycrystalline Si thin-film transistors

2014 IEEE International Conference on Electron Devices and Solid-State Circuits ◽

10.1109/edssc.2014.7061091 ◽

2014 ◽

Author(s):

Mingxiang Wang ◽

Xiaoliang Zhou

Keyword(s):

Thin Film ◽

Low Temperature ◽

Physical Modeling ◽

Thin Film Transistors ◽

Si Thin Film

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Oxide Thinning and Structure Scaling Down Effect of Low-Temperature Poly-Si Thin-Film Transistors

Journal of Display Technology ◽

10.1109/jdt.2011.2162938 ◽

2012 ◽

Vol 8 (1) ◽

pp. 12-17 ◽

Cited By ~ 4

Author(s):

William Cheng-Yu Ma ◽

Tsung-Yu Chiang ◽

Je-Wei Lin ◽

Tien-Sheng Chao

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Scaling Down ◽

Si Thin Film

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Comprehensive Study on Reliability of Low-Temperature Poly-Si Thin-Film Transistors under Dynamic Complimentary Metal-Oxide Semiconductor Operations

Japanese Journal of Applied Physics ◽

10.1143/jjap.41.2414 ◽

2002 ◽

Vol 41 (Part 1, No. 4B) ◽

pp. 2414-2418 ◽

Cited By ~ 6

Author(s):

Yukiharu Uraoka ◽

Hiroshi Yano ◽

Tomoaki Hatayama ◽

Takashi Fuyuki

Keyword(s):

Thin Film ◽

Low Temperature ◽

Metal Oxide ◽

Thin Film Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Si Thin Film ◽

Comprehensive Study

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