Comparative Analysis of Self-Controllable Voltage Level (SVL) and Stacking Power Gating Leakage Reduction Techniques Using in Sequential Logic Circuit at 45Nanometer Regime
2014 ◽
Vol 8
(1)
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pp. 8-13
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2016 ◽
Vol 5
(1s)
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pp. 245
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2007 ◽
Vol 15
(11)
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pp. 1215-1224
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2017 ◽
Vol 10
(10)
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pp. 49-62
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2011 ◽
Vol 20
(01)
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pp. 147-162
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