scholarly journals SPEEM: The photoemission microscope at the dedicated microfocus PGM beamline UE49-PGMa at BESSY II

2016 ◽  
Vol 2 ◽  
Author(s):  
Florian Kronast ◽  
Sergio Valencia Molina
Keyword(s):  
Electron Microscope ◽  
Electric Field ◽  
Spatial Resolution ◽  
Temperature Control ◽  
Nanometer Scale ◽  
X Rays ◽  
Magnetic Imaging ◽  
Field Temperature ◽  
Photoemission Electron

The UE49-PGMa beamline hosts a photoemission electron microscope (PEEM) dedicated to spectromicroscopy and element-selective magnetic imaging on the nanometer scale. The instrument is an Elmitec PEEM III equipped with energy filter and Helium cooled manipulator. Laser driven excitations can be studied using an attached Ti:Sa laser. A variety of customized sample holders is available for imaging in moderate magnetic / electric field, temperature control, or local laser excitations. With x-rays the instrument is capable of 30 nm spatial resolution.

Development of Photoemission Electron Microscope by Imaging Inner Shell Photoelectrons Excited by High Energy Synchrotron Radiation X-rays

Hyomen Kagaku ◽  
2005 ◽  
Vol 26 (9) ◽  
pp. 524-531 ◽  
Author(s):  
Hideyuki YASUFUKU ◽  
Hideki YOSHIKAWA ◽  
Masahiro KIMURA ◽  
Sei FUKUSHIMA
Keyword(s):  
Electron Microscope ◽  
Synchrotron Radiation ◽  
High Energy ◽  
X Rays ◽  
Photoemission Electron

X-ray detection performance of a 300KV field-emission Analytical Electron Microscope

1993 ◽  
Vol 51 ◽  
pp. 250-251
Author(s):  
C. E. Lyman ◽  
J. I. Goldstein ◽  
D.B. Williams ◽  
D.W. Ackland ◽  
S. von Harrach ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Detection Performance ◽  
Electron Gun ◽  
X Rays ◽  
X Ray ◽  
Analytical Electron ◽  
Analytical Electron Microscope

A major goal of analytical electron micrsocopy (AEM) is to detect small amounts of an element in a given matrix at high spatial resolution. While there is a tradeoff between low detection limit and high spatial resolution, a field emission electron gun allows detection of small amounts of an element at sub-lOnm spatial resolution. The minimum mass fraction of one element measured in another is proportional to [(P/B)·P]-1/2 where the peak-to-background ratio P/B and the peak intensity P both must be high to detect the smallest amount of an element. Thus, the x-ray detection performance of an analytical electron microscope may be characterized in terms of standardized measurements of peak-to-background, x-ray intensity, the level of spurious x-rays (hole count), and x-ray detector performance in terms of energy resolution and peak shape.This paper provides measurements of these parameters from Lehigh’s VG Microscopes HB-603 field emission AEM. This AEM was designed to provide the best x-ray detection possible.

scholarly journals 5.4 nm Spatial Resolution Obtained from an Aberration-Corrected Photoemission Electron Microscope Utilizing an Electrostatic Mirror

2010 ◽  
Vol 16 (S2) ◽  
pp. 158-159
Author(s):  
RC Word ◽  
G Rempfer ◽  
L Almaraz ◽  
T Dixon ◽  
P Witham ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Spatial Resolution ◽  
Electrostatic Mirror ◽  
Photoemission Electron ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Time-resolved magnetic imaging in an aberration-corrected, energy-filtered photoemission electron microscope

2013 ◽  
Vol 130 ◽  
pp. 54-62 ◽  
Author(s):  
F. Nickel ◽  
D.M. Gottlob ◽  
I.P. Krug ◽  
H. Doganay ◽  
S. Cramm ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Time Resolved ◽  
Magnetic Imaging ◽  
Photoemission Electron ◽  
Aberration Corrected

Practical X-ray Spectrometry with Second-Generation Microcalorimeter Detectors

2012 ◽  
Vol 20 (4) ◽  
pp. 38-42 ◽  
Author(s):  
Robin Cantor ◽  
Hideo Naito
Keyword(s):  
Electron Microscope ◽  
Spatial Resolution ◽  
Energy Resolution ◽  
Semiconductor Industry ◽  
High Energy ◽  
High Energy Resolution ◽  
X Rays ◽  
X Ray ◽  
Analytical Technique ◽  
Transmission Electron

X-ray spectroscopy is a widely used and extremely sensitive analytical technique for qualitative as well as quantitative elemental analysis. Typically, high-energy-resolution X-ray spectrometers are integrated with a high-spatial-resolution scanning electron microscope (SEM) or transmission electron microscope (TEM) for X-ray microanalysis applications. The focused electron beam of the SEM or TEM excites characteristic X rays that are emitted by the sample. The integrated X-ray spectrometer can then be used to identify and quantify the elemental composition of the sample on a sub-micron length scale. This combination of energy resolution and spatial resolution makes X-ray microanalysis of great importance to the semiconductor industry.

Electron Spectroscopic Imaging of DNA and Protein-DNA Complexes

1988 ◽  
Vol 46 ◽  
pp. 172-173
Author(s):  
D.P. Bazett-Jones ◽  
M.L. Brown
Keyword(s):  
Transcription Factor ◽  
Transcription Factors ◽  
Electron Microscope ◽  
Spatial Resolution ◽  
Spectroscopic Imaging ◽  
X Rays ◽  
Electron Spectrometer ◽  
Electron Spectroscopic Imaging ◽  
Dna Complexes ◽  
Fixed Beam

Elemental distributions in cells and molecular spreads can now be produced at the spatial resolution attainable in the electron microscope by the collection of X-rays or by the collection of and imaging with inellastically scattered electrons. With the latter method, known as Electron Spectroscopic Imaging (ESI), an image is produced with electrons that have lost characteristic amounts of energy from ionizing or exciting specific elements in the specimen. ESI can generate an elemental map of a specimen at a resolution of about 0.5 nm. It can be carried out in a fixed beam microscope equipped with a parallel energy filter inserted into the column of the microscope below the specimen (1,2). An instrument equipped with a prism-mirror-prism electron spectrometer was used in this study to image purified DNA molecules and a complex of the transcription factor TFIIIA with DNA.Transcription of most genes is activated by the binding of transcription factors to promoter elements.

Diagnosis of Silica Induced Granulomatous Hypersensitivity

1982 ◽  
Vol 40 ◽  
pp. 336-337
Author(s):  
C. W. Mehard ◽  
W. L. Epstein
Keyword(s):  
Electron Microscope ◽  
White Female ◽  
X Rays ◽  
Blood Tests ◽  
Analytical Electron ◽  
Analytical Electron Microscope

The underlying cause of a disease may not he readily apparent but may have a long history in development. We report one such case which was diagnosed with the aid of the analytical electron microscope.The patient, a 48 yr. old white female, developed a tender nodule on the sole of her foot in December, 1981. Subsequently additional lesions developed on the same foot resulting in deep pain and tenderness. Superficial lesions also extended up to the knee on both legs. No abnormalities were revealed in blood tests or chest X-rays.

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