Ultrahigh-spatial-resolution chemical and magnetic imaging by laser-based photoemission electron microscopy

2015 ◽  
Vol 86 (2) ◽  
pp. 023701 ◽  
Author(s):  
Toshiyuki Taniuchi ◽  
Yoshinori Kotani ◽  
Shik Shin
Keyword(s):  
Electron Microscopy ◽  
Spatial Resolution ◽  
Photoemission Electron Microscopy ◽  
Magnetic Imaging ◽  
Photoemission Electron

5.4nm spatial resolution in biological photoemission electron microscopy

2010 ◽  
Vol 110 (7) ◽  
pp. 899-902 ◽  
Author(s):  
R. Könenkamp ◽  
Robert C. Word ◽  
G.F. Rempfer ◽  
T. Dixon ◽  
L. Almaraz ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Spatial Resolution ◽  
Photoemission Electron Microscopy ◽  
Photoemission Electron

High-Resolution X-Ray Photoemission Electron Microscopy at the Advanced Light Source

1998 ◽  
Vol 524 ◽  
Author(s):  
Thomas Stammler ◽  
Simone Anders ◽  
Howard A. Padmore ◽  
Joachim Stöhr ◽  
Michael Scheinfein ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Light Source ◽  
Field Emission ◽  
Spatial Resolution ◽  
Experimental Program ◽  
Photoemission Electron Microscopy ◽  
X Ray ◽  
Advanced Light Source ◽  
Materials Research ◽  
Photoemission Electron

ABSTRACTX-ray Photoemission Electron Microscopy (X-PEEM) is a full-field imaging technique where the sample is illuminated by an x-ray beam and the photoemitted electrons are imaged on a screen by means of an electron optics. It therefore combines two well-established materials analysis techniques - photoemission electron microscopy (PEEM) and x-ray spectroscopy such as near edge x-ray absorption fine structure (NEXAFS) spectroscopy. This combination opens a wide field of new applications in materials research and has proven to be a powerful tool to investigate simultaneously topological, elemental, chemical state, and magnetic properties of surfaces, thin films, and multilayers at high spatial resolution. A new X-PEEM installed at the bend magnet beamline 7.3.1.1 at the Advanced Light Source (ALS) is designed for a spatial resolution of 20 nm and is currently under commissioning. An overview of the ongoing experimental program using X-PEEM in the field of materials research at the ALS is given by elemental and chemical bonding contrast imaging of hard disk coatings and sliders, field emission studies on diamond films as possible candidates for field-emission flat-panel displays, and the study of dewetting and decomposition phenomena of thin polymer blends and bilayers.

Real Time Study of Cu Diffusion through a Ru Thin Film by Photoemission Electron Microscopy (PEEM)

2006 ◽  
Vol 914 ◽  
Author(s):  
Wayne P. Hess ◽  
Gang Xiong ◽  
Y.-M. Sun ◽  
Alan G. Joly ◽  
Kenneth M. Beck ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Real Time ◽  
Spatial Resolution ◽  
Diffusion Processes ◽  
Time Study ◽  
Photoemission Electron Microscopy ◽  
Metal Diffusion ◽  
Photoemission Electron ◽  
Lower Work Function

AbstractWe demonstrate the efficacy of Photoemission Electron Microscopy (PEEM) as a tool to detect metal diffusion processes at nanoscale spatial resolution in real time. For a sample comprising a nominally 1 nm physical vapor-deposited (PVD) Ru thin film covering a thick Cu substrate, we have observed the appearance of bright features on a dark background as the temperature is monotonically increased and irradiated with photons from a Hg arc lamp. These bright features are the result of a lower work function due to Cu diffusion through the Ru film.

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

scholarly journals Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors

2017 ◽  
Vol 23 (S1) ◽  
pp. 1504-1505
Author(s):  
Taisuke Ohta ◽  
Morgann Berg ◽  
Kunttal Keyshar ◽  
Jason M. Kephart ◽  
Thomas E. Beechem ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electronic Properties ◽  
Photoemission Electron Microscopy ◽  
2D Crystals ◽  
Photoemission Electron

scholarly journals Enabling Photoemission Electron Microscopy in Liquids via Graphene-Capped Microchannel Arrays

Nano Letters ◽  
2017 ◽  
Vol 17 (2) ◽  
pp. 1034-1041 ◽  
Author(s):  
Hongxuan Guo ◽  
Evgheni Strelcov ◽  
Alexander Yulaev ◽  
Jian Wang ◽  
Narayana Appathurai ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoemission Electron Microscopy ◽  
Microchannel Arrays ◽  
Photoemission Electron
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