scholarly journals KINETICS OF ISOTHERMAL ANNEALING OF GAMMA-IRRADIATED EUTECTIC MIXTURE OF NaNO3-KNO3

2019 ◽  
Vol 8 (2) ◽  
pp. 44
Author(s):  
S. S. Pawar ◽  
S. F. Patil
2012 ◽  
Vol 112 (11) ◽  
pp. 113509 ◽  
Author(s):  
S. H. Yeh ◽  
P. Y. Chen ◽  
Julie Harmon ◽  
Sanboh Lee
Keyword(s):  

2019 ◽  
Vol 963 ◽  
pp. 734-737
Author(s):  
Oleg Korolkov ◽  
Vitalii V. Kozlovski ◽  
Alexander A. Lebedev ◽  
Jana Toompuu ◽  
Natalja Sleptsuk ◽  
...  

In the present work, the kinetics of low-temperature annealing (400 °C) of 4H-SiC JBS diodes irradiated by electrons with an energy of 0.9 MeV and with a dose of 1E16 cm-2 was studied. The dynamics of changes in I-V, C-V characteristics, as well as DLTS spectra are shown. In the course of the work, a thermal cycling effect was discovered, i.e., effect of multiple rapid cooling to the temperature of liquid nitrogen and heating of the samples. As a result of thermal cycling, the barrier capacity increases and the on-resistance (Rs) decreases. In the DLTS spectrum, a level of - 0.38 eV appears, absent in the as-irradiated diodes.


2009 ◽  
Vol 23 (16) ◽  
pp. 3391-3402
Author(s):  
WEERAPHAT PON-ON ◽  
PONGTIP WINOTAI ◽  
I-MING TANG

The nanocrystallization process in amorphous Fe 81 B 13.5 Si 3.5 C 2 ribbons caused by isothermal annealing below the crystallization temperature is studied. X-ray diffraction and Mossbauer spectroscopy measurements are used to identify the formation of new Fe containing compounds such as the ribbons annealed at various temperatures. The ferromagnetic resonance measurements for an as-cast ribbon and the 495°, 525°C and 600°C annealed ribbons exhibit a resonance line at 63.64 mT for φ = 0°. The sample annealed at 425°C shows two resonance peaks at 95.45 mT and 295.46 mT. These are due to the nanocrystalline α– Fe(Si) phase. The resonance-line widths are seen to broaden after the ribbons are annealed at 495°C and 525°C, at which time, the amorphous matrix crystallizes into nano-grains of α– Fe(Si) , t– Fe 2 B and t– Fe 3 B phases. The kinetics of the crystallization is discussed in terms of the relative change in the line width of the samples annealed at 495°C for different annealing times. These results yielded an Avrami exponent, n of 0.84 which is consistent with diffusion-controlled growth with a nucleation rate close to zero.


2005 ◽  
Vol 38 (2) ◽  
pp. 346-352 ◽  
Author(s):  
A. B. Ziya

The kinetics of short-range order (SRO) formation was investigated in the alloy Au25Ag25Pd50by using the residual electrical resistometry. The resistivity was found to increase with the formation of SRO. The resistivity values varied linearly with respect to the inverse of temperature, characterizing the different states of SRO. The analysis of isothermal experiments obeying the fundamental laws showed that the SRO kinetics followed the two-exponentials law. The characteristic time constants for the SRO formation corresponding to various annealing temperatures in the isothermal annealing process and the activation enthalpies were determined with high accuracy. The time constants for the SRO formation and destruction were different, implying that the reaction paths in these processes are different. Further, the crossover experiments confirmed the existence of two-exponential kinetics and the variation of the time constants.


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