scholarly journals Three-dimensional ultrastructure of the Golgi apparatus in different cells: high-resolution scanning electron microscopy of osmium-macerated tissues

2006 ◽  
Vol 69 (5) ◽  
pp. 357-374 ◽  
Author(s):  
Daisuke Koga ◽  
Tatsuo Ushiki
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Golgi Apparatus ◽  
Three Dimensional ◽  
Scanning Electron

High-resolution scanning electron microscopy of human metaphase chromosomes

1982 ◽  
Vol 56 (1) ◽  
pp. 409-422 ◽  
Author(s):  
C.J. Harrison ◽  
T.D. Allen ◽  
M. Britch ◽  
R. Harris
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Three Dimensional ◽  
Loop Model ◽  
Giemsa Banding ◽  
Metaphase Chromosomes ◽  
Osmium Impregnation ◽  
Chromosome Integrity ◽  
Scanning Electron

Human metaphase chromosomes, prepared for light microscopy were examined by scanning electron microscopy. Use of an osmium impregnation technique eliminated the need for sputter-coating and allowed high-resolution visualization of uncoated specimens. Chromosomes were of three-dimensional cylindrical profile, with well-defined chromatids and centromeres. Prior to Giemsa-banding a smooth surface morphology was observed. Relaxation of chromosome integrity by Giemsa-banding pretreatment allowed resolution of several orders of chromosome structure not previously demonstrated by scanning electron microscopy. The observed organization of the chromatin fibres allowed parallels to be drawn with the radial loop model of chromosome construction as described by Marsden and Laemmli.

Fine Structure of Visible Light Emitting Porous Silicon

1992 ◽  
Vol 283 ◽  
Author(s):  
Kiyokazu Nakagawa ◽  
Akio Nishida ◽  
Toshikazu Shimada
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Optical Microscopy ◽  
Three Dimensional ◽  
Photoluminescence Spectroscopy ◽  
Porous Si ◽  
Light Emitting ◽  
Si Films ◽  
Scanning Electron

ABSTRACTPorous Si formed by anodization is studied by means of high-resolution scanning electron microscopy, optical microscopy, micro-photoluminescence spectroscopy, high-resolution transmisson electron microscopy, and micro-Raman spectroscopy. Surface morphologies of porous Si films are varied by changing the anodization conditions. High-resolution scanning electron microscopy measurements show that in all these films, porous Si fine structures of visible photoluminescent regions, which are confirmed with optical microscopy and micro-photoluminescence spectroscopy, are composed of particlelike structure of various sizes from several nm to several tens of nm. Transmission electron microscopy shows that these particles are composed of single-crystal Si spheres covered with an oxide layer. The peak of the Raman spectrum from the particlelike structure is shifted to lower energy and is wider than that for bulk Si, possibly due to lattice expansion around large surface fractions. These results suggest that the effective photoluminescence of porous Si is due to three-dimensional carrier confinement in quantum boxes.

High resolution three dimensional imaging of placental villi using serial block face scanning electron microscopy

Placenta ◽  
2016 ◽  
Vol 45 ◽  
pp. 84
Author(s):  
Eleni Palaiologou ◽  
Wendy Chiu ◽  
Rodolfo Ribeiro de Souza ◽  
Patricia Goggin ◽  
Emma Lofthouse ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Three Dimensional ◽  
Three Dimensional Imaging ◽  
Face Scanning ◽  
Placental Villi ◽  
Block Face ◽  
Scanning Electron

Three Dimensional Imaging of Light Metals Using Serial Block Face Scanning Electron Microscopy (SBFSEM)

2013 ◽  
Vol 765 ◽  
pp. 501-505 ◽  
Author(s):  
Teruo Hashimoto ◽  
George E. Thompson ◽  
Michele Curioni ◽  
Xiao Rong Zhou ◽  
Peter Skeldon
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Low Voltage ◽  
Three Dimensional ◽  
Specimen Preparation ◽  
Light Metals ◽  
Metallic Materials ◽  
Block Face ◽  
Scanning Electron

Ultramicrotomy is used extensively as a specimen preparation method for transmission electron microscopy (TEM) in the biological and polymer fields, where relatively soft materials are sectioned to generate electron transparent specimens. Additionally, in corrosion control studies of light metals, e.g. aluminium and magnesium and their alloys, ultramictrotomy has been progressed at Manchester for characterisation of the metallic materials and their filming behaviour as well as the propagation of corrosion into the material interior at selected sites. The benefits of ultramicrotomy include the ability to generate uniform thicknesses of multiphase specimens with relatively large observation areas that include, for example, randomly distributed intermetallic particles in the alloy. However, mechanical sectioning with a diamond knife generates artefacts that include chattering and local damage; localised corrosion of the thin slices may also result from their residence on a water bath at the rear of the knife prior to collection for TEM study. Recently, ultramicrotomy has also been utilised to assist high resolution imaging in the scanning electron microscope (SEM); the generation of relatively flat specimens removes roughness effects from the secondary electron signal and improves the backscattered electron yield due to removal of an oxidised or carbon contaminated surface. The combination of ultramicrotomy and low voltage scanning electron microscopy has also enabled generation of high resolution, three dimensional images using sectioning and subsequent imaging of the fresh surface by SEM. However, importantly, recent instrumental developments, i.e. the GATAN 3View System, now enable ultramicrotomy to be performed in-SEM. Consequently, rapid in-SEM sectioning and imaging can now be undertaken with ready reconstruction of electron tomographs for light metallic materials. Here, the application of the Gatan 3View system in a Quanta 250 FEG-ESEM is presented, with consideration of artefacts introduced by the electron beam for serial block face sectioning imaging of light alloys.

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