Reflection, Diffraction and Scattering at Low Grazing Angle of Incidence: Regular and Random Systems

2011 ◽  
Vol E94-C (1) ◽  
pp. 2-9 ◽  
Author(s):  
Junichi NAKAYAMA
Keyword(s):  
Random Systems ◽  
Grazing Angle ◽  
Angle Of Incidence

Low-Energy Electron Diffraction from Ag(111): Intensity-versus-Energy Curves and Absolute Intensity of the (00) Beam

1970 ◽  
Vol 25 (11) ◽  
pp. 1567-1578 ◽  
Author(s):  
Max G. Lagally
Keyword(s):  
Geometric Model ◽  
Surface Condition ◽  
Grazing Angle ◽  
Surface Preparation ◽  
Incident Beam ◽  
Absolute Intensity ◽  
Angle Of Incidence ◽  
Faraday Cage ◽  
Scattering Correction ◽  
Low Energies

The intensity of the (00) beam of a (111) surface of Ag has been measured with a Faraday cage as a function of the energy of the incident beam (10 < E < 280 eV), the grazing angle of incidence (46.5° < φ < 83.5°), two azimuths differing by 180°, and the temperature. The I vs E curves, when compared with data for Ag ( 111 ) of other workers who have used different methods of surface preparation, show good agreement in the structure over the whole range of incident angles, indicating that LEED is not strongly sensitive to surface condition. The I vs E curves for the two azimuths are identical, a necessary result of the reciprocity theorem. For comparison with the I vs E structure, a complete 3-beam geometric model is used. This differs from a simple Ewald construction in that it considers also the Bragg conditions between intermediate beams and the final beam. It also requires that there be no difference in the effect of intermediate forward and backward scattered beams. It is shown that the number of possible beams is much too large even at low energies to make positive identification of any structure in the I vs E curves. A comparison with a rigorous multiple-scattering theory yields agreement in the number and position of peaks, but not in heights and widths of peaks. The possibility of comparison of absolute intensities in theory and experiment is investigated and an attempt is made to remove the major differences. Intensity vs temperature measurements are made at closely spaced energies in order to extract the rigid-lattice scattering. Correction of this intensity for surface plasma losses leads finally to maximum scattered intensities of 2% at 100 eV, 10% at 60 eV, and up to 40% at energies below 20 eV.

Interface broadening due to Ar+ ion bombardment measured on Co/Cu multilayer at grazing angle of incidence

2003 ◽  
Vol 21 (3) ◽  
pp. 553-557 ◽  
Author(s):  
A. Barna ◽  
M. Menyhard ◽  
G. Zsolt ◽  
A. Koos ◽  
A. Zalar ◽  
...  
Keyword(s):  
Grazing Angle ◽  
Ion Bombardment ◽  
Angle Of Incidence

Unexpectedly high sputtering yield of carbon at grazing angle of incidence ion bombardment

2005 ◽  
Vol 98 (2) ◽  
pp. 024901 ◽  
Author(s):  
A. Barna ◽  
M. Menyhard ◽  
L. Kotis ◽  
Gy. J. Kovacs ◽  
G. Radnoczi ◽  
...  
Keyword(s):  
Grazing Angle ◽  
Ion Bombardment ◽  
Angle Of Incidence ◽  
Sputtering Yield

Infrared Multiple Specular Reflectance of Mono- and Submonomolecular Layers of p-Bromobenzoic Acid on Oxidized Metals

1989 ◽  
Vol 43 (1) ◽  
pp. 107-113 ◽  
Author(s):  
A. H. M. Sondag ◽  
M. C. Raas
Keyword(s):  
Surface Coverage ◽  
Specular Reflection ◽  
Grazing Angle ◽  
Grazing Incidence ◽  
Analysis Data ◽  
Incidence Geometry ◽  
Angle Of Incidence ◽  
Specular Reflectance ◽  
Angular Acceptance ◽  
Higher Sensitivity

The advantages of Multiple Specular Reflection (MSR) over single reflection grazing incidence infrared spectroscopy are discussed in this paper. A calculation which incorporates the experimental constraints for a multiple reflection setup is performed. The results concerning the angular dependence are confirmed by experiment. The main advantages are a wide angular acceptance and a release of the grazing angle of incidence geometry. Approximately the same sensitivity can be obtained as is theoretically possible with a single reflection at grazing incidence. However, in practice a somewhat higher sensitivity can be obtained with multiple specular reflectance spectroscopy. The sensitivity is illustrated by the measurement of submonolayers of p-bromobenzoic acid chemi-sorbed on an oxidized aluminium flat surface. Comparison with neutron activation analysis data shows that the reflection-absorption intensities are proportional to the surface coverage. A dependence of spectral features on surface coverage can be observed.

Grazing Angle Metal-Overlayer Infrared ATR Spectroscopy

1988 ◽  
Vol 42 (7) ◽  
pp. 1296-1302 ◽  
Author(s):  
Yuichi Ishino ◽  
Hatsuo Ishida
Keyword(s):  
Grazing Angle ◽  
High Refractive Index ◽  
Spectroscopic Technique ◽  
Angle Of Incidence ◽  
High Angle ◽  
Interfacial Layers ◽  
Island Effect ◽  
Metal Island ◽  
Atr Spectroscopy ◽  
Better Than

The most sensitive reflection spectroscopic technique has been developed for studying the structure of thin films between a semiconductor and a metallic film. In this study, a metal-overlayer ATR technique was applied to measure the infrared spectra of interfacial layers. According to optical theory, this technique requires a high angle of incidence near the grazing angle in order to obtain optimum sensitivity. On the basis of the theoretical prediction, an optimized prism was designed. Our prism/thin film/ metal configuration yields an S/N ratio 5 times better than that achieved by the conventional reflection-absorption spectroscopy. This enhancement is not due to the so-called metal island effect, but is due instead to the high refractive index of the semiconductor prism.

RBS ANALYSIS OF MBE GROWN SiGe/(001)Si HETEROSTRUCTURES WITH THIN HIGH Ge CONTENT SiGe CHANNELS FOR HMOS TRANSISTORS

2001 ◽  
Vol 15 (28n29) ◽  
pp. 1297-1304 ◽  
Author(s):  
N. P. BARRADAS ◽  
A. D. SEQUEIRA ◽  
N. FRANCO ◽  
M. MYRONOV ◽  
O. A. MIRONOV ◽  
...  
Keyword(s):  
Standard Deviation ◽  
High Resolution ◽  
Quantum Wells ◽  
Energy Resolution ◽  
Grazing Angle ◽  
Angle Of Incidence ◽  
Roughness Parameters ◽  
Si Substrate ◽  
Device Applications ◽  
Fundamental Research

The growth of Si1-xGex quantum wells with high Ge composition (x>0.5) on Si(001) substrates by MBE is of great interest both for HMOS device applications and fundamental research. One of the possibilities to obtain a high Ge content Si1-xGex channel for mobile carriers, while retaining its strain, is to grow a relaxed Si1-yGey buffer layer on an underlying Si substrate. Such a buffer is termed a virtual substrate (VS), which is a constituent of SiGe metamorphic heterostructures. The effect of annealing on the structure of the Si(001)/VS/Si 0.7 Ge 0.3/ Si 0.2 Ge 0.8/ Si 0.7 Ge 0.3 heterostructures was studied by grazing angle of incidence RBS. The thickness of the Si 0.2 Ge 0.8 channel is inhomogeneous, which makes the analysis of the data by traditional means very hard. We have developed a model whereby the influence of the thickness inhomogeneity of each layer in the apparent energy resolution as a function of depth can be calculated. Automatic fits to the data were performed, and the roughness parameters, that is, the standard deviation of the thickness inhomogeneity of the relevant layers, were obtained, together with the thickness and stoichiometry of each layer. The results are compared with TEM and high resolution XRD experiments.

scholarly journals Improved film density for coatings at grazing angle of incidence in high power impulse magnetron sputtering with positive pulse

2020 ◽  
Vol 706 ◽  
pp. 138058 ◽  
Author(s):  
F. Avino ◽  
D. Fonnesu ◽  
T. Koettig ◽  
M. Bonura ◽  
C. Senatore ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
High Power ◽  
Grazing Angle ◽  
Angle Of Incidence ◽  
Positive Pulse ◽  
Film Density

X-RAY PROPAGATION IN MULTIWALL CARBON NANOTUBES

2010 ◽  
Vol 25 (supp01) ◽  
pp. 208-216
Author(s):  
P A CHILDS ◽  
S Y ONG ◽  
D C HERBERT ◽  
A G O'NEILL
Keyword(s):  
Carbon Nanotubes ◽  
Bragg Reflection ◽  
Semiconductor Industry ◽  
Grazing Angle ◽  
Multiwall Carbon Nanotubes ◽  
Angle Of Incidence ◽  
Bragg Structure ◽  
X Ray ◽  
Extreme Uv ◽  
Multiwall Carbon

There is considerable interest in the development of inexpensive lithography techniques for applications in the area of nanoscale electronics. The semiconductor industry is pursuing the development of photolithography techniques such as extreme UV and x-ray. However these techniques are extremely expensive and not suitable for smaller scale applications. In this paper we describe research on the feasibility of exploiting x-ray propagation within carbon nanotubes (CNTs) for the fabrication and characterisation of nanoscale devices. A description is given of a test structure designed to explore experimentally the possibility of x-ray propagation in carbon nanotubes. As x-ray propagation requires a grazing angle of incidence the nanotubes need to be straight and reproducible. In order to alleviate this problem the possibility of using Bragg reflection is investigated. This approach to the problem is stimulated by the inherent Bragg structure of multiwall carbon nanotubes. It is further encouraged by the recent development of coatings using materials such as WS2. Results from simulations presented in this paper show that although Bragg reflection in as-grown multiwall carbon nanotubes is weak the potential for exploitation of this phenomenon in suitably coated nanotubes exists.

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