Investigation of source-to-drain capacitance by DIBL effect of silicon nanowire MOSFETs
2015 ◽
Vol 62
(11)
◽
pp. 3547-3553
◽
Investigation of discrete dopant induced variability in silicon nanowire MOSFETs using 3D simulation
2014 ◽
Vol 11
(1/2/3/4)
◽
pp. 40
2010 ◽
Vol 57
(11)
◽
pp. 2864-2871
◽
2012 ◽
Vol 33
(1)
◽
pp. 8-10
◽