High-Resolution X-Ray Microstructural Study of Single Crystals of YBa2Cu3O7-y

1987 ◽  
Vol 99 ◽  
Author(s):  
Hoydoo You ◽  
J. D. Axe ◽  
X. B. Kan ◽  
S. C. Moss ◽  
J. Z. Liu ◽  
...  
Keyword(s):  
High Resolution ◽  
Diffraction Study ◽  
Single Crystals ◽  
Growth Conditions ◽  
High Energy ◽  
Synchrotron Source ◽  
Microstructural Study ◽  
X Ray ◽  
Oxygen Ordering ◽  
New Type

ABSTRACTSingle crystals of YBa2Cu3O7-y were studied by transmission Laue photography and monochromatic diffraction techniques, using the Cornell High Energy Synchrotron Source and a rotating anode x-ray source. A new type of twinning, with two orthorhombic domains rotated exactly 90 degree about the c axis, was observed in one sample and the conventional (110) type twinning in another sample with nominally identical growth conditions. A high resolution diffraction study of the sample with the conventional (110) twinning shows that measured orthorhombicity (proportional to oxygen ordering parameter) varies from one domain to another.

High-resolution x-ray microstructural study of single crystals of YBa_{2}Cu_{3}O_{7-δ}

1988 ◽  
Vol 37 (4) ◽  
pp. 2301-2304 ◽  
Author(s):  
Hoydoo You ◽  
J. Axe ◽  
X. Kan ◽  
S. Moss ◽  
J. Liu ◽  
...  
Keyword(s):  
High Resolution ◽  
Single Crystals ◽  
Microstructural Study ◽  
X Ray

scholarly journals High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers

2013 ◽  
Vol 46 (4) ◽  
pp. 939-944 ◽  
Author(s):  
Marcelo Goncalves Hönnicke ◽  
Xianrong Huang ◽  
Cesar Cusatis ◽  
Chaminda Nalaka Koditwuakku ◽  
Yong Q. Cai
Keyword(s):  
High Resolution ◽  
Single Crystals ◽  
Energy Resolution ◽  
High Energy ◽  
High Energy Resolution ◽  
High Quality ◽  
X Ray ◽  
X Ray Scattering ◽  
Low Energies ◽  
Ray Scattering

Spherical analyzers are well known instruments for inelastic X-ray scattering (IXS) experiments. High-resolution IXS experiments almost always use Si single crystals as monochromators and spherical analyzers. At higher energies (>20 keV) Si shows a high energy resolution (<10 meV), at an exact symmetric back-diffraction condition, since the energy resolution is given by the real part of the susceptibility or polarizability. However, at low energies (<10 keV), high energy resolution is difficult to achieve with Si. α-SiO2 (quartz) can be an option, since it offers high energy resolution at low energies. In this work, the characterization of high-quality α-SiO2 is presented. Such characterization is made by high-resolution rocking curve, topography and lattice parameter mapping in different samples from a single block. X-ray optics with α-SiO2 for IXS at lower energies (from 2.5 to 12.6 keV) with medium to high energy resolution (from 90 to 11 meV) are proposed and theoretically exploited.

High-resolution x-ray diffraction study of single crystals of lead zirconate titanate

2011 ◽  
Vol 84 (2) ◽  
Author(s):  
S. Gorfman ◽  
D. S. Keeble ◽  
A. M. Glazer ◽  
X. Long ◽  
Y. Xie ◽  
...  
Keyword(s):  
High Resolution ◽  
Diffraction Study ◽  
Single Crystals ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate
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