Transmission Electron Microscope Studies on Minor Phases and Imperfections in YBa2Cu3Ox Compounds

1987 ◽  
Vol 99 ◽  
Author(s):  
Shozo Ikeda ◽  
Kazuhiro Kimura ◽  
Akiyuki Matsushita ◽  
Haruyoshi Aoki ◽  
Takeshi Hatano ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Grain Boundaries ◽  
Transmission Electron Microscope ◽  
Complex Oxide ◽  
Transmission Electron

ABSTRACTWe studied grain boundaries in calcined and sintered YBa2Cu3Ox transmission electron microscopy (TEM) and found complex Ba-Cu oxides. The complex oxide was polycrystalline and composed of grains smaller than 100 nm in diameter and it often included minor phases rich in Y. Some stoichiomet-ric oxides such as BaCuO2, CuO and BaO were also observed along grain boundaries.

Transmission Electron Microscope Study of Interfacial Reactions in Gold-Germanium Contact to Gallium Arsenide

1985 ◽  
Vol 54 ◽  
Author(s):  
Taeil Kim ◽  
D.D.L. Chung
Keyword(s):  
Electron Microscopy ◽  
Solid Solution ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Electron Microscope Study ◽  
Lattice Match ◽  
Perfect Lattice ◽  
Transmission Electron ◽  
Transmission Electron Microscope Study

ABSTRACTThe structure of 500 Å Au/500 A Ge/500 Å Au/GaAs (100) was studied by transmission electron microscopy after annealing at 350 – 500°C. Annealing at 350 – 450°C caused the formation of AuGeAs with a (110) texture, but this phase disappeared after annealing at 500°C. The hexagonal a-AuGa (or AuGa) was formed after annealing at 400°C, such that (111)Au // (0001)a, and [110]AU // [1120]a and there was perfect lattice match between Au (i.e., Au-rich solid solution) and a-AuGa. After annealing at 450°C or above, a phase tentatively identified as the hexagonal Au3Ga was formed and Ge (i.e., Ge-rich solid solution) became epitaxial to (100) GaAs. Annealing at 400°C caused Au to change from no texture to a (110) texture.

Transmission Electron Microscopy study of lead sulfide whiskers

1989 ◽  
Vol 47 ◽  
pp. 444-445
Author(s):  
S.A. Mansour ◽  
R. Scholz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Lead Sulfide ◽  
Carbon Film ◽  
Flame Temperature ◽  
High Resolution Electron Microscopy ◽  
Spiral Coil ◽  
Transmission Electron

This paper describes a transmission electron microscopy (TEM) study of the structure and growth mechanism of lead sulfide (PbS) whiskers. PbS whiskers were grown inside the stainless steel nozzle of a kerosene burner. The nozzle had a 0.5 mm aperture, and was fitted with an Al-spiral coil to filter kerosene impurities. The burner was operated continuously for four weeks at a kerosene pressure of 2-3 bars and a flame temperature of about 350°C before the nozzle clogged. A thick black deposit of fine PbS whiskers was found inside the nozzle.TEM specimens were prepared by ultrasonically suspending the fine black powder in alcohol. The suspended particles were deposited on a perforated carbon film supported on a copper grid, and examined with a JEM-1200EX transmission electron microscope operated at 120kV accelerating voltage. A JEM-4000EX transmission electron microscope was used for high resolution electron microscopy.Fig. 1. shows an EM micrograph of typical PbS whiskers. Each appears to have a high-contrast core encapsulated in a lower contrast shell. The electron diffraction pattern of a single whisker protruding over a hole in the carbon film is shown in Fig. 2.

Nanostructure Manipulation Device for Transmission Electron Microscopy: Application to Titania Nanoparticle Chain Aggregates

2002 ◽  
Vol 8 (6) ◽  
pp. 497-501 ◽  
Author(s):  
Yong J. Suh ◽  
Sergey V. Prikhodko ◽  
Sheldon K. Friedlander
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Physical Properties ◽  
Transmission Electron Microscope ◽  
Initial Length ◽  
Ion Milling ◽  
Transmission Electron ◽  
Titania Nanoparticle ◽  
Chain Aggregates

Experimental difficulties in studying nanostructures stem from their small size, which limits the use of traditional techniques for measuring their physical properties. We have developed a nanostructure manipulation device to apply tension to chain aggregates mounted in a transmission electron microscope. A 1-mm-long slit was cut in the center of a lead–tin alloy disc, measuring 3 mm in diameter and 200 μm in thickness. The disc was heated to about 140°C before it was pressed between two quartz slides. The disc was then thinned by mechanical dimpling and ion milling until holes developed around the slit. The edges of the slit were 0.2 to 3 μm in thickness while the gap between them was up to a few microns. This disc was bonded to the two plates of a cartridge. The slit could be widened or narrowed at controlled speeds of 0.5 to 300 nm/s. The system was tested using titania (TiO2) nanoparticle chain aggregates (NCA) deposited across the slit. The ends of the NCA remained attached to the edges of the slit, which was widened at about 0.7 nm/s. In this way, the NCA was stretched up to 176% of its initial length before breaking.

A new method for determining the normals to planar structures and their trace directions in transmission electron microscopy

1994 ◽  
Vol 27 (5) ◽  
pp. 762-766 ◽  
Author(s):  
Q. Liu
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
New Method ◽  
Planar Structures ◽  
Transmission Electron

With aid of a transmission-electron-microscope (TEM) double-tilt holder, a method for determining the normals to planar structures and their traces in a TEM is developed. This method is considered to be simple and convenient when compared with other methods. The accuracy of the method for the determination of both the normals to planar structures and their traces is within 2°.

Flexible phases, modulated structures and the transmission electron microscope

2004 ◽  
Vol 219 (11) ◽  
Author(s):  
Ray L. Withers ◽  
Lasse Norén ◽  
Yun Liu
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Practical Application ◽  
Transmission Electron ◽  
Modulated Structures ◽  
Structural Modulation

AbstractA review of the application of transmission electron microscopy to the study of interface, composite and displacively modulated structures is given. The distinctly different mechanisms underlying structural modulation in each case are emphasized as is the practical application of transmission electron microscopy to problems such as pseudo-symmetry and twinning, to indexation in (3 +

Paraliomyces lentiferus: an ultrastructural study of a little-known marine ascomycete

1992 ◽  
Vol 70 (11) ◽  
pp. 2223-2232 ◽  
Author(s):  
S. J. Read ◽  
S.-Y. Hsieh ◽  
E. B. G. Jones ◽  
S. T. Moss ◽  
H. S. Chang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Ultrastructural Study ◽  
Republic Of China ◽  
Mucilaginous Sheath ◽  
Transmission Electron ◽  
Scanning Electron

A collection of Paraliomyces lentiferus from Taiwan, Republic of China, is compared with that of the type description and examined at both scanning and transmission electron microscope levels as part of our review of the taxonomy of the marine Ascomycotina. Particular attention was devoted to the structure of the ascospore appendage. The ascospore wall comprises a mesosporium, an episporium, and a mucilaginous sheath (exosporium?) In addition, there is a single, gelatinous, lateral appendage adjacent to the central septum. The appendage comprises electron-opaque fibrils that in immature ascospores are connected to the ascospore wall via fine electron-opaque strands and larger electron-opaque aggregates of material. The origin of the appendage is discussed. Key words: ascospore, attachment, marine ascomycete, scanning electron microscopy, spore appendage, transmission electron microscopy.

Ultrastructural studies on conidiomata, conidiophores, and conidiogenous cells in six lichen-forming Ascomycetes

1984 ◽  
Vol 62 (10) ◽  
pp. 2081-2093 ◽  
Author(s):  
Rosmarie Honegger
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Transmission Electron Microscope ◽  
Developmental Studies ◽  
Ultrastructural Studies ◽  
Transmission Electron ◽  
Conidium Formation ◽  
Scanning Electron

The conidiomata, conidiophores, and conidia of six lichen-forming Ascomycetes were investigated using the scanning electron microscope, and conidium development in two of these species was studied by transmission electron microscopy. Phialidic (micro) conidium formation was observed in the mycobiont of Parmelia tiliacea, Physconia pulverulacea, and Cladonia furcata (Lecanorales), in Lobaria laetevirens (Peltigerales), and in Caloplaca aurantia (Teloschistales). Annellations, first described by Vobis on the basis of light and transmission electron microscope investigations, were also found in scanning electron microscope preparations of macroconidia bearing conidiogenous cells of Lecanactis abietina (Opegraphales). Ultrastructural and developmental studies on conidiophore structure and conidium formation may be of interest for taxonomic and evolutionary considerations in lichen-forming fungi.

Transmission electron microscope investigation of indentation induced dislocation configurations on the (001) GaSb face

1994 ◽  
Vol 209 (3) ◽  
Author(s):  
J. Doerschel
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Room Temperature ◽  
Stacking Faults ◽  
Electron Microscope Investigation ◽  
Partial Dislocations ◽  
Transmission Electron ◽  
Induced Dislocation

AbstractDislocation configurations induced by room temperature microindentations on the (001) face of GaSb (undoped and Te-doped) have been studied using high voltage transmission electron microscopy. Perfect and partial dislocations could be found in all four arms of the dislocation rosette around the indent. Microtwins and rarely single stacking faults are associated with the partials. Contrary to other binary III–V compounds, an “inverse” glide prism along the [1[unk]0]/[[unk]10] rosette arms is created and it is bounded by {111}

Strain in Coherent Ge Quantum Islands on Si Measured by Transmission Electron Microscopy

1999 ◽  
Vol 571 ◽  
Author(s):  
Chuan-Pu Liu ◽  
Peter D. Miller ◽  
William L. Henstrom ◽  
J. Murray Gibson
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Quantitative Method ◽  
Dark Field ◽  
Small Islands ◽  
Transmission Electron

ABSTRACTWe describe a quantitative method for measuring the strain in small islands, and show results for coherent Ge islands on Si. The method uses dark field images from backside thinned samples in the transmission electron microscope. We show that no independent strain models are needed in the measurement, which employs an excellent “abrupt displacement” approximation. Results show that the strain in Ge domes is higher than in pyramids as expected.

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