Plugging of Al Films Into Submicron Diameter Via Holes by Excimer Laser Irradiation
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AbstractVia-hole filling technique by momentarily melting an aluminum film has been developed, whereby planarization of aluminum films for multilevel interconnects on integrated circuits can be achieved. The melting is performed with an optical pulse irradiation from an ArF excimer laser without the problem of junction spiking. This technique is applicable to filling submicron-diameter vias having a diameter of 0.6μm with 0.7μm depth(aspect ratio:∼1.2). Very high aspect ratio(2.0) via-hole filling is achieved by heating the sample. During the laser irradiation, the sample substrate was kept at 300°C.
1987 ◽
Vol 8
(2)
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pp. 76-78
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2009 ◽
Vol 256
(1)
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pp. 183-186
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Wavelength Dependence of Excimer Laser Irradiation Effects on Ethylene-Tetrafluoroethylene Copolymer
1994 ◽
Vol 33
(Part 1, No. 8)
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pp. 4764-4768
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1996 ◽
Vol 35
(Part 2, No. 11B)
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pp. L1473-L1475
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1995 ◽
Vol 34
(Part 2, No. 11A)
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pp. L1482-L1485
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2013 ◽
Vol 210
(12)
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pp. 2729-2735
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