Mechanisms of Fatigue in Polysilicon Mems Structures
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AbstractFatigue crack initiation is shown to be associated with the stress-assisted evolution of a surface silica layer that forms during the normal exposure of unpassivated polysilicon surfaces to lab air In-situ atomic force microscopy (AFM) techniques are used to reveal the evolution of overall surface topology during incremental cyclic deformation to failure. Linear perturbation analysis of stress-assisted dissolution is then utilized to predict the evolution of the surface morphology. The predictions from the perturbation analysis are shown to be consistent with measured surface morphologies obtained using AFM techniques.
2014 ◽
Vol 49
(9)
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pp. 743-752
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1999 ◽
Vol 353
(1-2)
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pp. 194-200
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2019 ◽
Vol 29
(10)
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pp. 1806924
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Keyword(s):
Use of in-situ atomic force microscopy to monitor the biodegradation of polyhydroxyalkanoates (PHAs)
2001 ◽
Vol 167
(1)
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pp. 139-151
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