Floating Body Induced Transient Characteristics in Polycrystalline Silicon TFTs
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ABSTRACTThe floating body induced transient characteristics in polycrystalline silicon TFTs is reported. An obvious current surge, arising from the floating body effect, is observed. Using a 2D numerical simulator and comparisons to SIMOX FETs, the insight into the mechanisms governing the experimentally observed switching behavior of poly-Si devices is obtained. It is found that the defect states in poly-Si cause the current surge and exert an effect equivalent to doping in SIMOX FETs.
2012 ◽
Vol 272
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pp. 128-131
2003 ◽
Vol 20
(5)
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pp. 767-769
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2004 ◽
Vol 51
(4)
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pp. 575-580
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