Near-Field Imaging of the Microwave Dielectric Properties of Single-Crystal PbTiO3 and Thin-Film Sr1−xBxTiO3

A PbTiO3 crystal and Sr1−xBaxTiO3 films have been studied by near-field scanning microwave microscopy (SMM). In the PbTiO3 crystal, dielectric properties and topography are obtained simultaneously. In Sr1−xBaxTiO3 films, local variations and sample-to-sample differences are observed. To quantitatively determine local dielectric permittivity and loss, we also carry out theoretical calculations on dependence of resonant frequency and quality factor on dielectric constants of bulk samples and thin films. Good agreements between experimental and theoretical results are obtained.