scholarly journals Simultaneous imaging of dielectric properties and topography in a PbTiO3 crystal by near-field scanning microwave microscopy

2000 ◽  
Vol 76 (22) ◽  
pp. 3295-3297 ◽  
Author(s):  
Y. G. Wang ◽  
M. E. Reeves ◽  
F. J. Rachford
Keyword(s):  
Dielectric Properties ◽  
Near Field ◽  
Simultaneous Imaging ◽  
Microwave Microscopy ◽  
Scanning Microwave Microscopy ◽  
Near Field Scanning

Near-Field Imaging of the Microwave Dielectric Properties of Single-Crystal PbTiO3 and Thin-Film Sr1−xBxTiO3

1999 ◽  
Vol 603 ◽  
Author(s):  
Y.G. Wang ◽  
M.E. Reeves ◽  
W. Chang ◽  
J.S. Horwitz ◽  
W. Kim
Keyword(s):  
Dielectric Properties ◽  
Theoretical Calculations ◽  
Near Field ◽  
Microwave Dielectric Properties ◽  
Dielectric Constants ◽  
Microwave Microscopy ◽  
Near Field Imaging ◽  
Microwave Dielectric ◽  
Scanning Microwave Microscopy ◽  
Near Field Scanning

AbstractA PbTiO3 crystal and Sr1−xBaxTiO3 films have been studied by near-field scanning microwave microscopy (SMM). In the PbTiO3 crystal, dielectric properties and topography are obtained simultaneously. In Sr1−xBaxTiO3 films, local variations and sample-to-sample differences are observed. To quantitatively determine local dielectric permittivity and loss, we also carry out theoretical calculations on dependence of resonant frequency and quality factor on dielectric constants of bulk samples and thin films. Good agreements between experimental and theoretical results are obtained.

scholarly journals Improvement of spatial resolution by tilt correction in near-field scanning microwave microscopy

AIP Advances ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 035114
Author(s):  
Xianfeng Zhang ◽  
Zhe Wu ◽  
Quansong Lan ◽  
Zhiliao Du ◽  
Quanxin Zhou ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Near Field ◽  
Tilt Correction ◽  
Microwave Microscopy ◽  
Scanning Microwave Microscopy ◽  
Near Field Scanning

Gallium nitride nanowire probe for near-field scanning microwave microscopy

2014 ◽  
Vol 104 (2) ◽  
pp. 023113 ◽  
Author(s):  
J. C. Weber ◽  
P. T. Blanchard ◽  
A. W. Sanders ◽  
A. Imtiaz ◽  
T. M. Wallis ◽  
...  
Keyword(s):  
Gallium Nitride ◽  
Near Field ◽  
Microwave Microscopy ◽  
Scanning Microwave Microscopy ◽  
Near Field Scanning

A three-dimensional finite element model of near-field scanning microwave microscopy

2012 ◽  
Vol 112 (8) ◽  
pp. 084318 ◽  
Author(s):  
Curtis Balusek ◽  
Barry Friedman ◽  
Darwin Luna ◽  
Brian Oetiker ◽  
Arsen Babajanyan ◽  
...  
Keyword(s):  
Finite Element ◽  
Finite Element Model ◽  
Near Field ◽  
Three Dimensional ◽  
Element Model ◽  
Microwave Microscopy ◽  
Dimensional Finite Element ◽  
Three Dimensional Finite Element ◽  
Scanning Microwave Microscopy ◽  
Near Field Scanning
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